| Project/Area Number |
21604016
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Quantum beam science
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| Research Institution | National Institute of Advanced Industrial Science and Technology |
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Principal Investigator |
HIRATA Kouichi 独立行政法人産業技術総合研究所, 計測標準研究部門, 主任研究員 (80357855)
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| Co-Investigator(Kenkyū-buntansha) |
SAITOH Yuichi 日本原子力研究開発機構, 高崎量子応用研究所, 研究主幹 (40360424)
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| Co-Investigator(Renkei-kenkyūsha) |
NARUMI Kazumasa 日本原子力研究開発機構, 高崎量子応用研究所, 研究主幹 (90354927)
CHIBA Atsuya 日本原子力研究開発機構, 高崎量子応用研究所, 研究副主幹 (40370431)
YAMADA Keisuke 日本原子力研究開発機構, 高崎量子応用研究所, 研究員 (10414567)
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| Project Period (FY) |
2009 – 2012
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| Project Status |
Completed (Fiscal Year 2012)
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| Budget Amount *help |
¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Fiscal Year 2012: ¥780,000 (Direct Cost: ¥600,000、Indirect Cost: ¥180,000)
Fiscal Year 2011: ¥780,000 (Direct Cost: ¥600,000、Indirect Cost: ¥180,000)
Fiscal Year 2010: ¥910,000 (Direct Cost: ¥700,000、Indirect Cost: ¥210,000)
Fiscal Year 2009: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
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| Keywords | クラスターイオン / 二次イオン / 量子ビーム / ２次イオン / クラスターイオンビーム / 2次イオン |
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| Research Abstract |
In this project, we have investigated emission yields of secondary ions induced by swift cluster and monoatomic ion impacts on organic thin film targets. The secondary ion yields obtained by time-of-flight mass analysis and direct secondary io
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