| Budget Amount *help |
¥3,770,000 (Direct Cost: ¥3,200,000、Indirect Cost: ¥570,000)
Fiscal Year 2012: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2011: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2010: ¥1,300,000 (Direct Cost: ¥1,300,000)
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| Research Abstract |
The purpose of this study is to observe and analyze nano contacts and junctions, which are fabricated by bringing two small pieces of materials in proximity or in touch at high temperatures using scanning probe microscopy (SPM) techniques; the techniques can control the separation between them on a nano scale. We successfully demonstrated the approaching, contacting and welding between the two pieces, observed by an ultra-high resolution field-emission scanning electron microscope combined with a home-made pencil-type SPM.
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