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Study on high reliability of neuromorphic hardware

Research Project

Project/Area Number 18K18025
Research Category

Grant-in-Aid for Early-Career Scientists

Allocation TypeMulti-year Fund
Review Section Basic Section 60040:Computer system-related
Research InstitutionNara Institute of Science and Technology

Principal Investigator

Shintani Michihiro  奈良先端科学技術大学院大学, 先端科学技術研究科, 助教 (80748913)

Project Period (FY) 2018-04-01 – 2021-03-31
Project Status Completed (Fiscal Year 2020)
Budget Amount *help
¥3,510,000 (Direct Cost: ¥2,700,000、Indirect Cost: ¥810,000)
Fiscal Year 2020: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
Fiscal Year 2019: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
Fiscal Year 2018: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Keywordsニューラルネットワーク / メモリスタ / 高信頼化 / 誤り訂正 / 脳型コンピュータ / 過渡故障 / 永久故障 / 誤り訂正符号 / 機械学習 / 信頼性 / 検査容易化
Outline of Final Research Achievements

In this research, we conducted research on neuromorphic hardware that drastically improves the performance of deep learning, and in particular, we focused on improving the reliability of neural networks using memristors. Manufacturing technology of the memristors is immature and have issues with reliability. Therefore, we worked on developing the fault-tolerant techniques for the memoristar-based neural network. In particular, we have developed an error correction function that adds redundant cells for checksums in the column and row directions. As a result of numerical calculation using the Hopfield network, it was confirmed that the identification rate was improved by 25.81% compared to no measures and 5.25% compared to the existing method.

Academic Significance and Societal Importance of the Research Achievements

フォンノイマンボトルネックによるノイマン型計算基盤の性能向上の限界、ムーアの法則 の破綻が近づき、ヒトの脳を模した脳型コンピュータ(Neuromorphic Computer)はこれまでの計算の質を革新する最重要技術の1つとして期待を集めている。しかし、構成素子であるメムデバイスの製造不安定に起因する信頼性課題により大規模化、すなわち量、に重大な課題を抱えており、ノイマン型計算規模を超える目処は立っていない。本研究は、脳型コンピュータの高集積化に不可欠な高信頼化設計の技術基盤を形成するものであり、今後の脳型コンピュータの高集積化に向けた基礎技術となりうる。

Report

(4 results)
  • 2020 Annual Research Report   Final Research Report ( PDF )
  • 2019 Research-status Report
  • 2018 Research-status Report
  • Research Products

    (25 results)

All 2021 2020 2019 2018 Other

All Int'l Joint Research (2 results) Journal Article (4 results) (of which Peer Reviewed: 4 results) Presentation (17 results) (of which Int'l Joint Research: 7 results,  Invited: 1 results) Remarks (2 results)

  • [Int'l Joint Research] Duke University/University of California, San Diego(米国)

    • Related Report
      2020 Annual Research Report
  • [Int'l Joint Research] Duke University(米国)

    • Related Report
      2019 Research-status Report
  • [Journal Article] Area-Efficient and Reliable Error Correcting Code Circuit Based on Hybrid CMOS/Memristor Circuit2020

    • Author(s)
      Ishizaka Mamoru、Shintani Michihiro、Inoue Michiko
    • Journal Title

      Journal of Electronic Testing

      Volume: 36 Issue: 4 Pages: 537-546

    • DOI

      10.1007/s10836-020-05892-3

    • Related Report
      2020 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Cost-Efficient Recycled FPGA Detection through Statistical Performance Characterization Framework2020

    • Author(s)
      Ahmed Foisal、Shintani Michihiro、Inoue Michiko
    • Journal Title

      IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

      Volume: E103.A Issue: 9 Pages: 1045-1053

    • DOI

      10.1587/transfun.2019kep0014

    • NAID

      130007893711

    • Related Report
      2020 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Accurate Recycled FPGA Detection Using an Exhaustive-Fingerprinting Technique Assisted by WID Process Variation Modeling2020

    • Author(s)
      Ahmed Foisal、Shintani Michihiro、Inoue Michiko
    • Journal Title

      IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

      Volume: - Issue: 8 Pages: 1-1

    • DOI

      10.1109/tcad.2020.3023684

    • Related Report
      2020 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Measurement and Modeling of Ambient-air-induced Degradation in Organic Thin-Film Transistor2020

    • Author(s)
      Michihiro Shintani, Michiaki Saito, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato
    • Journal Title

      IEEE Transactions on Semiconductor Manufacturing

      Volume: 33 Issue: 2 Pages: 216-223

    • DOI

      10.1109/tsm.2020.2986609

    • Related Report
      2019 Research-status Report
    • Peer Reviewed
  • [Presentation] 自己参照に基づく直接密度比推定を用いた教師なし再利用FPGA検出2021

    • Author(s)
      井阪友哉、新谷道広、アフメドフォイサル、井上美智子
    • Organizer
      電子情報通信学会技術研究報告 (ディペンダブルコンピューティング研究会)
    • Related Report
      2020 Annual Research Report
  • [Presentation] LBIST-PUF: An LBIST Scheme Towards Efficient Challenge-Response Pairs Collection and Machine-Learning Attack Tolerance Improvement2020

    • Author(s)
      Shintani Michihiro、Mino Tomoki、Inoue Michiko
    • Organizer
      IEEE Asian Test Symposium (ATS)
    • Related Report
      2020 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Recycled FPGA detection using exhaustive fingerprinting characterization2020

