Development of a high resolution SPECT with a static data acquisition system with semiconductor detectors
Project/Area Number |
20390332
|
Research Category |
Grant-in-Aid for Scientific Research (B)
|
Allocation Type | Single-year Grants |
Section | 一般 |
Research Field |
Radiation science
|
Research Institution | Hosei University |
Principal Investigator |
OGAWA Koichi Hosei University, 理工学部, 教授 (00158817)
|
Project Period (FY) |
2008 – 2010
|
Project Status |
Completed (Fiscal Year 2010)
|
Budget Amount *help |
¥18,200,000 (Direct Cost: ¥14,000,000、Indirect Cost: ¥4,200,000)
Fiscal Year 2010: ¥6,500,000 (Direct Cost: ¥5,000,000、Indirect Cost: ¥1,500,000)
Fiscal Year 2009: ¥8,970,000 (Direct Cost: ¥6,900,000、Indirect Cost: ¥2,070,000)
Fiscal Year 2008: ¥2,730,000 (Direct Cost: ¥2,100,000、Indirect Cost: ¥630,000)
|
Keywords | SPECT / 半導体検出器 / 空間分解能 / 半導体検土器 |
Research Abstract |
To develop a new SPECT system with a static data acquisition using semiconductor detectors, a data acquisition method and image reconstruction method were developed with a simulation study. The validity of these methods was confirmed with a newly developed myocardial SPECT system and brain SPECT system with CdZnTe semiconductor detectors.
|
Report
(4 results)
Research Products
(33 results)