Study on robust circuit design techniques based on physical parameters of semiconductor devices and its Applications
| Project/Area Number |
21680004
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| Research Category |
Grant-in-Aid for Young Scientists (A)
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| Allocation Type | Single-year Grants |
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| Research Field |
Computer system/Network
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| Research Institution | Kobe University |
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Principal Investigator |
HIROSE Tetsuya 神戸大学, 大学院・工学研究科, 准教授 (70396315)
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| Project Period (FY) |
2009 – 2011
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| Project Status |
Completed (Fiscal Year 2011)
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| Budget Amount *help |
¥23,400,000 (Direct Cost: ¥18,000,000、Indirect Cost: ¥5,400,000)
Fiscal Year 2011: ¥4,550,000 (Direct Cost: ¥3,500,000、Indirect Cost: ¥1,050,000)
Fiscal Year 2010: ¥7,800,000 (Direct Cost: ¥6,000,000、Indirect Cost: ¥1,800,000)
Fiscal Year 2009: ¥11,050,000 (Direct Cost: ¥8,500,000、Indirect Cost: ¥2,550,000)
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| Keywords | VLSI設計技術 / LSI / プロセスバラツキ / 温度バラツキ / PVTバラツキ / 高速化技術 / アナログ回路 / ディジタル回路 / しきい値電圧 / オンチップモニタ / 補正回路技術 |
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| Research Abstract |
In this study, we developed analog and digital circuit design techniques that are tolerant to process and temperature variations. By developing ultra-low power current reference circuit, we can monitor the condition of threshold voltage of MOSFET in each LSI chip. We also proposed compensation architecture of digital circuits by using on-chip variation monitoring circuit. Moreover, we developed robust operational amplifier and comparator circuit that are fundamental analog circuit building blocks. For analog and digital signal processing systems, clock reference circuit and analog-digital converter were investigated. We demonstrated that these circuits operate robustly against process and temperature variations.
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Report
(4 results)
Research Products
(101 results)
