• Search Research Projects
  • Search Researchers
  • How to Use
  1. Back to previous page

Fundamental research and development of low-loss p-type SiC superjunction power MOSFETs

Research Project

Project/Area Number 16H04326
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Electronic materials/Electric materials
Research InstitutionUniversity of Tsukuba

Principal Investigator

Yano Hiroshi  筑波大学, 数理物質系, 准教授 (40335485)

Co-Investigator(Kenkyū-buntansha) 岩室 憲幸  筑波大学, 数理物質系, 教授 (50581203)
岡本 大  筑波大学, 数理物質系, 助教 (50612181)
Project Period (FY) 2016-04-01 – 2020-03-31
Project Status Completed (Fiscal Year 2019)
Budget Amount *help
¥16,120,000 (Direct Cost: ¥12,400,000、Indirect Cost: ¥3,720,000)
Fiscal Year 2019: ¥3,120,000 (Direct Cost: ¥2,400,000、Indirect Cost: ¥720,000)
Fiscal Year 2018: ¥3,510,000 (Direct Cost: ¥2,700,000、Indirect Cost: ¥810,000)
Fiscal Year 2017: ¥5,460,000 (Direct Cost: ¥4,200,000、Indirect Cost: ¥1,260,000)
Fiscal Year 2016: ¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Keywords炭化ケイ素 / パワーデバイス / 超接合 / p型MOS / pMOS / 電子・電気材料 / MOS界面
Outline of Final Research Achievements

In this study, we have performed fundamental research on p-type superjunction MOSFETs using SiC (silicon carbide), which are expected for high-efficiency, high-capacity, and easy-to-use complementary power converters. P-type SiC MOS devices fabricated under various conditions were characterized and analyzed. It is revealed that nitrogen atoms introduced by NO annealing act as a donor resulting in formation of inversion layers. Longer nitridation time introduced too much nitrogen atoms, which bring a threshold voltage shift and reduction of channel mobility. Precise evaluation of hole leakage current through the gate oxide was performed, and its conduction mechanism was revealed. We also found that the superjunction structure can reduce on-resistance in the p-type drift layer by 40% compared with a conventional structure.

Academic Significance and Societal Importance of the Research Achievements

本研究では、SiCのp-MOS界面特性について多くの新たな知見が得られた。この成果はより良いp型SiC MOSデバイス開発の基盤となり、低抵抗・高信頼性の獲得につながる。p型超接合構造の設計指針も示すことができ、これらは従来にない高耐圧・低損失p型スイッチング素子の実現可能性を示すものである。n型素子と組み合わせることで相補型電力変換器の実現が期待できる。これは電気エネルギーの有効活用につながり、地球環境問題の解決にも貢献できる。

Report

(5 results)
  • 2019 Annual Research Report   Final Research Report ( PDF )
  • 2018 Annual Research Report
  • 2017 Annual Research Report
  • 2016 Annual Research Report
  • Research Products

    (44 results)

All 2020 2019 2018 2017 2016

All Journal Article (6 results) (of which Peer Reviewed: 5 results) Presentation (38 results) (of which Int'l Joint Research: 11 results,  Invited: 1 results)

  • [Journal Article] Conduction mechanisms of oxide leakage current in p-channel 4H-SiC MOSFETs2020

    • Author(s)
      Nemoto Hiroki、Okamoto Dai、Zhang Xufang、Sometani Mitsuru、Okamoto Mitsuo、Hatakeyama Tetsuo、Harada Shinsuke、Iwamuro Noriyuki、Yano Hiroshi
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 59 Issue: 4 Pages: 044003-044003

    • DOI

      10.35848/1347-4065/ab7ddb

    • Related Report
      2019 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Investigation of UIS Capability for -600V Class Vertical SiC p-channel MOSFET2019

    • Author(s)
      Yao Kailun、Yano Hiroshi、Iwamuro Noriyuki
    • Journal Title

      2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD)

      Volume: ー Pages: 187-190

    • DOI

      10.1109/ispsd.2019.8757607

    • Related Report
      2019 Annual Research Report
  • [Journal Article] Impact of oxide thickness on the density distribution of near-interface traps in 4H-SiC MOS capacitors2018

    • Author(s)
      X. Zhang, D. Okamoto, T. Hatakeyama, M. Sometani, S. Harada, N. Iwamuro, and H. Yano
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 57

    • NAID

      210000149219

    • Related Report
      2017 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Analysis of fast and slow responses in AC conductance curves for p-type SiC MOS capacitors2018

