| Budget Amount *help |
¥3,380,000 (Direct Cost: ¥2,600,000、Indirect Cost: ¥780,000)
Fiscal Year 2009: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
Fiscal Year 2008: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2007: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
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| Research Abstract |
In this research, a testing method for crosstalk faults in VLSI (Very Large Scaled Integrated Circuit) circuits has been proposed. A crosstalk fault is induced by coupling interaction between neighbor two lines, and it is hard to detect by the testing method for conventional fault models. We analyzed the fault behavior of crosstalk faults to define a fault model, and proposed a test generation method. Moreover we enhanced the method for transistor shorts to improve fault diagnosis and test pattern generation.
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