Research Project
Grant-in-Aid for Young Scientists (B)
In this research, we study techniques for enhancing dependability of large-scale integrated nano-systems built though DNA self-assembly which is known as a promising nano-technology for practical use. We study a hybrid approach combining defect isolation and redundancy techniques for constructing dependable system networks avoiding defective and faulty parts. We also reveal the circuit structure for the developed technique so that defect isolation is automatically done inside the chip.
All 2010 2009 2008
All Journal Article (9 results) (of which Peer Reviewed: 9 results) Presentation (4 results)
IEICE Transactions on Information and Systems Vol.E93-D,No.2
Pages: 306-314
10026813673
IEICE Transactions on Information and Systems E93-D
Journal of Electronic Testing: Theory and Applications Vol.25,No.1
Pages: 11-23
Journal of Grid Computing 7
Pages: 575-600
Proceedings of IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Pages: 313-321
Journal of Electronic Testing: Theory and Applications 25
電子情報通信学会論文誌 Vol.J91-D,No.5
Pages: 1202-1215
電子情報通信学会論文誌 J91-D
Proceedings of the 2nd Workshop on Desktop Grids and Volunteer Comnuting Systems PCGRID-15 69080575
Pages: 1-8