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Integrated Circuit Design for Robust Operation under Low Supply Voltage

Research Project

Project/Area Number 22300016
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Computer system/Network
Research InstitutionKyoto University

Principal Investigator

ONODERA Hidetoshi  京都大学, 情報学研究科, 教授 (80160927)

Co-Investigator(Kenkyū-buntansha) TSUCHIYA Akira  京都大学, 大学院・情報学研究科, 助教 (20432411)
Co-Investigator(Renkei-kenkyūsha) KOBAYASHI Kazutoshi  京都工芸繊維大学, 大学院・工芸科学研究科, 教授 (70252476)
Project Period (FY) 2010 – 2012
Project Status Completed (Fiscal Year 2012)
Budget Amount *help
¥18,460,000 (Direct Cost: ¥14,200,000、Indirect Cost: ¥4,260,000)
Fiscal Year 2012: ¥4,420,000 (Direct Cost: ¥3,400,000、Indirect Cost: ¥1,020,000)
Fiscal Year 2011: ¥4,940,000 (Direct Cost: ¥3,800,000、Indirect Cost: ¥1,140,000)
Fiscal Year 2010: ¥9,100,000 (Direct Cost: ¥7,000,000、Indirect Cost: ¥2,100,000)
Keywords低消費電力化 / 低電圧動作 / 耐ばらつき設計 / ディペンダブル VLSI / LSI設計技術 / 低消費電力設計 / ばらつき考慮設計 / ディペンダブルLSI / システムオンチップ / 製造容易化設計
Research Abstract

We have investigated on a design method that achieves robust circuit operation under low supply voltage of around 0.7 V. In particular, we have worked onthree topics:
(1) built-in self monitor and compensation of die-to-die variation
(2) sequential logic gates tolerating for within-die variation
(3) evaluation of dynamic performance variation under low supply voltage.
We have successfully developed variation-tolerant D-FFs, all-digital monitors and body-bias generator circuits for performance compensation, and accurate evaluation of delay fluctuation due to Random Telegraph Noise.

Report

(4 results)
  • 2012 Annual Research Report   Final Research Report ( PDF )
  • 2011 Annual Research Report
  • 2010 Annual Research Report
  • Research Products

    (64 results)

All 2013 2012 2011 2010 Other

All Journal Article (7 results) (of which Peer Reviewed: 7 results) Presentation (57 results) (of which Invited: 2 results)

  • [Journal Article] Impact of Body-Biasing Technique on Random Telegraph Noise Induced Delay Fluctuation2013

    • Author(s)
      Takashi Matsumoto, Kazutoshi Kobayashi, Hidetoshi Onodera
    • Journal Title

      Japanese Journal of Applied Physics (JJAP)

      Volume: vol 52, no 4 Issue: 4S Pages: 1-3

    • DOI

      10.7567/jjap.52.04ce05

    • NAID

      210000142035

    • Related Report
      2012 Annual Research Report 2012 Final Research Report
    • Peer Reviewed
  • [Journal Article] 再構成可能ディペンダブルVLSIプラットホーム2013

    • Author(s)
      密山幸男
    • Journal Title

      電子情報通信学会誌

      Volume: 96 Pages: 95-99

    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Variation-sensitive Monitor Circuits for Estimation of Global Process Parameter Variation2012

    • Author(s)
      Islam A.K.M. Mahfuzul, Akira Tsuchiya, Kazutoshi Kobayashi, Hidetoshi Onodera
    • Journal Title

      IEEE Trans. Semiconductor Manufacturing

      Volume: vol 25, no 4 Issue: 4 Pages: 571-580

    • DOI

      10.1109/tsm.2012.2198677

    • Related Report
      2012 Annual Research Report 2012 Final Research Report
    • Peer Reviewed
  • [Journal Article] Area-Efficient Reconfigurable-Array-Based Oscillator for Standard Cell Characterization2012

    • Author(s)
      Bishnu Prasad Das
    • Journal Title

      IET Circuits, Devices & Systems

      Volume: 6 Issue: 6 Pages: 429-436

    • DOI

      10.1049/iet-cds.2012.0012

    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Multicore Large-Scale Integration Lifetime Extension by Negative Bias Temperature Instability Recovery-Based Self-Healing2012

    • Author(s)
      T. Matsumoto
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 51 Issue: 4S Pages: 04DE02-04DE02

    • DOI

      10.1143/jjap.51.04de02

    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Multicore Large-Scale Integration Lifetime Extention by Negative Bias Temperature Instability Recovery-Based Self-Healing2012

