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Fabrication and electrical characterization of GOI structures by rapid melt growth

Research Project

Project/Area Number 21360149
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Electronic materials/Electric materials
Research InstitutionOsaka University

Principal Investigator

SHIMURA Takayoshi  大阪大学, 大学院・工学研究科, 准教授 (90252600)

Co-Investigator(Renkei-kenkyūsha) WATANABE Heiji  大阪大学, 大学院・工学研究科, 教授 (90379115)
HOSOI Takuji  大阪大学, 大学院・工学研究科, 助教 (90452466)
Project Period (FY) 2009 – 2011
Project Status Completed (Fiscal Year 2011)
Budget Amount *help
¥17,940,000 (Direct Cost: ¥13,800,000、Indirect Cost: ¥4,140,000)
Fiscal Year 2011: ¥4,290,000 (Direct Cost: ¥3,300,000、Indirect Cost: ¥990,000)
Fiscal Year 2010: ¥5,980,000 (Direct Cost: ¥4,600,000、Indirect Cost: ¥1,380,000)
Fiscal Year 2009: ¥7,670,000 (Direct Cost: ¥5,900,000、Indirect Cost: ¥1,770,000)
Keywords作成・評価技術 / Ge on insulator / 液相エピタキシャル成長 / 急速昇温加熱 / ゲルマニウム / シリコンゲルマニウム / 選択成長 / バックゲートトランジスタ / 電子デバイス / 半導体 / 結晶成長
Research Abstract

Germanium on insulator structures have been expected as starting materials for future electric devices. Therefore, new fabrication process of GOI structure is required to obtain high-quality single-crystalline Ge layers. In this study we have proposed novel method and examined the advantages of the process. The transistors based on the GOI structures fabricated by this process showed excellent electrical properties, indicting the benefit of this method and the availability for future electric devices.

Report

(4 results)
  • 2011 Annual Research Report   Final Research Report ( PDF )
  • 2010 Annual Research Report
  • 2009 Annual Research Report
  • Research Products

    (30 results)

All 2012 2011 2010 2009

All Journal Article (5 results) (of which Peer Reviewed: 3 results) Presentation (24 results) Patent(Industrial Property Rights) (1 results)

  • [Journal Article] Fabrication of Fully Relaxed SiGe Layers with High Ge Concentration on Silicon-on-Insulator Wafers by Rapid Melt Growth2010

    • Author(s)
      T. Shimura, S. Ogiwara, C. Yoshimoto, T. Hosoi, and H. Watanabe
    • Journal Title

      Appl. Phys. Express

      Volume: 3 Pages: 066502-066502

    • DOI

      10.1143/apex.2.066502

    • NAID

      10027441491

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Fabrication of Fully Relaxed SiGe Layers with High Ge Concentration on Silicon-on-Insulator Wafers by Rapid Melt Growth2010

    • Author(s)
      Takayoshi Shimura
    • Journal Title

      Appl.Phys.Express

      Volume: 3

    • NAID

      10027441491

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Fabrication of High-Quality GOI and SGOI Structures by Rapid Melt Growth Method2010

    • Author(s)
      Heiji Watanabe, Takayoshi Shimura
    • Journal Title

      The Proceedings of International workshop on Active-matrix flatpanel displays and devices

      Pages: 53-56

    • Related Report
      2010 Annual Research Report
  • [Journal Article] Fabrication of Local Ge-on-Insulator Structures by Lateral Liquid-Phase Epitaxy : Effect of Controlling Interface Energy between Ge and Insulators on Lateral Epitaxial Growth2009

    • Author(s)
      T. Hashimoto, C. Yoshimoto, T. Hosoi, T. Shimura, and H. Watanabe
    • Journal Title

