Development of countermeasure methods based on combinations of layered security against fault attacks by intentional electromagnetic interference(Fostering Joint International Research)
Project/Area Number |
16KK0006
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Research Category |
Fund for the Promotion of Joint International Research (Fostering Joint International Research)
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Allocation Type | Multi-year Fund |
Research Field |
Information security
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Research Institution | Nara Institute of Science and Technology (2017, 2019) Tohoku Gakuin University (2016) |
Principal Investigator |
Hayashi Yuichi 奈良先端科学技術大学院大学, 先端科学技術研究科, 教授 (60551918)
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Project Period (FY) |
2017 – 2019
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Project Status |
Completed (Fiscal Year 2019)
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Budget Amount *help |
¥13,390,000 (Direct Cost: ¥10,300,000、Indirect Cost: ¥3,090,000)
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Keywords | 故障利用解析 / サイドチャネル攻撃 / 意図的電磁妨害 / 電磁情報セキュリティ / 情報学 / 情報セキュリティ |
Outline of Final Research Achievements |
We focus on threats of fault injection attacks using intentional electromagnetic interference, which is one of the most powerful implementation attacks against cryptographic modules that are increasingly being embedded in IoT devices. By combining the lower-layers knowledge of us and the upper-layers knowledge of KU Leuven, we have developed drastic countermeasure methods against fault injection attacks.
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Academic Significance and Societal Importance of the Research Achievements |
実装攻撃に関しては攻撃が多様化しており、セキュアな暗号モジュール設計や、学会などで示される新たな解析法や対策法を実装するためには、プロトコルレベルの知識から、暗号モジュールを実装するハードウェア設計の知識に至るレイヤを縦断した幅広い知識が要求される。一方、各レイヤに関する知見は単一の分野でのカバーは難しく、分野間の連携が必要となることから、研究代表者の有する下位レイヤの知見と国際共同研究機関であるKU Leuvenの有する上位レイヤの知見を有機的に結合させ、上述した攻撃に対する抜本的な対策技術の開発を行った。
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Report
(2 results)
Research Products
(9 results)
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[Journal Article] Design Considerations for EM Pulse Fault Injection2020
Author(s)
Beckers Arthur、Kinugawa Masahiro、Hayashi Yuichi、Fujimoto Daisuke、Balasch Josep、Gierlichs Benedikt、Verbauwhede Ingrid
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Journal Title
International Conference on Smart Card Research and Advanced Applications. Springer
Volume: 11833
Pages: 176-192
DOI
ISBN
9783030420673, 9783030420680
Related Report
Peer Reviewed / Int'l Joint Research
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[Journal Article] Characterization of EM Faults on ATmega328p2019
Author(s)
Arthur Beckers, Josep Balasch, Benedikt Gierlichs, Saki Osuka, Masahiro Kinugawa, Daisuke Fujimoto, Yuichi Hayashi, Ingrid Verbauwhede
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Journal Title
2019 Joint International Symposium on Electromagnetic Compatibility and Asia-Pacific International Symposium on Electromagnetic Compatibility
Volume: 99
Pages: 820-823
Related Report
Peer Reviewed / Int'l Joint Research
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