    • Author(s)
      Takashi Matsumoto, Hiroaki Makino, Kazutoshi Kobayashi, Hidetoshi Onodera
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: vol.51(印刷中)

    • Related Report
      2011 Annual Research Report
    • Peer Reviewed
  • [Journal Article] A 65 nm Complementary Metal-Oxide-Semiconductor 400 ns Measurement Delay Negative-Bias-Temperature-Instability Recovery Sensor with Minimum Assist Circuit2011

    • Author(s)
      Takashi Matsumoto, Hiroaki Makino, Kazutoshi Kobayashi, Hidetoshi Onodera
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: vol.50

    • NAID

      210000070301

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Presentation] A Body Bias Generator Compatible with Cell-based Design Flow for Within-die Variability Compensation2012

    • Author(s)
      Norihiro Kamae, Akira Tsuchiya, Hidetoshi Onodera
    • Organizer
      IEEE Asian Solid-State Circuits Conference
    • Place of Presentation
      神戸
    • Year and Date
      2012-11-14
    • Related Report
      2012 Final Research Report
  • [Presentation] A Built-in Self-adjustment Scheme with Adaptive Body Bias using P/N-sensitive Digital Monitor Circuits2012

    • Author(s)
      Islam A.K.M Mahfuzul, Norihiro Kamae, Tohru Ishihara, and Hidetoshi Onodera
    • Organizer
      IEEE Asian Solid-State Circuits Conference
    • Place of Presentation
      神戸
    • Year and Date
      2012-11-13
    • Related Report
      2012 Final Research Report
  • [Presentation] Inhomogenious Ring Oscillator for WID Variability and RTN Characterization2012

    • Author(s)
      Shuichi Fujimoto, Takashi Matsumoto Hidetoshi Onodera
    • Organizer
      International Conference on Microelectronic Test structures
    • Place of Presentation
      San Diego(アメリカ合衆国)
    • Year and Date
      2012-03-20
    • Related Report
      2011 Annual Research Report
  • [Presentation] Ring Oscillator with Calibration Circuit for Accurate On-Chip IR-drop Measurement2012

    • Author(s)
      Shinichi Nishizawa, Hidetoshi Onodera
    • Organizer
      International Conference on Microelectronic Test Structures
    • Place of Presentation
      San Diego(アメリカ合衆国)
    • Year and Date
      2012-03-20
    • Related Report
      2011 Annual Research Report
  • [Presentation] Japan Science and Technology Agency (JST) program on Dependable VLSI Platform project2012

    • Author(s)
      Hidetoshi Onodera
    • Organizer
      Design, Automation & Test in Europe
    • Place of Presentation
      Dresden(ドイツ)(Invited)
    • Year and Date
      2012-03-16
    • Related Report
      2011 Annual Research Report
  • [Presentation] NBTI回復現象を利用したマルチコアLSIの自己特性補償法2011

    • Author(s)
      松本高士, 牧野紘明, 小林和淑, 小野寺秀俊
    • Organizer
      電子情報通信学会技術報告(集積回路設計)
    • Place of Presentation
      宮崎
    • Year and Date
      2011-11-29
    • Related Report
      2011 Annual Research Report
  • [Presentation] Reconfigurable Array-Based Area-Efficient Test Structure for Standard Cell Characterization2011

    • Author(s)
      Bishnu Prasad Das, Hidetoshi Onodera
    • Organizer
      2011 International Workshop on RTL and Higl Level Testing
    • Place of Presentation
      Jaipur(インド)
    • Year and Date
      2011-11-26
    • Related Report
      2011 Annual Research Report
  • [Presentation] Dependable VLSI Program in Japan--Program Overview and the Current status of Dependable VLSI Platform Project--2011

    • Author(s)
      Hidetoshi Onodera
    • Organizer
      2011 Asian Test Symposium
    • Place of Presentation
      New Delhi(インド)(Invited)
    • Year and Date
      2011-11-22
    • Related Report
      2011 Annual Research Report
  • [Presentation] An Area Effective Forward/Reverse Body Bias Generator for Within-Die Variability Compensation2011

    • Author(s)
      Norihiro Kamae, Akira Tsuchiya, Hidetoshi Onodera
    • Organizer
      2011 IEEE Asian Solid-State Circuits Conference
    • Place of Presentation
      Jeju(大韓民国)
    • Year and Date
      2011-11-16
    • Related Report
      2011 Annual Research Report
  • [Presentation] Impact of RTN and NBTI on Synchorous Circuit Reliability2011