      Appl. Phys. Express

      Volume: 2 Issue: 10 Pages: 105501-105501

    • DOI

      10.1143/apex.3.105501

    • NAID

      10025086916

    • Related Report
      2011 Final Research Report
  • [Journal Article] Fabrication of Local Ge-on-Insulator Structures by Lateral Liquid-Phase Epitaxy : Effect of Controlling Interface Energy between Ge and Insulators on Lateral Epitaxial Growth2009

    • Author(s)
      Tatsuya Hashimoto
    • Journal Title

      Applied Physics Express 2

    • Related Report
      2009 Annual Research Report
    • Peer Reviewed
  • [Presentation] 急速加熱処理によるGe1-xSnx層の低温エピタキシャル成長2012

    • Author(s)
      荻原伸平, 片岡伸文, 鈴木雄一朗, 細井卓治, 志村考功, 渡部平司
    • Organizer
      第59回応用物理学関係連合講演会
    • Place of Presentation
      東京
    • Year and Date
      2012-03-16
    • Related Report
      2011 Final Research Report
  • [Presentation] 急速加熱処理によるGe_<1-x>Sn_x層の低温エピタキシャル成長2012

    • Author(s)
      荻原伸平, 片岡伸文, 鈴木雄一朗, 細井卓治, 志村考功, 渡部平司
    • Organizer
      第59回応用物理学関係連合講演会
    • Place of Presentation
      東京都新宿区
    • Year and Date
      2012-03-16
    • Related Report
      2011 Annual Research Report
  • [Presentation] 横方向液相エピタキシャル成長により作成した単結晶GOI構造の電気特性評価2012

    • Author(s)
      鈴木雄一朗, 原伸平, 井卓治, 志村考功, 渡部平司
    • Organizer
      第17回ゲートスタック研究会
    • Place of Presentation
      三島市、静岡
    • Year and Date
      2012-01-20
    • Related Report
      2011 Final Research Report
  • [Presentation] 横方向液相エピタキシャル成長により作製した単結晶GOI構造の電気特性評価2012

    • Author(s)
      鈴木雄一朗, 荻原伸平, 細井卓治, 志村考功, 渡部平司
    • Organizer
      ゲートスタック研究会-材料・プロセス・評価の物理-」(第17回研究会)
    • Place of Presentation
      静岡県三島市
    • Year and Date
      2012-01-20
    • Related Report
      2011 Annual Research Report
  • [Presentation] High-mobility Ge-on-insulator p-channel MOSFETs fabricated by lateral liquid-phase epitaxy2011

    • Author(s)
      Y. Suzuki, S. Ogiwara, T. Hosoi, T. Shimura, and H. Watanabe
    • Organizer
      42nd IEEE Semiconductor Interface Specialists Conf.
    • Place of Presentation
      Arlington, VA, USA
    • Year and Date
      2011-12-01
    • Related Report
      2011 Final Research Report
  • [Presentation] High-mobility Ge-on-insulator p-channel MOSFETs fabricated by lateral liquid-phase epitaxy2011

    • Author(s)
      Y.Suzuki, S.Ogiwara, T.Hosoi, T.Shimura, H.Watanabe
    • Organizer
      42nd IEEE Semiconductor Interface Specialists Conference
    • Place of Presentation
      Arlington, USA
    • Year and Date
      2011-12-01
    • Related Report
      2011 Annual Research Report
  • [Presentation] Fabrication of High-quality GOI and SGOI Structures by Rapid Melt Growth Method2011

    • Author(s)
      H.Watanabe, C.Yoshimoto, T.Hashimoto, S.Ogiwara, Y.Suzuki, T.Hosoi, T.Shimura
    • Organizer
      Fourth International Symposium on Atomically Controlled Fabrication Technology
    • Place of Presentation
      Osaka, Japan
    • Year and Date
      2011-11-26
    • Related Report
      2011 Annual Research Report
  • [Presentation] High-Quality Single-Crystalline Ge-on-Insulator P-Channel MOSFETs Formed by Lateral Liquid-Phase Epitaxy2011