    • Author(s)
      Shintani Michihiro
    • Organizer
      The 15th D2T Symposium, The University of Tokyo
    • Related Report
      2020 Annual Research Report
    • Invited
  • [Presentation] チェックサムとオンラインテストによるメモリスタニューラルネットワークの耐故障設計2020

    • Author(s)
      石坂守, 新谷道広, 井上美智子
    • Organizer
      電子情報通信学会技術研究報告(VLSI設計技術研究会)
    • Related Report
      2019 Research-status Report
  • [Presentation] 網羅的パス解析による高精度な再利用FPGA検出手法2020

    • Author(s)
      新谷道広, アフメドフォイサル, 井上美智子
    • Organizer
      電子情報通信学会技術研究報告(ディペンダブルコンピューティング研究会)
    • Related Report
      2019 Research-status Report
  • [Presentation] Improvement of Variational Autoencoder Based Test Escape Detection through Image Transformation2019

    • Author(s)
      Romain Chicoix, Michihiro Sintani, Kouichi Kumaki, and Michiko Inoue
    • Organizer
      電子情報通信学会技術研究報告(VLSI設計技術研究会)
    • Related Report
      2019 Research-status Report
  • [Presentation] Feature Engineering for Recycled FPGA Detection Based on WID Variation Modeling2019

    • Author(s)
      Foisal Ahmed, Michihiro Shintani, and Michiko Inoue
    • Organizer
      IEEE European Test Symposium (ETS)
    • Related Report
      2019 Research-status Report
    • Int'l Joint Research
  • [Presentation] Low Cost Recycled FPGA Detection Using Virtual Probe Technique2019

    • Author(s)
      Foisal Ahmed, Michihiro Shintani, and Michiko Inoue
    • Organizer
      IEEE International Test Conference in Asia (ITC-Asia)
    • Related Report
      2019 Research-status Report
    • Int'l Joint Research
  • [Presentation] Feature Engineering for Recycled FPGA Detection Based on WID Variation Modeling2019

    • Author(s)
      Foisal Ahmed, Michihiro Shintani, and Michiko Inoue
    • Organizer
      IEEE European Test Conference (ETS)
    • Related Report
      2018 Research-status Report
    • Int'l Joint Research
  • [Presentation] 自動微分を用いた SPICE モデルパラメータ抽出環境の構築2019

    • Author(s)
      上田葵, 新谷道広, 岩田大志, 山口賢一, 井上美智子
    • Organizer
      電子情報通信学会技術研究報告(VLSI設計技術研究会)
    • Related Report
      2018 Research-status Report
  • [Presentation] Variational Autoencoder-Based Efficient Test Escape Detection2019

    • Author(s)
      Michihiro Shintani, Kouichi Kumaki, and Michiko Inoue
    • Organizer
      電子情報通信学会技術研究報告(ディペンダブルコンピューティング研究会)
    • Related Report
      2018 Research-status Report
  • [Presentation] An Efficient Approach to Recycled FPGA Detection Using WID Variation Modeling2019

    • Author(s)
      Foisal Ahmed, Michihiro Shintani, and Michiko Inoue
    • Organizer
      電子情報通信学会技術研究報告(ディペンダブルコンピューティング研究会)
    • Related Report
      2018 Research-status Report
  • [Presentation] 製造検査時における組込み自己テスト回路を利用した効率的なPUF回路のチャレンジレスポンス対の生成と評価2019

    • Author(s)
      三野智貴, 新谷道広, 井上美智子
    • Organizer
      電子情報通信学会技術研究報告(ディペンダブルコンピューティング研究会)
    • Related Report
      2018 Research-status Report
  • [Presentation] 重み推定によるメモリスタニューラルネットワークの信頼性向上の試み2018

    • Author(s)
      石坂守, 新谷道広, 井上美智子
    • Organizer
      電子情報通信学会技術研究報告(ディペンダブルコンピューティング研究会)
    • Related Report
      2018 Research-status Report
  • [Presentation] Artificial Neural Network Based Test Escape Screening Using Generative Model2018

    • Author(s)
      Michihiro Shintani, Yoshiyuki Nakamura, and Michiko Inoue
    • Organizer
      IEEE International Test Conference (ITC)
    • Related Report
      2018 Research-status Report
    • Int'l Joint Research
  • [Presentation] Area-efficient and Reliable Hybrid CMOS/Memristor ECC Circuit for ReRAM Storage2018

    • Author(s)
      Mamoru Ishizaka, Michihiro Shintani, and Michiko Inoue
    • Organizer
      IEEE Asian Test Symposium (ATS)
    • Related Report
      2018 Research-status Report
    • Int'l Joint Research
  • [Presentation] Area-Efficient Memristor-Crossbar-Based Error Correcting Code Circuit2018

    • Author(s)
      Mamoru Ishizaka, Michihiro Shintani, and Michiko Inoue
    • Organizer
      Workshop on Security, Reliability, Test, Privacy, Safety and Trust of Future Devices (SURREALIST)
    • Related Report
      2018 Research-status Report
    • Int'l Joint Research
  • [Remarks] http://dslab.naist.jp/

    • Related Report
      2020 Annual Research Report
  • [Remarks] ディペンダブルシステム学研究室

    • URL

      http://dslab.naist.jp/

    • Related Report
      2019 Research-status Report 2018 Research-status Report

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Published: 2018-04-23   Modified: 2022-01-27  

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