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Development of countermeasure methods based on combinations of layered security against fault attacks by intentional electromagnetic interference(Fostering Joint International Research)

Research Project

Project/Area Number 16KK0006
Research Category

Fund for the Promotion of Joint International Research (Fostering Joint International Research)

Allocation TypeMulti-year Fund
Research Field Information security
Research InstitutionNara Institute of Science and Technology (2017, 2019)
Tohoku Gakuin University (2016)

Principal Investigator

Hayashi Yuichi  奈良先端科学技術大学院大学, 先端科学技術研究科, 教授 (60551918)

Project Period (FY) 2017 – 2019
Project Status Completed (Fiscal Year 2019)
Budget Amount *help
¥13,390,000 (Direct Cost: ¥10,300,000、Indirect Cost: ¥3,090,000)
Keywords故障利用解析 / サイドチャネル攻撃 / 意図的電磁妨害 / 電磁情報セキュリティ / 情報学 / 情報セキュリティ
Outline of Final Research Achievements

We focus on threats of fault injection attacks using intentional electromagnetic interference, which is one of the most powerful implementation attacks against cryptographic modules that are increasingly being embedded in IoT devices. By combining the lower-layers knowledge of us and the upper-layers knowledge of KU Leuven, we have developed drastic countermeasure methods against fault injection attacks.

Academic Significance and Societal Importance of the Research Achievements

実装攻撃に関しては攻撃が多様化しており、セキュアな暗号モジュール設計や、学会などで示される新たな解析法や対策法を実装するためには、プロトコルレベルの知識から、暗号モジュールを実装するハードウェア設計の知識に至るレイヤを縦断した幅広い知識が要求される。一方、各レイヤに関する知見は単一の分野でのカバーは難しく、分野間の連携が必要となることから、研究代表者の有する下位レイヤの知見と国際共同研究機関であるKU Leuvenの有する上位レイヤの知見を有機的に結合させ、上述した攻撃に対する抜本的な対策技術の開発を行った。

Report

(2 results)
  • 2019 Annual Research Report   Final Research Report ( PDF )
  • Research Products

    (9 results)

All 2020 2019 2017

All Int'l Joint Research (1 results) Journal Article (5 results) (of which Int'l Joint Research: 4 results,  Peer Reviewed: 5 results) Presentation (3 results) (of which Int'l Joint Research: 1 results,  Invited: 1 results)

  • [Int'l Joint Research] KU Leuven(ベルギー)2017

    • Related Report
      2019 Annual Research Report
  • [Journal Article] Design Considerations for EM Pulse Fault Injection2020

    • Author(s)
      Beckers Arthur、Kinugawa Masahiro、Hayashi Yuichi、Fujimoto Daisuke、Balasch Josep、Gierlichs Benedikt、Verbauwhede Ingrid
    • Journal Title

      International Conference on Smart Card Research and Advanced Applications. Springer

      Volume: 11833 Pages: 176-192

    • DOI

      10.1007/978-3-030-42068-0_11

    • ISBN
      9783030420673, 9783030420680
    • Related Report
      2019 Annual Research Report
    • Peer Reviewed / Int'l Joint Research
  • [Journal Article] Characterization of EM Faults on ATmega328p2019

    • Author(s)
      Arthur Beckers, Josep Balasch, Benedikt Gierlichs, Saki Osuka, Masahiro Kinugawa, Daisuke Fujimoto, Yuichi Hayashi, Ingrid Verbauwhede
    • Journal Title

      2019 Joint International Symposium on Electromagnetic Compatibility and Asia-Pacific International Symposium on Electromagnetic Compatibility

      Volume: 99 Pages: 820-823

    • Related Report
      2019 Annual Research Report
    • Peer Reviewed / Int'l Joint Research
  • [Journal Article] Fundamental Study on Randomness Evaluation Method of RO-Based TRNG Using APD2019

    • Author(s)
      Saki Osuka, Daisuke Fujimoto, Naofumi Homma, Arthur Beckers, Josep Balasch, Benedikt Gierlichs, Ingrid Verbauwhede, Yuichi Hayashi
    • Journal Title

      2019 Joint International Symposium on Electromagnetic Compatibility and Asia-Pacific International Symposium on Electromagnetic Compatibility

      Volume: 99 Pages: 244-244

    • Related Report
      2019 Annual Research Report
    • Peer Reviewed / Int'l Joint Research
  • [Journal Article] Electromagnetic Information Security Demanded by Social Infrastructure Constructed by Information Devices2019

    • Author(s)
      Yuichi Hayashi, William Radasky
    • Journal Title

      2019 Joint International Symposium on Electromagnetic Compatibility and Asia-Pacific International Symposium on Electromagnetic Compatibility

      Volume: 99 Pages: 788-788

    • Related Report
      2019 Annual Research Report
    • Peer Reviewed / Int'l Joint Research
  • [Journal Article] A Method for Distinguishing Faulty Bytes in Cryptographic Device Using EM Information Leakage2019

    • Author(s)
      Mitsuki Takenouchi, Naoto Saga, Yuichi Hayashi, Takaaki Mizuki, Hideaki Sone
    • Journal Title

      2019 Joint International Symposium on Electromagnetic Compatibility and Asia-Pacific International Symposium on Electromagnetic Compatibility

      Volume: 99 Pages: 669-669

    • Related Report
      2019 Annual Research Report
    • Peer Reviewed
  • [Presentation] TERO-based TRNGに対する周波数注入攻撃時の出力ビット推定手法に関する基礎検討2019

    • Author(s)
      大須賀 彩希, 藤本 大介, 林 優一
    • Organizer
      ハードウェアセキュリティ研究会
    • Related Report
      2019 Annual Research Report
  • [Presentation] EM Information Leakage Threat Caused by Low-power IEMI and Hardware Trojan2019

    • Author(s)
      Yuichi Hayashi
    • Organizer
      The 2019 IEEE International Symposium on EMC+SIPI
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] 順序回路への故障注入に起因した不均一な頻度分布を持つ誤り出力を用いた故障利用解析2019

    • Author(s)
      岡本拓実, 藤本大介, 崎山一男, 李 陽, 林 優一
    • Organizer
      ハードウェアセキュリティ研究会
    • Related Report
      2019 Annual Research Report

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Published: 2017-03-15   Modified: 2021-02-19  

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