| Project/Area Number |
18K18026
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| Research Category |
Grant-in-Aid for Early-Career Scientists
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| Allocation Type | Multi-year Fund |
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| Review Section |
Basic Section 60040:Computer system-related
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| Research Institution | Kyushu Institute of Technology |
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Principal Investigator |
Holst Stefan 九州工業大学, 大学院情報工学研究院, 助教 (40710322)
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| Project Period (FY) |
2018-04-01 – 2020-03-31
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| Project Status |
Completed (Fiscal Year 2019)
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| Budget Amount *help |
¥3,770,000 (Direct Cost: ¥2,900,000、Indirect Cost: ¥870,000)
Fiscal Year 2019: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
Fiscal Year 2018: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
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| Keywords | VLSI / Logic Diagnosis / Small-Delay Defects / IR-Drop / Response Compression / Process Variations / Soft-Error Tolerance / GPU Computing / Failure Analysis |
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| Outline of Final Research Achievements |
This project made significant progress in collecting reliable diagnosis data from chips and enabling diagnosis of defects with complex timing behavior. Two new methods for reliably gathering test responses in the face of potential IR-drop and clock skew issues were developed. One method is based on static structural circuit analysis and the other method is based on accurate GPU-accelerated timing simulation. Furthermore, a new soft-error tolerant latch was published that enables testing and diagnosing of latch-internal production defects for the first time.
Two new diagnosis algorithms were developed. First, a new small delay fault diagnosis approach that is able to analyze highly compressed production test responses that contain the combined effects of the actual defect and omnipresent and unknown delay variations. Second, a diagnosis approach that can for the first time identify hidden delay defects to learn from early-life failures even before they occur.
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| Academic Significance and Societal Importance of the Research Achievements |
Finding root causes of failing chips through logic diagnosis is essential to ensure and improve reliability and safety of electronic systems. This research enabled diagnosis of complex timing defects previous methods were unable to find and thus contributes to more reliable and safe systems.
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