    • Author(s)
      T.Suzuki, S.Ogiwara, T.Hosoi, T.Shimura, H.Watanabe
    • Organizer
      Fourth International Symposium on Atomically Controlled Fabrication Technology
    • Place of Presentation
      Osaka, Japan
    • Year and Date
      2011-11-25
    • Related Report
      2011 Annual Research Report
  • [Presentation] 横方向液相エピタキシャル成長により作製した局所GOI構造の電気特性評価2011

    • Author(s)
      鈴木雄一朗, 荻原伸平, 細井卓治, 志村考功, 渡部平司
    • Organizer
      第72回応用物理学関係連合講演会
    • Place of Presentation
      山形市
    • Year and Date
      2011-08-31
    • Related Report
      2011 Final Research Report
  • [Presentation] 横方向液相エピタキシャル成長により作製した局所GOI構造の電気特性評価2011

    • Author(s)
      鈴木雄一朗, 荻原伸平, 細井卓治, 志村考功, 渡部平司
    • Organizer
      第72回応用物理学関係連合講演会
    • Place of Presentation
      山形県山形市
    • Year and Date
      2011-08-31
    • Related Report
      2011 Annual Research Report
  • [Presentation] Fabrication of High-Quality GOI and SGOI Structures by Rapid Melt Growth Method2011

    • Author(s)
      H. Watanabe, C. Yoshimoto, T. Hashimoto, S. Ogiwara, T. Hosoi, and T. Shimura
    • Organizer
      The 19th Int. Workshop on Active-Matrix Flatpanel Displays and Device
    • Place of Presentation
      Tokyo, Japan
    • Year and Date
      2011-07-06
    • Related Report
      2011 Final Research Report
  • [Presentation] High-quality Single-crystal SiGe Layers on Insulator Formed by Rapid Melt Growth2011

    • Author(s)
      S. Ogiwara, Y. Suzuki, C. Yoshimoto, T. Hosoi, T. Shimura, and H. Watanabe
    • Organizer
      International Meeting for Future of Electron Devices, Kansai Osaka. Japan
    • Place of Presentation
      Osaka, Japan
    • Year and Date
      2011-05-19
    • Related Report
      2011 Final Research Report
  • [Presentation] High-quality Single-crystal SiGe Layers on Insulator Formed by Rapid Melt Growth2011

    • Author(s)
      S.Ogiwara, Y.Suzuki, C.Yoshimoto, T.Hosoi, T.Shimura, H.Watanabe
    • Organizer
      2011 International Meeting for Future of Electron Devices, Kansai
    • Place of Presentation
      Osaka, Japan
    • Year and Date
      2011-05-19
    • Related Report
      2011 Annual Research Report
  • [Presentation] 急速加熱液相エピタキシャル成長法による高Ge濃度SGOI構造の作製2011

    • Author(s)
      荻原伸平, 鈴木雄一朗, 吉本千秋, 細井卓治, 志村考功, 渡部平司
    • Organizer
      第16回ゲートスタック研究会
    • Place of Presentation
      東京
    • Year and Date
      2011-01-22
    • Related Report
      2011 Final Research Report
  • [Presentation] 急速加熱液相エピタキシャル成長法による高Ge濃度SGOI構造の作製2011

    • Author(s)
      荻原伸平、志村考功
    • Organizer
      応用物理学会薄膜・表面物理分科会シリコンテクノロジー分科会共催特別研究会アブストラクト集「ゲートスタック研究会-材料・プロセス・評価の物理-」(第16回研究会)
    • Place of Presentation
      東京都目黒区大岡山、東京工業大学
    • Year and Date
      2011-01-22
    • Related Report
      2010 Annual Research Report
  • [Presentation] Fabricatrion of High-quality SiGe-on-insulator Structures by Rapid Melt Growth2010

