The measurement of LHD plasmas using X-ray imaging polarimeter
Project/Area Number |
20740320
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Research Category |
Grant-in-Aid for Young Scientists (B)
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Allocation Type | Single-year Grants |
Research Field |
Plasma science
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Research Institution | Nagoya University |
Principal Investigator |
SAKURAI Ikuya Nagoya University, 工学研究科, 特任准教授 (10397482)
|
Project Period (FY) |
2008 – 2010
|
Project Status |
Completed (Fiscal Year 2010)
|
Budget Amount *help |
¥4,420,000 (Direct Cost: ¥3,400,000、Indirect Cost: ¥1,020,000)
Fiscal Year 2010: ¥780,000 (Direct Cost: ¥600,000、Indirect Cost: ¥180,000)
Fiscal Year 2009: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2008: ¥2,470,000 (Direct Cost: ¥1,900,000、Indirect Cost: ¥570,000)
|
Keywords | プラズマ / X線 / 偏光計 |
Research Abstract |
We developed an X-ray imaging polarimeter to measure the X-ray polarization from high temperature plasmas on the Large Helical Device (LHD). The X-ray polarimeter is based on the photoelectric effect in gas to detect X-ray polarization. In order to trace a photoelectron track in the gas, we have to measure the electron distribution which is produced by a photoelectron ionizing the gas. Therefore, we make use of the Gas Electron Multiplier (GEM), which the number of electron is multiplied without losing the information of electron distribution. And multiplied electron are detected by the underneath CMOS sensor without a CdTe layer. It is a fine pixelized electron reader with the usable area of 2.5×2.5cm^2. We detected the X-ray polarization from the Fe Kα, which energy was 6.4keV. But CMOS sensor breaks down for an electric discharge before measure the LHD plasmas. So, we could not carry out the measurements of LHD plasmas using X-ray polarimeter.
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Report
(4 results)
Research Products
(2 results)
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[Journal Article] Edge and Core Impurity Transport Study with Spectroscopic Instruments in LHD2009
Author(s)
S.Morita, M.Goto, M.Kobayashi, S.Muto, M.B.Chowdhuri, D.Chunfeng, Z.Hangyu, C.Zhengying,K.Fujii, A.Furuzawa, M.Hasuo, A.Iwamae, J.Yinxian, M.Koubiti, I.Sakurai, Y.Tawara, W.Baonian, W.Zhenwei, N.Yamaguchi
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Journal Title
Plasma Sci.Technol Vol.11
Pages: 402-408
Related Report
Peer Reviewed
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