evelopment of multi-dimensional endoscope

• Project/Area Number: 23760235
• Research Category: Grant-in-Aid for Young Scientists (B)
• Allocation Type: Multi-year Fund
• Research Field: Intelligent mechanics/Mechanical systems
• Research Institution: Saitama Medical University
• Principal Investigator: WAKAYAMA Toshitaka 埼玉医科大学, 保健医療学部, 准教授 (90438862)
• Project Period (FY): 2011 – 2012
• Project Status: Completed (Fiscal Year 2012)
• Budget Amount: ¥4,550,000 (Direct Cost: ¥3,500,000、Indirect Cost: ¥1,050,000); Fiscal Year 2012: ¥1,820,000 (Direct Cost: ¥1,400,000、Indirect Cost: ¥420,000); Fiscal Year 2011: ¥2,730,000 (Direct Cost: ¥2,100,000、Indirect Cost: ¥630,000)
• Keywords: 内視鏡 / 三次元 / 分光 / 偏光 / 三次元形状計測 / 偏光計測 / 内面形状計測 / 三次元計測 / 分光バイオプシ

Research Abstract

I have developed a novel endoscope obtained its properties and conditions with inner profile. This study was achieved optical biopsy imaging from spectrum information and three dimensional profile measurement. To overcome uni-axial measurement, it is possible to measure inner profile surface from confocal technique, precisely. I have developed novel optical elements after I discovered unique polarized phenomena by process for fabricating conical mirror and lens as element technologies.

