| Budget Amount *help |
¥4,550,000 (Direct Cost: ¥3,500,000、Indirect Cost: ¥1,050,000)
Fiscal Year 2009: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2008: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2007: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
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| Research Abstract |
Soft errors (SEs) are radiation-induced transition pulses caused by neutrons from cosmic rays or alpha particles from packaging material. This research got the two type results of (a) VLSI circuit design with the property of SE tolerance, and (b) test generation and easily testable design for SE tolerant circuits. In (a), circuit design masking SE pulses caused in combinational circuit parts, and circuit designs for SE hardened latch or flip-flop have been proposed. In (b), easily testable scan structure for delay faults with the property of SE tolerance has been proposed.
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