Development of a Chemically Sensitive AFM : XANAM
| Project/Area Number |
20686004
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| Research Category |
Grant-in-Aid for Young Scientists (A)
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| Allocation Type | Single-year Grants |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | Nagoya University (2009-2011)
Hokkaido University (2008) |
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Principal Investigator |
SUZUKI Shushi 名古屋大学, 工学研究科, 准教授 (30322853)
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| Project Period (FY) |
2008 – 2011
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| Project Status |
Completed (Fiscal Year 2011)
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| Budget Amount *help |
¥25,350,000 (Direct Cost: ¥19,500,000、Indirect Cost: ¥5,850,000)
Fiscal Year 2011: ¥3,770,000 (Direct Cost: ¥2,900,000、Indirect Cost: ¥870,000)
Fiscal Year 2010: ¥3,770,000 (Direct Cost: ¥2,900,000、Indirect Cost: ¥870,000)
Fiscal Year 2009: ¥8,840,000 (Direct Cost: ¥6,800,000、Indirect Cost: ¥2,040,000)
Fiscal Year 2008: ¥8,970,000 (Direct Cost: ¥6,900,000、Indirect Cost: ¥2,070,000)
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| Keywords | 走査プローブ顕微鏡(SPM) / 非接触原子間力顕微鏡(NC-AFM) / 量子ビーム / 放射光X線 / 表面元素分析 / 表面化学分析 / XANAM / 非接触原子間力顕微鏡 / 力相互作用分析 / X線支援非接触原子間力顕微鏡 / 元素分析 / 内殻電子励起 / 水晶振動子 |
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| Research Abstract |
X-ray Aided Noncontact Atomic force microscopy(XANAM) is one of the challenging issue for development of chemically sensitive atomic force microscopy(AFM) in combination with synchrotron X-ray. X-ray can excite inner core shell electrons of an atom on a sample with tuning its energy into specific absorption energy to the atom. Hence, if the electrons can perturb AFM tip-sample interaction, one can know what atom species exists beneath the probe. The instrument for XANAM has been improved and was adapted to new experiments such as force curve analysis with X-ray irradiation. Finally, the challenging could be done by finding a proof to identify atom species directly from the X-ray absorption energy.
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Report
(6 results)
Research Products
(53 results)
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[Journal Article] Fabrication of Transition Metal Oxide Nanoparticles Highly Dispersed in Ionic Liquids by Sputter Deposition2010
Author(s)
Suzuki, T., Suzuki, S., Tomita, Y., Okazaki, K., Shibayama, T., Kuwabata, S., Torimoto, T.
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Journal Title
Chem Lett 39
Pages: 1072-1074
Related Report
Peer Reviewed
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[Journal Article] Nanosize-Controlled Syntheses of Indium Metal Particles and Hollow Indium Oxide Particles via the Sputter Deposition Technique in Ionic Liquids2010
Author(s)
Suzuki, T., Okazaki, K., Suzuki, S., Shibayama, T., Kuwabata, S., Torimoto, T.
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Journal Title
Chem Mater 22
Pages: 5209-5215
Related Report
Peer Reviewed
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[Presentation] Atomically dispersed Cu species on a precovered TiO2(110) surface with acetic anhydride2010
Author(s)
Chun, W.-J.、Koike, Y.、Ashima, H.、 Kinoshita, K、Ijima, K.、Fujikawa, K.、Suzuki, S.、Nomura, M.、Iwasawa, Y.、Asakura, K.
Organizer
7th International Workshop on Oxide Surfaces (IWOX-VII)
Place of Presentation
Echigo-Yuzawa, Japan NASPAニューオータニ
Year and Date
2010-01-12
Related Report
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[Presentation] Bias Effect on the XANAM Measurement2009
Author(s)
S.Suzuki, Y.Nakagawa, K.Kinoshita, K.Fujikawa, W.-J.Chun, M.Nomura, K.Asakura
Organizer
16th International Colloquium on Scanning Probe Microscopy (ICSPM16)
Place of Presentation
Atagawa, Japan
Year and Date
2009-12-13
Related Report
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[Presentation] Bias Effect on the XANAM Measurement2008
Author(s)
S. Suzuki, Y. Nakagawa, K. Kinoshita, K. Fujikawa, W.-J. Chun, M. Nomura, and K. Asakura
Organizer
16th International Colloquium on Scanning Probe Microscopy(ICSPM16)
Place of Presentation
Atagawa, Japan
Related Report
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