Research Products

• [Journal Article] Achromatic Axially Symmetric Wave Plates (2012)
  • Author(s): T.Wakayama, K. Komaki, Y. Otani, T.Yoshizawa
  • Journal Title: Opt. Express Volume: 20 Pages: 29260-29265
  • Peer Reviewed
• [Journal Article] Small size probe for inner profile measurement of pipes using optical fiber ring beam device (2012)
  • Author(s): T.Wakayama, K.Machi, T.Yoshizawa
  • Journal Title: Proc. SPIE Volume: 85630L
  • Peer Reviewed
• [Journal Article] An interferometric observation of topological effect by novel axially symmetrical wave plate (2012)
  • Author(s): T.Wakayama, Y.Otani, T.Yoshizawa
  • Journal Title: Proc.SPIE Volume: 849306
  • Peer Reviewed
• [Journal Article] Small size probe for inner profile measurement of pipes using optical fiber ring beam device (2012)
  • Author(s): Toshitaka Wakayama
  • Journal Title: Proc. SPIE Volume: 8563 Pages: 85630L-85630L
  • DOI: 10.1117/12.999878
  • Peer Reviewed
• [Journal Article] Achromatic axially symmetric wave plate (2012)
  • Author(s): Toshitaka Wakayama
  • Journal Title: Optics Express Volume: 20 Issue: 28 Pages: 29260-29265
  • DOI: 10.1364/oe.20.029260
  • Peer Reviewed
• [Journal Article] Development of a probe for inner profile measurement and flaw detectiona (2011)
  • Author(s): T.Yoshizawa, T.Wakayama, Y.Kamakura
  • Journal Title: Proc.SPIE Volume: 81330D
  • Peer Reviewed
• [Journal Article] Compact Camera for Real-Time 3D Measurement (2011)
  • Author(s): Toshitaka Wakayama
  • Journal Title: Proc. LMPMI (10th IMEKO Symposium) Volume: VDI-Berichte2156 Pages: 199-204
  • Peer Reviewed
• [Journal Article] Inner Profile Measurement and Flaw Inspection of Pipes and Tubes (2011)
  • Author(s): Toshitaka Wakayama
  • Journal Title: Proc. LMPMI (10th IMEKO Symposium) Volume: VDI-Berichte2156 Pages: 229-235
  • Peer Reviewed
• [Journal Article] Spectroscopic birefringence mapping by channeled spectrum (2011)
  • Author(s): Toshitaka Wakayama
  • Journal Title: Applied Mechanics and Materials Volume: 70 Pages: 452-457
  • Peer Reviewed
• [Presentation] 同軸内面形状計測 (2013)
  • Author(s): 若山俊隆,吉澤徹
  • Organizer: 精密工学会春季大会
  • Place of Presentation: 東京工業大学,東京
  • Year and Date: 2013-03-13
• [Presentation] 同軸内面形状計測 (2013)
  • Author(s): 若山俊隆
  • Organizer: 2013年精密工学会春季大会
  • Place of Presentation: 東京工業大学 （東京都）
• [Presentation] 光ファイバを導入した内面形状計測用細径プローブ (2013)
  • Author(s): 若山俊隆
  • Organizer: 光計測シンポジウム2013
  • Place of Presentation: 機械振興会館 （東京都）
• [Presentation] 三次元形状計測用のコンパクト＆プローブカメラの開発とその応用 (2013)
  • Author(s): 若山俊隆
  • Organizer: 光センシング技術部会
  • Place of Presentation: 機械振興会館 （東京都）
  • Invited
• [Presentation] 光ファイバを導入した内面形状計測用細径プローブ (2012)
  • Author(s): 若山俊隆,間地築,吉澤徹
  • Organizer: 光計測シンポジウム
  • Place of Presentation: 機械振興会館,東京
  • Year and Date: 2012-11-16
• [Presentation] Small size probe for inner profile measurement of pipes using optical fiber ring beam device (2012)
  • Author(s): T.Wakayama, K.Machi, T.Yoshizawa
  • Organizer: in Optical Metrology and Inspection for Industrial Applications II of SPIE international conference
  • Place of Presentation: SanDiego, USA
  • Year and Date: 2012-11-05
• [Presentation] An interferometric observation of topological effect by novel axially symmetrical wave plate (2012)
  • Author(s): T.Wakayama, Y.Otani, T.Yoshizawa
  • Organizer: in Interferometry XVI of SPIE international conference
  • Place of Presentation: SanDiego, USA
  • Year and Date: 2012-08-12
• [Presentation] アクロマティック軸対称波長板の開発 (2012)
  • Author(s): 若山俊隆,大谷幸利,吉澤徹
  • Organizer: 応用物理学会春季大会
  • Place of Presentation: 早稲田大学,東京
  • Year and Date: 2012-03-17
• [Presentation] 内面計測用小型三次元プローブの開発(第5報)- 光ファイバ・リングビームプローブの導入 (2012)
  • Author(s): 若山俊隆,吉澤徹
  • Organizer: 精密工学会春季大会
  • Place of Presentation: 首都大学東京,東京
  • Year and Date: 2012-03-14
• [Presentation] 分光三次元内視鏡に関する研究 (2012)
  • Author(s): 齊藤菜都美,若山俊隆,吉澤徹
  • Organizer: 精密工学会春季大会
  • Place of Presentation: 首都大学東京,東京
  • Year and Date: 2012-03-14
• [Presentation] Small size probe for inner profile measurement of pipes using optical fiber ring beam device (2012)
  • Author(s): Toshitaka Wakayama
  • Organizer: SPIE, Photonics Asia, Optical Metrology and Inspection for Industrial Applications II
  • Place of Presentation: Beijing International Convention Center (Beijing, China)
  • Invited
• [Presentation] 分光三次元内視鏡に関する研究－白色リングビーム光源とラジアル分光器の開発－ (2012)
  • Author(s): 若山 俊隆
  • Organizer: 精密工学会 2012年度春季大会
  • Place of Presentation: 首都大学東京（東京）
• [Presentation] 内面計測用小型三次元プローブの開発（第5 報） (2012)
  • Author(s): 若山 俊隆
  • Organizer: 精密工学会 2012年度春季大会
  • Place of Presentation: 首都大学東京（東京）
• [Presentation] アクロマティック軸対称波長板の開発 (2012)
  • Author(s): 若山 俊隆
  • Organizer: 第59回応用物理学関係連合講演会
  • Place of Presentation: 早稲田大学（東京）
• [Presentation] Development of a probe for inner profile measurement and flaw detection (2011)
  • Author(s): T.Yoshizawa, T.Wakayama, Y.Kamakura
  • Organizer: in Dimensional Optical Metrology and Inspection for Practical Applications of SPIE international conference
  • Place of Presentation: SanDiego, USA
  • Year and Date: 2011-08-29
• [Patent(Industrial Property Rights)] 軸対称偏光変換素子 (2013)
  • Inventor(s): 若山俊隆,大谷幸利,吉澤徹
  • Industrial Property Rights Holder: 埼玉医科大学,宇都宮大学
  • Filing Date: 2013-02-08
  • Overseas
• [Patent(Industrial Property Rights)] 形状計測装置 (2013)
  • Inventor(s): 若山俊隆
  • Industrial Property Rights Holder: 埼玉医科大学
  • Industrial Property Number: 2013-026271
  • Filing Date: 2013-02-14
• [Patent(Industrial Property Rights)] 軸対称偏光変換素子 (2012)
  • Inventor(s): 若山俊隆,大谷幸利,吉澤徹
  • Industrial Property Rights Holder: 埼玉医科大学,宇都宮大学
  • Industrial Property Number: 2012-025150
  • Filing Date: 2012-02-08
• [Patent(Industrial Property Rights)] 軸対称偏光変換素子及び軸対称偏光ビーム発生方法 (2012)
  • Inventor(s): 若山俊隆，大谷幸利，吉澤徹
  • Industrial Property Rights Holder: 埼玉医科大学，宇都宮大学
  • Industrial Property Number: 2012-025150
  • Filing Date: 2012