Local atomic structure analysis of ferromagnetic semiconductor using photoelectron holography
Project/Area Number |
24560016
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Research Category |
Grant-in-Aid for Scientific Research (C)
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Allocation Type | Multi-year Fund |
Section | 一般 |
Research Field |
Applied materials science/Crystal engineering
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Research Institution | Hiroshima City University |
Principal Investigator |
HAPPO Naohisa 広島市立大学, 情報科学研究科, 准教授 (30285431)
|
Project Period (FY) |
2012-04-01 – 2015-03-31
|
Project Status |
Completed (Fiscal Year 2014)
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Budget Amount *help |
¥5,330,000 (Direct Cost: ¥4,100,000、Indirect Cost: ¥1,230,000)
Fiscal Year 2014: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2013: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2012: ¥2,990,000 (Direct Cost: ¥2,300,000、Indirect Cost: ¥690,000)
|
Keywords | 希薄磁性半導体 / スピントロニクス材料 / 原子分解能ホログラフィー / 放射光利用測定技術 / スピントロニクス / 局所構造解析 |
Outline of Final Research Achievements |
In order to investigate a crystal structure around a Te atom in a ferromagnetic semiconductor Ge1-xMnxTe, we measured the Te 4d photoelectron intensity angular distribution (PIAD) pattern using a display-type spherical mirror analyzer (DIANA) at BL25SU of SPring-8. As a result, the change from a rhombohedral structure (x = 0) to a NaCl-type structure (x = 0.4) could be observed. And fluctuations of Te positions were observed in the reconstructed atomic image obtained from the Te 4d photoelectron hologram. The result supports our previous X-ray fluorescence holography results.
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Report
(4 results)
Research Products
(15 results)
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[Presentation] Local atomic structure analysis of ferromagnetic semiconductor Ge0.6Mn0.4Te by atomic resolution holography2013
Author(s)
N. Happo, Y. Takehara, M. Fujiwara, K. Tanaka, F. Matsui, H. Daimon, T. Matsushita, K. Okada, S. Senba, S. Hosokawa, K. Hayashi, H. Asada
Organizer
ICM2012 (The 19th International Conference on Magnetism)
Place of Presentation
韓国、釜山
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