Development of a fast and accurate VLSI diagnostic method with a VLSI fault localization system
| Project/Area Number |
21560353
|
|---|
| Research Category |
Grant-in-Aid for Scientific Research (C)
|
| Allocation Type | Single-year Grants |
|---|
| Section | 一般 |
|---|
| Research Field |
Electron device/Electronic equipment
|
|---|
| Research Institution | Osaka University |
|---|
Principal Investigator |
MIURA Katsuyoshi 大阪大学, 大学院・情報科学研究科, 准教授 (30263221)
|
|---|
| Co-Investigator(Kenkyū-buntansha) |
MIDOH Yoshihiro 大阪大学, 情報科学研究科, 助教 (00448094)
|
|---|
| Project Period (FY) |
2009 – 2011
|
| Project Status |
Completed (Fiscal Year 2011)
|
| Budget Amount *help |
¥4,290,000 (Direct Cost: ¥3,300,000、Indirect Cost: ¥990,000)
Fiscal Year 2011: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2010: ¥780,000 (Direct Cost: ¥600,000、Indirect Cost: ¥180,000)
Fiscal Year 2009: ¥2,210,000 (Direct Cost: ¥1,700,000、Indirect Cost: ¥510,000)
|
|---|
| Keywords | 大規模集積回路 / 故障診断 / 故障解析 / シミュレーション / 走査レーザSQUID顕微鏡法 / L-SQ法 / レーザテラヘルツ波顕微鏡法 / LTEM法 / LSI / レーザSQUID顕微鏡 / L-SQ / レーザ誘起テラヘルツ波顕微鏡 / LTEM / 故障絞り込み / レーザ誘起テラヘルツ波顕鏡 / SPICE |
|---|
| Research Abstract |
We speeded up the scanning laser SQUID microscope(L-SQ) image simulator and the laser terahertz emission microscope(LTEM) image simulator and developed VLSI diagnostic methods utilizing these simulators. The L-SQ image simulator became more the 100 times faster and the LTEM image simulator became about 10 times faster. The developed diagnostic method based on the L-SQ image simulator successfully localized a fault at the first rank. The LTEM image simulator based diagnostic method localized a fault into 8% area from the whole circuit.
|
Report
(4 results)
Research Products
(14 results)