    • Author(s)
      Takashi Matsumoto, Kazutoshi Kobayashi, Hidetoshi Onodera
    • Organizer
      IEEE/ACM Workshop on Variability Modeling and Characterization
    • Place of Presentation
      San Jose(アメリカ合衆国)
    • Year and Date
      2011-11-10
    • Related Report
      2011 Annual Research Report
  • [Presentation] Multi-core LSI Lifetime Extension by NBTI-Recovery-bases Self-healing2011

    • Author(s)
      Takashi Matsumoto, Hiroaki Makino, Kazutoshi Kobayashi, Hidetoshi Onodera
    • Organizer
      International Conference on Solid state Devices and Materials
    • Place of Presentation
      名古屋
    • Year and Date
      2011-09-29
    • Related Report
      2011 Annual Research Report
  • [Presentation] ディジタル回路遅延の経年劣化とそのモデル化について2011

    • Author(s)
      松本高士, 小林和淑, 小野寺秀俊
    • Organizer
      電子情報通信学会基礎・境界ソサイエティ大会
    • Place of Presentation
      札幌
    • Year and Date
      2011-09-13
    • Related Report
      2011 Annual Research Report
  • [Presentation] パッケージとの接続抵抗を考慮したチップ内電源ネットワークの構成手法2011

    • Author(s)
      西澤真一, 小林和淑, 小野寺秀俊
    • Organizer
      DAシンポジウム
    • Place of Presentation
      下呂市
    • Year and Date
      2011-08-31
    • Related Report
      2011 Annual Research Report
  • [Presentation] ランダム・テレグラフ・ノイズに起因したディジタル回路遅延ゆらぎについて2011

    • Author(s)
      松本高士, 伊東恭佑, 小林和淑, 小野寺秀俊
    • Organizer
      DAシンポジウム
    • Place of Presentation
      下呂市
    • Year and Date
      2011-08-31
    • Related Report
      2011 Annual Research Report
  • [Presentation] トランジスタレベルでの経年劣化補償技術におけるNBTI回復特性の利用について2011

    • Author(s)
      松本高士、牧野裕明、小林和淑、小野寺秀俊
    • Organizer
      LSIとシステムのワークショップ2011
    • Place of Presentation
      小倉
    • Year and Date
      2011-05-18
    • Related Report
      2011 Annual Research Report
  • [Presentation] ロバストファブリックを用いたディペンダブルVLSIプラットフォーム2011

    • Author(s)
      小野寺秀俊
    • Organizer
      LSIとシステムのワークショップ2011
    • Place of Presentation
      小倉(招待講演)
    • Year and Date
      2011-05-17
    • Related Report
      2011 Annual Research Report
  • [Presentation] トランジスタレベルでの経年劣化補償技術におけるNBTI回復特性の利用について2011

    • Author(s)
      松本高士, 牧野紘明, 小林和淑, 小野寺秀俊
    • Organizer
      システムLSIワークショップ
    • Place of Presentation
      北九州市
    • Year and Date
      2011-05-17
    • Related Report
      2011 Annual Research Report
  • [Presentation] The Impact of RTN on Performance Flucuation in CMOS Logic Circuits2011

    • Author(s)
      Kyosuke Ito, Takahi Matsumoto, Shinichi Nishizawa, Hiroki Sunagawa, Kazutoshi Kobayashi, Hidetoshi Onodera
    • Organizer
      2011 IEEE International Reliability Physics Symposium
    • Place of Presentation
      Monterey(アメリカ合衆国)
    • Year and Date
      2011-04-13
    • Related Report
      2011 Annual Research Report
  • [Presentation] Variation-sensitive Monitor Circuits for Estimation of Die-to-Die Process Variation2011

    • Author(s)
      Islam A.K.M Mahfuzul, Akira Tsuchiya, Kazutoshi Kobayashi, Hidetoshi Onodera
    • Organizer
      2011 IEEE International Conference on Microelectronic Test structure
    • Place of Presentation
      Amsterdam(オランダ)
    • Year and Date
      2011-04-06
    • Related Report
      2011 Annual Research Report
  • [Presentation] Modeling of Random Telegraph Noise under Circuit Operation-Simulation and Measurement of RTN-induced delay fluctuation-2011

