| Project/Area Number |
20740326
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| Research Category |
Grant-in-Aid for Young Scientists (B)
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| Allocation Type | Single-year Grants |
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| Research Field |
Plasma science
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| Research Institution | Japan Atomic Energy Agency |
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Principal Investigator |
OCHI Yoshihiro Japan Atomic Energy Agency, 量子ビーム応用研究部門, 研究副主幹 (20370372)
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| Project Period (FY) |
2008 – 2009
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| Project Status |
Completed (Fiscal Year 2009)
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| Budget Amount *help |
¥2,600,000 (Direct Cost: ¥2,000,000、Indirect Cost: ¥600,000)
Fiscal Year 2009: ¥650,000 (Direct Cost: ¥500,000、Indirect Cost: ¥150,000)
Fiscal Year 2008: ¥1,950,000 (Direct Cost: ¥1,500,000、Indirect Cost: ¥450,000)
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| Keywords | プラズマ応用 / 軟X線レーザー / ダブルロイズ型干渉計 / ポンプ&プローブ / アブレーション / 干渉計 / 固体表面過渡現象 / 光誘起相転移 |
|---|
| Research Abstract |
We developed a soft-x-ray laser interferometer dedicated to solid surface morphology. The probe soft-x-ray laser was 13.9 nm wavelength and 7 ps duration pulse. The interferometer achieved lateral resolution of 1.5 μm and depth sensitivity better than 1 nm. A single shot image could be obtained, therefore the time resolution of the system was 7 ps. We applied the soft-x-ray laser interferometer for observation of the initial dynamics of the fs laser ablation and found that the nanometer scale expansion due to a pre-ablation occurred in the 10 picoseconds range after the laser onset.
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