| Budget Amount *help |
¥25,350,000 (Direct Cost: ¥19,500,000、Indirect Cost: ¥5,850,000)
Fiscal Year 2011: ¥3,770,000 (Direct Cost: ¥2,900,000、Indirect Cost: ¥870,000)
Fiscal Year 2010: ¥3,770,000 (Direct Cost: ¥2,900,000、Indirect Cost: ¥870,000)
Fiscal Year 2009: ¥8,840,000 (Direct Cost: ¥6,800,000、Indirect Cost: ¥2,040,000)
Fiscal Year 2008: ¥8,970,000 (Direct Cost: ¥6,900,000、Indirect Cost: ¥2,070,000)
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| Research Abstract |
X-ray Aided Noncontact Atomic force microscopy(XANAM) is one of the challenging issue for development of chemically sensitive atomic force microscopy(AFM) in combination with synchrotron X-ray. X-ray can excite inner core shell electrons of an atom on a sample with tuning its energy into specific absorption energy to the atom. Hence, if the electrons can perturb AFM tip-sample interaction, one can know what atom species exists beneath the probe. The instrument for XANAM has been improved and was adapted to new experiments such as force curve analysis with X-ray irradiation. Finally, the challenging could be done by finding a proof to identify atom species directly from the X-ray absorption energy.
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