    • Author(s)
      Y. Karamoto, X. Zhang, D. Okamoto, M. Sometani, T. Hatakeyama, S. Harada, N. Iwamuro, and H. Yano
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 57

    • NAID

      210000149221

    • Related Report
      2017 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Investigation of Robustness Capability of -730 V P-Channel Vertical SiC Power MOSFET for Complementary Inverter Applications2017

    • Author(s)
      J. An, M. Namai, H. Yano, and N. Iwamuro
    • Journal Title

      IEEE Trans. Electron Devices

      Volume: 64 Issue: 10 Pages: 4219-4225

    • DOI

      10.1109/ted.2017.2742542

    • Related Report
      2017 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Characterization of Near-Interface Traps at 4H-SiC Metal-Oxide-Semiconductor Interfaces Using a Modified Distributed Circuit Model2017

    • Author(s)
      X. Zhang, D. Okamoto, T. Hatakeyama, M. Sometani, S. Harada, R. Kosugi, N. Iwamuro, and H. Yano
    • Journal Title

      Appl. Phys. Express

      Volume: 10 Issue: 6 Pages: 064101-064101

    • DOI

      10.7567/apex.10.064101

    • NAID

      210000135889

    • Related Report
      2017 Annual Research Report
    • Peer Reviewed
  • [Presentation] Influence of Interface Traps on Split C-V Characteristics of 4H-SiC MOSFETs2020

    • Author(s)
      Gyozen Sai, Dai Okamoto, Noriyuki Iwamoro, and Hiroshi Yano
    • Organizer
      第67回応用物理学会春季学術講演会
    • Related Report
      2019 Annual Research Report
  • [Presentation] SiC pチャネルMOSFETの正孔輸送機構の解析2020

    • Author(s)
      岡本大, 周星炎, 張旭芳, 染谷満, 岡本光央, 畠山哲夫, 原田信介, 岩室憲幸, 矢野裕司
    • Organizer
      電子デバイス界面テクノロジー研究会 -材料・プロセス・デバイス特性の物理- 第25回研究会
    • Related Report
      2019 Annual Research Report
  • [Presentation] Conduction mechanism of hole leakage current in 4H-SiC MOSFETs under high negative gate bias2019

    • Author(s)
      Hiroki Nemoto, Dai Okamoto, Xufang Zhang, Mitsuru Sometani, Mitsuo Okamoto, Tetsuo Hatakeyama, Shinsuke Harada, Noriyuki Iwamuro, Hiroshi Yano
    • Organizer
      International Conference on Silicon Carbide and Related Materials 2019 (ICSCRM 2019)
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Threshold Voltage Instability in p-channel 4H-SiC MOSFETs Investigated by Non-relaxation Method2019

    • Author(s)
      Dai Okamoto, Hiroki Nemoto, Xufang Zhang, Xingyan Zhou, Mitsuru Sometani, Mitsuo Okamoto, Shinsuke Harada, Tetsuo Hatakeyama, Noriyuki Iwamuro, Hiroshi Yano
    • Organizer
      International Conference on Silicon Carbide and Related Materials 2019 (ICSCRM 2019)
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Accurate Channel Mobility Extraction and Scattering Mechanisms in 4H-SiC p-Channel MOSFETs2019

    • Author(s)
      Xingyan Zhou, Dai Okamoto, Xufang Zhang, Mitsuru Sometani, Mitsuo Okamoto, Shinsuke Harada, Noriyuki Iwamuro, Hirosi Yano
    • Organizer
      International Conference on Silicon Carbide and Related Materials 2019 (ICSCRM 2019)
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Analysis of three-level charge pumping characteristics of 4H-SiC MOSFETs considering near-interface traps2019

    • Author(s)
      Yuta Matsuya, Xufang Zhang, Dai Okamoto, Noriyuki Iwamuro, Hiroshi Yano
    • Organizer
      International Conference on Silicon Carbide and Related Materials 2019 (ICSCRM 2019)
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Different Behaviors of Interface Traps for p-type 4H-SiC MOS Capacitors with Wet and Nitrided Gate Oxides2019

    • Author(s)
      Xufang Zhang, Dai Okamoto, Mitsuru Sometani, Shinsuke Harada, Noriyuki Iwamuro, Hiroshi Yano
    • Organizer
      International Conference on Silicon Carbide and Related Materials 2019 (ICSCRM 2019)
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Investigation of UIS Capability for -600V Class Vertical SiC p-Channel MOSFET2019