    • Author(s)
      Kyosuke Ito, Takashi Matsumoto, Shinichi Nishizawa, Hiroki Sunagawa, Kazutoshi Kobayashi, Hidetoshi Onodera
    • Organizer
      2011 International Symposium on Quality Electronic Design (ISQED)
    • Place of Presentation
      Santa Clara(アメリカ合衆国)
    • Year and Date
      2011-03-15
    • Related Report
      2010 Annual Research Report
  • [Presentation] Moore Mooreに立ちはだかるCMOSばらつきの理解に向けて2011

    • Author(s)
      小野寺秀俊
    • Organizer
      電子情報通信学会VLSI設計技術研究会
    • Place of Presentation
      那覇(招待講演)
    • Year and Date
      2011-03-02
    • Related Report
      2010 Annual Research Report
  • [Presentation] Modeling of Random Telegraph Noise under Circuit Operation-Simulation and Measurement of RTN-induced Delay Fluctuation2010

    • Author(s)
      Kyosuke Ito, Takashi Matsumoto, Shinichi Nishizawa, Hiroki Sunagawa, Kazutoshi Kobayashi, Hidetoshi Onodera
    • Organizer
      Workshop on variability modeling and characterization (VMC)
    • Place of Presentation
      San Jose, CA(アメリカ合衆国)
    • Year and Date
      2010-11-11
    • Related Report
      2010 Annual Research Report
  • [Presentation] Warning Prediction Sequential for Transient Error Prevention2010

    • Author(s)
      Bishnu Prasad Das, Hidetoshi Onodera
    • Organizer
      2010 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
    • Place of Presentation
      京都
    • Year and Date
      2010-10-08
    • Related Report
      2010 Annual Research Report
  • [Presentation] Variation-Tolerant Design of D FlipFlops2010

    • Author(s)
      Hiroki Sunagawa, Hidetoshi Onodera
    • Organizer
      IEEE International SOC Conference 2010
    • Place of Presentation
      Las Vegas(アメリカ合衆国)
    • Year and Date
      2010-09-28
    • Related Report
      2010 Annual Research Report
  • [Presentation] A 65nm CMOS 400ns Measurement Delay NBTI-Recovery Sensor by Minimum Assist Circuit2010

    • Author(s)
      Takashi Matsumoto, Hiroaki Makino, Kazutoshi Kobayashi, Hidetoshi Onodera
    • Organizer
      International Conference on Solid State Devices and Materials (SSDM 2010)
    • Place of Presentation
      東京
    • Year and Date
      2010-09-23
    • Related Report
      2010 Annual Research Report
  • [Presentation] 基板電圧の制御回路とその面積オーバヘッド2010

    • Author(s)
      釜江典裕、土谷亮、小野寺秀俊
    • Organizer
      2010年電子情報通信学会ソサイエティ大会
    • Place of Presentation
      堺
    • Year and Date
      2010-09-16
    • Related Report
      2010 Annual Research Report
  • [Presentation] チップ内ばらつきの成分解析手法2010

    • Author(s)
      藤本秀一、Islam A.K.M.Mahfuzul、西澤真一、小野寺秀俊
    • Organizer
      DAシンポジウム2010
    • Place of Presentation
      豊橋
    • Year and Date
      2010-09-03
    • Related Report
      2010 Annual Research Report
  • [Presentation] レイアウト制約が性能と製造性に与える影響2010

    • Author(s)
      北島和彦、砂川洋輝、土谷亮、小野寺秀俊
    • Organizer
      DAシンポジウム2010
    • Place of Presentation
      豊橋
    • Year and Date
      2010-09-03
    • Related Report
      2010 Annual Research Report
  • [Presentation] バッファチェインにおけるパルス幅縮小現象を利用したSETパルス幅測定回路2010

    • Author(s)
      古田潤、小林和淑、小野寺秀俊
    • Organizer
      DAシンポジウム2010
    • Place of Presentation
      豊橋
    • Year and Date
      2010-09-03
    • Related Report
      2010 Annual Research Report
  • [Presentation] 組み合わせ回路におけるランダム・テレグラフ・ノイズの影響の評価2010

    • Author(s)
      伊東恭佑、松本高士、小林和淑、小野寺秀俊
    • Organizer
      DAシンポジウム2010
    • Place of Presentation
      豊橋
    • Year and Date
      2010-09-03
    • Related Report
      2010 Annual Research Report
  • [Presentation] Variability Characterization Using an RO-array Test Structure2010