    • Author(s)
      Shinpei Ogiwara, Takayoshi Shimura
    • Organizer
      Third International Symposium on Atomiscally Controlled Fabrication Technology
    • Place of Presentation
      大阪市大阪大学中ノ島センター
    • Year and Date
      2010-11-24
    • Related Report
      2010 Annual Research Report
  • [Presentation] 急速加熱液相エピタキシャル成長法による高Ge濃度SGOI構造の作製2010

    • Author(s)
      荻原伸平, 吉本千秋, 細井卓治, 志村考功, 渡部平司
    • Place of Presentation
      長崎市、長崎
    • Year and Date
      2010-09-14
    • Related Report
      2011 Final Research Report
  • [Presentation] 急速加熱液相エピタキシャル成長法により作製したSGOI構造のGe濃度のアニール温度依存性2010

    • Author(s)
      荻原伸平, 吉本千秋, 細井卓治, 志村考功, 渡部平司
    • Place of Presentation
      長崎市、長崎
    • Year and Date
      2010-09-14
    • Related Report
      2011 Final Research Report
  • [Presentation] 急速加熱液相エピタキシャル成長法による高Ge濃度SGOI構造の作製2010

    • Author(s)
      荻原伸平、志村考功
    • Organizer
      第71回応用物理学関係連合講演会
    • Place of Presentation
      長崎県長崎市長崎大学
    • Year and Date
      2010-09-14
    • Related Report
      2010 Annual Research Report
  • [Presentation] 急速加熱液相エピタキシャル成長法により作製したSGOI構造のGe濃度のアニール温度依存性2010

    • Author(s)
      荻原伸平、志村考功
    • Organizer
      第71回応用物理学関係連合講演会
    • Place of Presentation
      長崎県長崎市長崎大学
    • Year and Date
      2010-09-14
    • Related Report
      2010 Annual Research Report
  • [Presentation] Fabrication of High-Quality GOI and SGOI Structures by Rapid Melt Growth Method2010

    • Author(s)
      Heiji Watanabe, Takayoshi Shimura
    • Organizer
      The 7th International workshop on Active-matrix Flatpanel Displays and Devices
    • Place of Presentation
      東京都目黒区大岡山、東京工業大学(招待講演)
    • Year and Date
      2010-07-06
    • Related Report
      2010 Annual Research Report
  • [Presentation] Fabrication of Single-Crystal Local Germanium-on-Insulator Structures by Lateral Liquid-Phase Epitaxy2009

    • Author(s)
      T. Hashimoto, C. Yoshimoto, T. Hosoi, T. Shimura, and H. Watanabe
    • Organizer
      MRS fall meeting
    • Place of Presentation
      Boston, USA
    • Year and Date
      2009-11-30
    • Related Report
      2011 Final Research Report
  • [Presentation] Fabrication of Single-Crystal Local Germanium-on-Insulator Structures by Lateral Liquid-Phase Epitaxy2009

    • Author(s)
      Tatsuya Hashimoto
    • Organizer
      2009 MRS Fall Meeting
    • Place of Presentation
      Sheraton Boston Hotel, Boston USA
    • Year and Date
      2009-11-30
    • Related Report
      2009 Annual Research Report
  • [Presentation] Fabrication of Ge Nano-Wires on Insulators Using Lateral Liquid-Phase Epitaxy2009

    • Author(s)
      Chiaki Yoshimoto
    • Organizer
      5th Handai Nanoscience and Nanotechnology International Symposium
    • Place of Presentation
      Osaka University, Osaka
    • Year and Date
      2009-09-09
    • Related Report
      2009 Annual Research Report
  • [Patent(Industrial Property Rights)] 単結晶状GeSn含有材料の製造方法および単結晶状GeSn含有材料基板2012

    • Inventor(s)
      志村考功、渡部平司、細井卓治
    • Industrial Property Rights Holder
      大阪大学
    • Industrial Property Number
      2012-042746
    • Filing Date
      2012-02-29
    • Related Report
      2011 Final Research Report

URL: 

Published: 2009-04-01   Modified: 2016-04-21  

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