    • Author(s)
      K. Yao, H. Yano, N. Iwamuro
    • Organizer
      The 31st International Symposium on Power Semiconductor Devices & ICs (ISPSD2019)
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research
  • [Presentation] 界面近傍酸化膜トラップを考慮した4H-SiC MOSFETにおける3レベルチャージポンピング特性の解析2019

    • Author(s)
      松谷優汰,張旭芳,岡本大,岩室憲幸,矢野裕司
    • Organizer
      先進パワー半導体分科会 第6回講演会
    • Related Report
      2019 Annual Research Report
  • [Presentation] pチャネル4H-SiC MOSFETにおける酸化膜正孔リーク電流伝導機構の解析2019

    • Author(s)
      根本宏樹, 岡本大, 張旭芳, 染谷満, 岡本光央, 畠山哲夫, 原田信介, 岩室憲幸, 矢野裕司
    • Organizer
      先進パワー半導体分科会 第6回講演会
    • Related Report
      2019 Annual Research Report
  • [Presentation] pチャネル4H-SiC MOSFETのチャネルドリフト移動度の導出と散乱機構の解明2019

    • Author(s)
      周星炎, 岡本大, 張旭芳, 染谷満, 岡本光央, 畠山哲夫, 原田信介, 岩室憲幸, 矢野裕司
    • Organizer
      先進パワー半導体分科会 第6回講演会
    • Related Report
      2019 Annual Research Report
  • [Presentation] 高速緩和なし法によるpチャネル4H-SiC MOSFETのしきい値電圧変動評価2019

    • Author(s)
      坂田大輝, 岡本大, 染谷満, 岡本光央, 原田信介, 畠山哲夫, 根本宏樹, 張旭芳, 岩室憲幸, 矢野裕司
    • Organizer
      先進パワー半導体分科会 第6回講演会
    • Related Report
      2019 Annual Research Report
  • [Presentation] pチャネル4H-SiC MOSFETにおける酸化膜正孔リーク電流伝導機構の解析2019

    • Author(s)
      根本宏樹, 岡本大, 張旭芳, 染谷満, 岡本光央, 畠山哲夫, 原田信介, 岩室憲幸, 矢野裕司
    • Organizer
      第80回応用物理学会秋季学術講演会
    • Related Report
      2019 Annual Research Report
  • [Presentation] 界面近傍酸化膜トラップを考慮した4H-SiC MOSFETの3レベルチャージポンピング特性の解析2019

    • Author(s)
      松谷優汰, 張旭芳, 岡本大, 岩室憲幸, 矢野裕司
    • Organizer
      第80回応用物理学会秋季学術講演会
    • Related Report
      2019 Annual Research Report
  • [Presentation] Investigation of Unclamped Inductive Switching Capability of Silicon Carbide MOSFETs2019

    • Author(s)
      Kailun Yao, 矢野裕司, 岩室憲幸
    • Organizer
      平成31年 電気学会全国大会
    • Related Report
      2018 Annual Research Report
  • [Presentation] Interface Characterization of Nitrided a- and m-Face 4H-SiC MOS Structures Using Distributed Circuit Mode2019

    • Author(s)
      X. Zhang, D. Okamoto, T. Hatakeyama, M. Sometani, S. Harada, N. Iwamuro, and H. Yano
    • Organizer
      電子デバイス界面テクノロジー研究会 -材料・プロセス・デバイス特性の物理- 第24回研究会
    • Related Report
      2018 Annual Research Report
  • [Presentation] Analysis of leakage current conduction mechanisms in thermally grown oxides on p-channel 4H-SiC MOSFETs2018

    • Author(s)
      H. Nemoto, D. Okamoto, M. Sometani, Y. Kiuchi, T. Hatakeyama, S. Harada, N. Iwamuro, and H. Yano,
    • Organizer
      12th European Conference on Silicon Carbide and Related Materials (ECSCRM2018)
    • Related Report
      2018 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Mobility limiting mechanisms in p-channel 4H-SiC MOSFETs investigated by Hall-effect measurements2018

    • Author(s)
      X. Zhou, D. Okamoto, T. Hatakeyama, M. Sometani, S. Harada, X. Zhang, N. Iwamuro, and H. Yano
    • Organizer
      12th European Conference on Silicon Carbide and Related Materials (ECSCRM2018)
    • Related Report
      2018 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Hall効果測定によるpチャネル4H-SiC MOSFETのチャネル輸送機構の解明2018

