• Search Research Projects
  • Search Researchers
  • How to Use
  1. Back to previous page

Intelligently controled device simulator utlizing small numer of dominant time constant approximation

Research Project

Project/Area Number 17K05142
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeMulti-year Fund
Section一般
Research Field Computational science
Research InstitutionKyoto Institute of Technology

Principal Investigator

Kumashiro Shigetaka  京都工芸繊維大学, グリーンイノベーションラボ, 特任教授 (60791473)

Co-Investigator(Kenkyū-buntansha) 小林 和淑  京都工芸繊維大学, 電気電子工学系, 教授 (70252476)
Project Period (FY) 2017-04-01 – 2021-03-31
Project Status Completed (Fiscal Year 2020)
Budget Amount *help
¥4,810,000 (Direct Cost: ¥3,700,000、Indirect Cost: ¥1,110,000)
Fiscal Year 2020: ¥650,000 (Direct Cost: ¥500,000、Indirect Cost: ¥150,000)
Fiscal Year 2019: ¥650,000 (Direct Cost: ¥500,000、Indirect Cost: ¥150,000)
Fiscal Year 2018: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2017: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
Keywords負の時定数 / スナップバック / ハードブレークダウン / 過渡解析 / 局所的打切り誤差 / 時間刻み幅制御 / バイアス電圧増分量制限法 / ホモトピー法 / 負の主要応答時定数 / 正帰還系シミュレーション / 主要応答時定数 / 局所打切り誤差 / ブレークダウン / 数値計算手法 / デバイスシミュレーション
Outline of Final Research Achievements

A method for extracting dominant time constants from the linearized semiconductor device equations (Poisson equation, electron current continuity equation and hole current continuity equation) by using Arnoldi method has been developed. Calculation time of device transient analysis has been diminished to 30% of the conventional one by the time step width control with "Exponential-type local truncation error index" which utilizes the dominant time constants. Furthermore, it has been found that negative time constants appear when hard breakdown occurs in a PN junction diode. By taking advantage of this information, a robust simulation method from hard breakdown to snap back of electro-static discharge protection MOSFET has been developed. This method switches from DC analysis to transient analysis upon detecting the negative time constants.

Academic Significance and Societal Importance of the Research Achievements

本研究成果により、従来、特に計算が失敗することの多かった、MOSFET のインパクトイオン化によって生じる「ハードブレークダウン」から「スナップバック」に致るシミュレーションにおいて、誰もが確実に収束解を得ることが出来る様になった。
また、非線形デバイス方程式を線形化して抽出した主要応答時定数は、そのデバイスの当該時刻から見た未来に関する貴重な情報を含んでおり、この「未来情報」の有効活用により、デバイスの系全体の応答を長期的に予測して、事前に危険を察知しつつ全体最適化された、時間刻み制御ならびに収束性制御アルゴリズムの開発を行った点が、本研究の特色であり、学術的に独創的な点である。

Report

(5 results)
  • 2020 Annual Research Report   Final Research Report ( PDF )
  • 2019 Research-status Report
  • 2018 Research-status Report
  • 2017 Research-status Report
  • Research Products

    (6 results)

All 2020 2019 2018 2017

All Journal Article (1 results) (of which Peer Reviewed: 1 results) Presentation (5 results) (of which Int'l Joint Research: 2 results,  Invited: 1 results)

  • [Journal Article] An Efficient and Accurate Time Step Control Method for Power Device Transient Simulation Utilizing Dominant Time Constant Approximation2020

    • Author(s)
      Kumashiro Shigetaka、Kamei Tatsuya、Hiroki Akira、Kobayashi Kazutoshi
    • Journal Title

      IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

      Volume: 39 Issue: 2 Pages: 451-463

    • DOI

      10.1109/tcad.2018.2889673

    • Related Report
      2019 Research-status Report 2018 Research-status Report
    • Peer Reviewed
  • [Presentation] A Robust Simulation Method for Breakdown with Voltage Boundary Condition Utilizing Negative Time Constant Information2019

    • Author(s)
      Shigetaka Kumashiro
    • Organizer
      SISPAD2019
    • Related Report
      2019 Research-status Report
    • Int'l Joint Research
  • [Presentation] Matrix Exponential法を用いた過渡解析の時間刻み制御とニュートン反復回数の削減2018

    • Author(s)
      亀井達也, 熊代成孝, 小林和淑, 廣木彰, 古田潤
    • Organizer
      第31回 回路とシステムワークショップ
    • Related Report
      2018 Research-status Report
  • [Presentation] Matrix Exponential法を用いたパワーMOSFETの過渡解析の高速化2018

    • Author(s)
      亀井達也、熊代成孝、小林和淑
    • Organizer
      電子情報通信学会ICD研究会
    • Related Report
      2017 Research-status Report
  • [Presentation] An Accurate Metric to Control Time Step of Transient Device Simulation by Matrix Exponential Method2017

    • Author(s)
      Shigetaka Kumashiro, Tatsuya Kamei, Akira Hiroki, Kazutoshi Kobayashi
    • Organizer
      SISPAD 2017
    • Related Report
      2017 Research-status Report
    • Int'l Joint Research
  • [Presentation] 行列指数法によるデバイス過渡シミュレーションの正確な時間刻み指標2017

    • Author(s)
      熊代成孝、亀井達也、廣木彰、小林和淑
    • Organizer
      電子情報通信学会SDM研究会
    • Related Report
      2017 Research-status Report
    • Invited

URL: 

Published: 2017-04-28   Modified: 2022-01-27  

Information User Guide FAQ News Terms of Use Attribution of KAKENHI

Powered by NII kakenhi