Innershell ionization dynamics in a high-intensity x-ray laser and cluster interaction
Project/Area Number |
19684021
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Research Category |
Grant-in-Aid for Young Scientists (A)
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Allocation Type | Single-year Grants |
Research Field |
Plasma science
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Research Institution | Hiroshima University |
Principal Investigator |
NAMBA Shinichi Hiroshima University, 大学院・工学科, 助教 (00343294)
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Project Period (FY) |
2007 – 2009
|
Project Status |
Completed (Fiscal Year 2009)
|
Budget Amount *help |
¥23,140,000 (Direct Cost: ¥17,800,000、Indirect Cost: ¥5,340,000)
Fiscal Year 2009: ¥2,210,000 (Direct Cost: ¥1,700,000、Indirect Cost: ¥510,000)
Fiscal Year 2008: ¥6,760,000 (Direct Cost: ¥5,200,000、Indirect Cost: ¥1,560,000)
Fiscal Year 2007: ¥14,170,000 (Direct Cost: ¥10,900,000、Indirect Cost: ¥3,270,000)
|
Keywords | X線レーザー / クラスター / 内殻電離 / 非線形光学現象 / 強結合プラズマ / クラスタープラズマ / 内殻電離過程 / 非線形光学効果 |
Research Abstract |
The interaction of Xe clusters with a soft x-ray laser pulse having a wavelength of 13.9nm and an intensity of up to 2×10^<10>W/cm^2 was investigated. The corresponding laser photon energy was sufficiently high to photoionize Xe 4d inner-shell electrons. It was found that Xe^<3+> ions became the dominant final ionic product. Possible mechanisms responsible for the enhancement of the double Auger transition probability in x-ray laser and cluster interaction are clarified.
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Report
(4 results)
Research Products
(27 results)
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[Journal Article] Characterization of out-of-band radiation and plasma parameters in laser-produced Sn plasmas for extreme ultraviolet lithography light sources2008
Author(s)
S. Namba, S. Fujioka, H. Sakaguchi, H. Nishimura, Y. Yasuda, K. Nagai, N. Miyanaga, Y. Izawa, K. Mima, K. Sato, K. Takiyama
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Journal Title
J. Appl. Phys 104
Pages: 13305-13305
Related Report
Peer Reviewed
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[Journal Article] Absolute evaluation of out-of-band radiation from laser-produced tin plasmas for extreme ultraviolet lithography2008
Author(s)
H. Sakaguchi, S. Fujioka, S. Namba, H. Tanuma, H. Ohashi, S. Suda, M. Shimomura, Y. Nakai, Y. Kimura, Y. Yasuda, H. Nishimura, T. Norimatsu, A. Sunahara, K. Nishihara, N. Miyanaga, Y. Izawa, K. Mima
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Journal Title
Appl. Phys. Lett 92
Pages: 111503-111503
Related Report
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