    • Author(s)
      周星炎,岡本大,畠山哲夫,染谷満,原田信介,岡本光央,張旭芳,岩室憲幸,矢野裕司
    • Organizer
      先進パワー半導体分科会 第5回講演会
    • Related Report
      2018 Annual Research Report
  • [Presentation] pチャネル4H-SiC MOSFETにおける酸化膜リーク電流伝導機構の解析2018

    • Author(s)
      根本宏樹,岡本大,染谷満,木内祐治,岡本光央,畠山哲夫,原田信介,岩室憲幸,矢野裕司
    • Organizer
      先進パワー半導体分科会 第5回講演会
    • Related Report
      2018 Annual Research Report
  • [Presentation] 電力用半導体SiCのゲート酸化膜漏れ電流機構の解析2018

    • Author(s)
      矢野裕司
    • Organizer
      第16回環境研究シンポジウム
    • Related Report
      2018 Annual Research Report
  • [Presentation] Impact of passivation treatments on channel mobility for p-channel 4H-SiC MOSFETs2018

    • Author(s)
      X. Zhou, D. Okamoto, T. Hatakeyama, M. Sometani, S. Harada, Y. Karamoto, X. Zhang, N. Iwamuro, and H. Yano
    • Organizer
      第65回応用物理学会春季学術講演会
    • Related Report
      2017 Annual Research Report
  • [Presentation] pチャネル4H-SiC MOSFETにおける酸化膜リーク電流伝導機構の解析2018

    • Author(s)
      根本宏樹, 岡本大, 染谷満, 木内祐治, 畠山哲夫, 原田信介, 岩室憲幸, 矢野裕司
    • Organizer
      第65回応用物理学会春季学術講演会
    • Related Report
      2017 Annual Research Report
  • [Presentation] Difference of NIT Density Distribution in 4H-SiC MOS Interfaces for Si- and C-faces2018

    • Author(s)
      Xufang Zhang, Dai Okamoto, Tetsuo Hatakeyama, Mitsuru Sometani, Shinsuke Harada, Noriyuki Iwamuro, and Hiroshi Yano
    • Organizer
      電子デバイス界面テクノロジー研究会 -材料・プロセス・デバイス特性の物理- 第23回研究会
    • Related Report
      2017 Annual Research Report
  • [Presentation] Verification of Modified Distributed Circuit Model for Near-Interface Traps in 4H-SiC MOS Interface2017

    • Author(s)
      Xufang Zhang, Dai Okamoto, Tetsuo Hatakeyama, Mitsuru Sometani, Shinsuke Harada, Ryoji Kosugi, Noriyuki Iwamuro, and Hiroshi Yano
    • Organizer
      電子デバイス界面テクノロジー研究会 -材料・プロセス・デバイス特性の物理- 第22回研究会
    • Place of Presentation
      東レ研修センター(静岡県・三島市)
    • Year and Date
      2017-01-20
    • Related Report
      2016 Annual Research Report
  • [Presentation] Analysis of Fast and Slow Responses of Interface Traps in p-type SiC MOS Capacitors by Conductance Method2017

    • Author(s)
      Y. Karamoto, X.Zhang, D. Okamoto, M. Sometani, T. Hatakeyama, S. Harada, N. Iwamuro, and H. Yano
    • Organizer
      2017 International Workshop on Dielectric Thin Films for Future Electron Devices - Science and Technology - (2017IWDTF)
    • Related Report
      2017 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Impact of Oxide Thickness on the Density Distribution of Near-interface Traps in 4H-SiC MOS Capacitors2017

    • Author(s)
      X. Zhang, D. Okamoto, T. Hatakeyama, M. Sometani, S. Harada, N. Iwamuro, and H. Yano
    • Organizer
      2017 International Workshop on Dielectric Thin Films for Future Electron Devices - Science and Technology - (2017IWDTF)
    • Related Report
      2017 Annual Research Report
    • Int'l Joint Research
  • [Presentation] SiC MOSデバイスにおける界面欠陥と信頼性2017

    • Author(s)
      矢野裕司
    • Organizer
      第37回ナノテスティングシンポジウム
    • Related Report
      2017 Annual Research Report
    • Invited
  • [Presentation] 4H-SiC MOS 界面におけるNIT 密度分布の膜厚依存性2017

    • Author(s)
      Xufang Zhang, Dai Okamoto, Tetsuo Hatakeyama, Mitsuru Sometani, Shinsuke Harada, Noriyuki Iwamuro, and Hiroshi Yano
    • Organizer
      先進パワー半導体分科会 第4回講演会
    • Related Report
      2017 Annual Research Report
  • [Presentation] コンダクタンス法によるp型SiC MOS界面の高速及び低速応答準位の解析2017