    • Author(s)
      Shinichi Nishizawa, Kazutoshi Kobayashi, Hidetoshi Onodera
    • Organizer
      4th IEEE International Workshop on Design for Manufacturability & Yield
    • Place of Presentation
      Anaheim(アメリカ合衆国)
    • Year and Date
      2010-06-14
    • Related Report
      2010 Annual Research Report
  • [Presentation] D-FlipFlop Design for Enhanced Tolerance to Within-Die Variation2010

    • Author(s)
      Hidetoshi Onodera, Hiroki Sunagawa
    • Organizer
      4th IEEE International Workshop on Design for Manufacturability & Yield
    • Place of Presentation
      Anaheim(アメリカ合衆国)
    • Year and Date
      2010-06-14
    • Related Report
      2010 Annual Research Report
  • [Presentation] Extraction of Variability Sources from Within-die Random Delay Variation2010

    • Author(s)
      Shuichi Fujimoto, Islam A.K.M Mahfuzul, Shinichi Nishizawa, Hidetoshi Onodera
    • Organizer
      4th IEEE International Workshop on Design for Manufacturability & Yield
    • Place of Presentation
      Anaheim(アメリカ合衆国)
    • Year and Date
      2010-06-14
    • Related Report
      2010 Annual Research Report
  • [Presentation] An Impact of Within-Die Variation on Supply Voltage Dependence of Path Delay

    • Author(s)
      Shinichi Nishizawa
    • Organizer
      TAU workshop
    • Place of Presentation
      Stateline /NV
    • Related Report
      2012 Annual Research Report
  • [Presentation] Impact of Random Telegraph Noise on CMOS Logic Delay Uncertainty

    • Author(s)
      Takashi Matsumoto
    • Organizer
      ACM The TAU Workshop (TAU) 2013
    • Place of Presentation
      Stateline, Nevada, USA
    • Related Report
      2012 Annual Research Report
  • [Presentation] ランダム・テレグラフ・ノイズがCMOS組合せ回路の遅延ゆらぎに及ぼす影響

    • Author(s)
      松本高士
    • Organizer
      電子情報通信学会 総合大会
    • Place of Presentation
      岐阜市
    • Related Report
      2012 Annual Research Report
  • [Presentation] Analysis and Comparison of XOR Cell Structures for Low Voltage Circuit Design

    • Author(s)
      Shinichi Nishizawa
    • Organizer
      International Symposium on Quality Electronic Design (ISQED)
    • Place of Presentation
      San Jose/CA
    • Related Report
      2012 Annual Research Report
  • [Presentation] ランダム・テレグラフ・ノイズが低電圧CMOS論理回路の遅延ゆら ぎに及ぼす影響

    • Author(s)
      松本高士
    • Organizer
      応用物理学会分科会 シリコンテクノロジー
    • Place of Presentation
      東京
    • Related Report
      2012 Annual Research Report
    • Invited
  • [Presentation] Dependable VLSI Platform using Robust Fabrics

    • Author(s)
      Hidetoshi Onodera
    • Organizer
      18th Asia and South Pacific Design Automation Conference (ASP-DAC) 2013
    • Place of Presentation
      Yokohama
    • Related Report
      2012 Annual Research Report
    • Invited
  • [Presentation] Impact of Random Telegraph Noise on CMOS Logic Delay Uncrtainty under Low Voltage Operation

    • Author(s)
      T. Matsumoto
    • Organizer
      IEEE International Electron Devices Meeting (IEDM) 2012
    • Place of Presentation
      San Francisco, America
    • Related Report
      2012 Annual Research Report
  • [Presentation] ランダム・テレグラフ・ノイズに起因した組合せ回路遅延ゆらぎに対する基板バイアスの影響

    • Author(s)
      松本高士
    • Organizer
      デザインガイア2012
    • Place of Presentation
      九州大学
    • Related Report
      2012 Annual Research Report
  • [Presentation] lOn-chip Detection of Process Shift and Process Spread for Silicon Debugging and Mode-Hardware Correlation

    • Author(s)
      Islam A.K.M. Mahfuzu
    • Organizer
      IEEE 21st Asian Test Symposium (ATS) 2012
    • Place of Presentation
      Niigata, Japan
    • Related Report
      2012 Annual Research Report
  • [Presentation] A Body Bias Generator Compatible with Cell-basedDesign Flow for Within-die Variability Compensation

