Integrated Circuit Design for Robust Operation under Low Supply Voltage
Project/Area Number |
22300016
|
Research Category |
Grant-in-Aid for Scientific Research (B)
|
Allocation Type | Single-year Grants |
Section | 一般 |
Research Field |
Computer system/Network
|
Research Institution | Kyoto University |
Principal Investigator |
|
Co-Investigator(Kenkyū-buntansha) |
TSUCHIYA Akira 京都大学, 大学院・情報学研究科, 助教 (20432411)
|
Co-Investigator(Renkei-kenkyūsha) |
KOBAYASHI Kazutoshi 京都工芸繊維大学, 大学院・工芸科学研究科, 教授 (70252476)
|
Project Period (FY) |
2010 – 2012
|
Project Status |
Completed (Fiscal Year 2012)
|
Budget Amount *help |
¥18,460,000 (Direct Cost: ¥14,200,000、Indirect Cost: ¥4,260,000)
Fiscal Year 2012: ¥4,420,000 (Direct Cost: ¥3,400,000、Indirect Cost: ¥1,020,000)
Fiscal Year 2011: ¥4,940,000 (Direct Cost: ¥3,800,000、Indirect Cost: ¥1,140,000)
Fiscal Year 2010: ¥9,100,000 (Direct Cost: ¥7,000,000、Indirect Cost: ¥2,100,000)
|
Keywords | 低消費電力化 / 低電圧動作 / 耐ばらつき設計 / ディペンダブル VLSI / LSI設計技術 / 低消費電力設計 / ばらつき考慮設計 / ディペンダブルLSI / システムオンチップ / 製造容易化設計 |
Research Abstract |
We have investigated on a design method that achieves robust circuit operation under low supply voltage of around 0.7 V. In particular, we have worked onthree topics: (1) built-in self monitor and compensation of die-to-die variation (2) sequential logic gates tolerating for within-die variation (3) evaluation of dynamic performance variation under low supply voltage. We have successfully developed variation-tolerant D-FFs, all-digital monitors and body-bias generator circuits for performance compensation, and accurate evaluation of delay fluctuation due to Random Telegraph Noise.
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Report
(4 results)
Research Products
(64 results)