Elucidation of ion distribution and molecular orientation at liquid/liquid interface by total reflection XAFS
Project/Area Number |
15K13727
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Research Category |
Grant-in-Aid for Challenging Exploratory Research
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Allocation Type | Multi-year Fund |
Research Field |
Analytical chemistry
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Research Institution | Kyushu University |
Principal Investigator |
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Research Collaborator |
TANIDA Hajime 日産アーク, 研究員 (70301760)
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Project Period (FY) |
2015-04-01 – 2017-03-31
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Project Status |
Completed (Fiscal Year 2016)
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Budget Amount *help |
¥3,770,000 (Direct Cost: ¥2,900,000、Indirect Cost: ¥870,000)
Fiscal Year 2016: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
Fiscal Year 2015: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
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Keywords | 全反射XAFS / 液/液界面 / イオン水和 / 界面濃度 |
Outline of Final Research Achievements |
Total-reflection XAFS technique on the basis of detection of fluorescence X-ray was developed in order to know the hydration structure of ions distributed underneath liquid/liquid interface. This was applied to the adsorbed film of cationic surfactant (DTAB) at alkane/water interface by using newly constructed sample cell. One of the important results is the possibility to quantify the interfacial density of Br ion by K-edge absorption jump value in the XAFS spectrum. The improvement of S/N ratio in the EXAFS region is further needed to examine the hydration structure of Br ion at liquid/liquid interface.
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Report
(3 results)
Research Products
(6 results)
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[Journal Article] Line tension and its influence on droplets and particles at surfaces.2017
Author(s)
B. M. Law, S. P. McBride, J. Y. Wang, H. S. Wi, G. Paneru, S. Betelu, B. Ushijima, Y. Takata, B. Flanders, F. Bresme, H. Matsubara, T. Takiue, M. Aratono
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Journal Title
Progress in Surface Science
Volume: 92
Issue: 1
Pages: 1-39
DOI
Related Report
Peer Reviewed / Open Access / Int'l Joint Research
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