    • Author(s)
      Norihiro Kamae
    • Organizer
      IEEE Asian Solid-State Circuits Conference(A-SSCC) 2012
    • Place of Presentation
      Kobe
    • Related Report
      2012 Annual Research Report
  • [Presentation] A Built-in Self-adjustment Scheme with Adaptive Body Bias using P/N-sensitive Digital Monitor Circuits

    • Author(s)
      Islam A.K.M Mahfuzul
    • Organizer
      IEEE Asian Solid-State Circuits Conference(A-SSCC) 2012
    • Place of Presentation
      Kobe
    • Related Report
      2012 Annual Research Report
  • [Presentation] Impact Body-Biasing Technique on RTN-induced CMOS Logic Delay Uncertainty

    • Author(s)
      T. Matsumoto
    • Organizer
      IEEE/ACM Workshop on Variability Modeling and Characterization (VMC) 2012
    • Place of Presentation
      San Jose, America
    • Related Report
      2012 Annual Research Report
  • [Presentation] An Impact of Within-Die Variation on Supply Voltage Dependence of Path Delay

    • Author(s)
      Shinichi Nishizawa
    • Organizer
      International Workshop on Variability Modeling and Charactorization (VMC)
    • Place of Presentation
      San Jose/CA
    • Related Report
      2012 Annual Research Report
  • [Presentation] A Flexible Structure of Standard Cell and Its Optimization Method for Near-Threshold Voltage Operation

    • Author(s)
      Shinichi Nishizawa
    • Organizer
      IEEE International Conference on Computer Design(ICCD)
    • Place of Presentation
      Montreal
    • Related Report
      2012 Annual Research Report
  • [Presentation] Impact of Body-Biasing Technique on RTN-induced Delay Fluctuation

    • Author(s)
      Matsumoto Takashi
    • Organizer
      International Conference on Solid State Devices and Materials (SSDM2012)
    • Place of Presentation
      Kyoto
    • Related Report
      2012 Annual Research Report
  • [Presentation] Impact on delay due to random telegraph noise under low voltage operation in logic circuits

    • Author(s)
      Nishimura Shohei
    • Organizer
      International Conference on Solid State Devices and Materials (SSDM2012)
    • Place of Presentation
      Kyoto
    • Related Report
      2012 Annual Research Report
  • [Presentation] 劣化測定と回復測定を高速に切り替え可能なNBTI測定回路の特性評価

    • Author(s)
      三木淳司
    • Organizer
      電子情報通信学会ソサイエティ大会
    • Place of Presentation
      富山
    • Related Report
      2012 Annual Research Report
  • [Presentation] A Standard Cell Optimization Method for Near-Threshold Voltage Operations

    • Author(s)
      Masahiro Kondo
    • Organizer
      International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS) 2012
    • Place of Presentation
      Newcastle
    • Related Report
      2012 Annual Research Report
  • [Presentation] NBTI・RTNが論理回路およびSRAMの信頼性に与える影響について

    • Author(s)
      松本高士
    • Organizer
      情報処理学会DAシンポジウム2012
    • Place of Presentation
      下呂
    • Related Report
      2012 Annual Research Report
  • [Presentation] 低電圧動作に適したセルライブラリのゲート幅決定法とその評価

    • Author(s)
      近藤正大
    • Organizer
      情報処理学会DAシンポジウム2012
    • Place of Presentation
      下呂
    • Related Report
      2012 Annual Research Report
  • [Presentation] 低電圧動作に向けたPN比可変スタンダードセルライブラリの構成法とその評価

    • Author(s)
      西澤真一
    • Organizer
      情報処理学会DAシンポジウム2012
    • Place of Presentation
      下呂
    • Related Report
      2012 Annual Research Report
  • [Presentation] 完全ディジタル型のP/Nばらつきの自律補償回路

    • Author(s)
      Islam A.K.M Mahfuzul
    • Organizer
      情報処理学会DAシンポジウム2012
    • Place of Presentation
      下呂
    • Related Report
      2012 Annual Research Report
  • [Presentation] チップ内基板バイアス生成回路のモジュール化設計

    • Author(s)
      釡江典裕
    • Organizer
      情報処理学会DAシンポジウム2012
    • Place of Presentation
      下呂
    • Related Report
      2012 Annual Research Report
  • [Presentation] LSI信頼性へのRTN・NBTIの影響と特性補償技術について

    • Author(s)
      松本高士
    • Organizer
      LSIとシステムのワークショップ
    • Place of Presentation
      北九州市
    • Related Report
      2012 Annual Research Report

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Published: 2010-08-23   Modified: 2019-07-29  

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