    • Author(s)
      唐本祐樹, 張旭芳, 岡本大, 染谷満, 畠山哲夫, 原田信介, 岩室憲幸, 矢野裕司
    • Organizer
      先進パワー半導体分科会 第4回講演会
    • Related Report
      2017 Annual Research Report
  • [Presentation] Verification of density distribution of near-interface traps in 4H-SiC MOS capacitors with different oxide thicknesses2017

    • Author(s)
      Xufang Zhang, Dai Okamoto, Tetsuo Hatakeyama, Mitsuru Sometani, Shinsuke Harada, Noriyuki Iwamuro, and Hiroshi Yano
    • Organizer
      第78回応用物理学会秋季学術講演会
    • Related Report
      2017 Annual Research Report
  • [Presentation] コンダクタンス法によるp型SiC MOSキャパシタ界面特性の解析2017

    • Author(s)
      唐本祐樹, 張旭芳, 岡本大, 染谷満, 畠山哲夫, 原田信介, 岩室憲幸, 矢野裕司
    • Organizer
      第78回応用物理学会秋季学術講演会
    • Related Report
      2017 Annual Research Report
  • [Presentation] A Distributed Model for Near-Interface Traps in 4H-SiC MOS Capacitors2016

    • Author(s)
      X. F. Zhang, D. Okamoto, T. Hatakeyama, M. Sometani, S. Harada, R. Kosugi, N. Iwamuro, and H. Yano
    • Organizer
      47th IEEE Semiconductor interface Specialist Conference (SISC2016)
    • Place of Presentation
      San Diego (USA)
    • Year and Date
      2016-12-07
    • Related Report
      2016 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Quantitative estimation of near-interface traps with distributed circuit model for 4H-SiC MOS capacitors2016

    • Author(s)
      Xufang Zhang, Dai Okamoto, Tetsuo Hatakeyama, Mitsuru Sometani, Shinsuke Harada, Ryoji Kosugi, Noriyuki Iwamuro, and Hiroshi Yano
    • Organizer
      先進パワー半導体分科会 第3回講演会
    • Place of Presentation
      つくば国際会議場(茨城県・つくば市)
    • Year and Date
      2016-11-08
    • Related Report
      2016 Annual Research Report
  • [Presentation] 窒化したp 型SiC MOS キャパシタにおける反転層の形成2016

    • Author(s)
      唐本祐樹, 岡本大, 原田信介, 染谷満, 畠山哲夫, 小杉亮治, 岩室憲幸, 矢野裕司
    • Organizer
      先進パワー半導体分科会 第3回講演会
    • Place of Presentation
      つくば国際会議場(茨城県・つくば市)
    • Year and Date
      2016-11-08
    • Related Report
      2016 Annual Research Report
  • [Presentation] A Distributed Model for Near-Interface Traps in 4H-SiC MOS Capacitors2016

    • Author(s)
      Xufang Zhang, Dai Okamoto, Tetsuo Hatakeyama, Mitsuru Sometani, Shinsuke Harada, Ryoji Kosugi, Noriyuki Iwamuro, and Hiroshi Yano
    • Organizer
      第77回応用物理学会秋季学術講演会
    • Place of Presentation
      朱鷺メッセ(新潟県・新潟市)
    • Year and Date
      2016-09-13
    • Related Report
      2016 Annual Research Report
  • [Presentation] 窒化したp型SiC MOSキャパシタにおける反転層の形成2016

    • Author(s)
      唐本祐樹, 岡本大, 原田信介, 染谷満, 畠山哲夫, 小杉亮治, 岩室憲幸, 矢野裕司
    • Organizer
      第77回応用物理学会秋季学術講演会
    • Place of Presentation
      朱鷺メッセ(新潟県・新潟市)
    • Year and Date
      2016-09-13
    • Related Report
      2016 Annual Research Report
  • [Presentation] 直列抵抗を考慮したインピーダンス測定によるSiC MOS界面解析2016

    • Author(s)
      岡本大, 張旭芳, 畠山哲夫, 染谷満, 原田信介, 小杉亮治, 岩室憲幸, 矢野裕司
    • Organizer
      第77回応用物理学会秋季学術講演会
    • Place of Presentation
      朱鷺メッセ(新潟県・新潟市)
    • Year and Date
      2016-09-13
    • Related Report
      2016 Annual Research Report

URL: 

Published: 2016-04-21   Modified: 2021-02-19  

Information User Guide FAQ News Terms of Use Attribution of KAKENHI

Powered by NII kakenhi