• Search Research Projects
  • Search Researchers
  • How to Use
  1. Back to previous page

Dynamic Supply Current Test Method with Built-in IDDT Appearance Time Sensor

Research Project

Project/Area Number 24650021
Research Category

Grant-in-Aid for Challenging Exploratory Research

Allocation TypeSingle-year Grants
Research Field Computer system/Network
Research InstitutionThe University of Tokushima

Principal Investigator

HASHIZUME Masaki  徳島大学, ソシオテクノサイエンス研究部, 教授 (40164777)

Project Period (FY) 2012-04-01 – 2014-03-31
Project Status Completed (Fiscal Year 2013)
Budget Amount *help
¥2,860,000 (Direct Cost: ¥2,200,000、Indirect Cost: ¥660,000)
Fiscal Year 2013: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2012: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
Keywords断線 / 電流テスト / IC / IDDTテスト / 電流センサ回路 / 遅延故障 / CMOS / 動的電源電流 / 動的電源電圧変動 / 短絡 / CMOS IC
Research Abstract

A built-in test circuit is proposed to detect an open defect in a CMOS IC by means of appearance time of dynamic supply current of the IC. Also, a test method based on the dynamic supply current with on the test circuit is proposed. A layout of an IC embedding the test circuit has been designed and an IC has been prototyped. It is shown by Spice simulation and some experiments that an open defect in the IC can be detected by the test method.

Report

(3 results)
  • 2013 Annual Research Report   Final Research Report ( PDF )
  • 2012 Research-status Report
  • Research Products

    (8 results)

All 2014 2013 2012 Other

All Journal Article (4 results) (of which Peer Reviewed: 4 results) Presentation (4 results)

  • [Journal Article] A Built-in Test Circuit for Detecting Open Defects by IDDT Appearance Time in CMOS ICs2014

    • Author(s)
      Masaki Hashizume, Shohei Suenaga and Hiroyuki Yotsuyanagi
    • Journal Title

      Proc. of International Conference on Design & Concurrent Engineering 2014

      Volume: (to appear)

    • Related Report
      2013 Annual Research Report 2013 Final Research Report
    • Peer Reviewed
  • [Journal Article] Built-in IDDT Appearance Time Sensor for Detecting Open Faults in 3D IC2013

    • Author(s)
      Shohei Suenaga, Masaki Hashizume, Hiroyuki Yotsuyanagi, Tetsuo Tada and Shyue-Kung Lu
    • Journal Title

      Proc. of IEEE CPMT Symposium Japan(ICSJ2013)

      Pages: 247-250

    • Related Report
      2013 Annual Research Report 2013 Final Research Report
    • Peer Reviewed
  • [Journal Article] A Built-in Sensor for IDDT Testing of CMOS ICs2012

    • Author(s)
      Shohei Suenaga, Hiroyuki Yotsuyanagi and Masaki Hashizume
    • Journal Title

      Proc. of 2012 International Technical Conference on Circuits/Systems, Computers and Communications

    • Related Report
      2013 Final Research Report
    • Peer Reviewed
  • [Journal Article] A Built-in Sensor for IDDT Testing of CMOS ICs2012

    • Author(s)
      Shohei Suenaga, et al.
    • Journal Title

      Proc. of 2012 International Technical Conference on Circuits/Systems, Computers and Communications

      Volume: E

    • Related Report
      2012 Research-status Report
    • Peer Reviewed
  • [Presentation] 組込み型IDDT出現時間検出回路の実験による評価用設計2013

    • Author(s)
      末永翔平, 四柳浩之, 橋爪正樹
    • Organizer
      電気関係学会四国支部連合大会講演論文集
    • Place of Presentation
      徳島大学, 徳島県
    • Year and Date
      2013-09-21
    • Related Report
      2013 Final Research Report
  • [Presentation] 組込み型IDDT出現時間検出回路の実験による評価用設計2013

    • Author(s)
      末永 翔平, 四柳 浩之, 橋爪 正樹
    • Organizer
      電気関係学会四国支部連合大会
    • Place of Presentation
      徳島大学(徳島大学)
    • Related Report
      2013 Annual Research Report
  • [Presentation] 組込み型IDDT出現時間検出回路による断線故障の検出のための必要条件2012

    • Author(s)
      末永翔平, 四柳浩之, 橋爪正樹
    • Organizer
      電気関係学会四国支部連合大会講演論文集
    • Place of Presentation
      四国電力株式会社総合研修所, 香川県
    • Year and Date
      2012-09-29
    • Related Report
      2013 Final Research Report
  • [Presentation] 組込み型IDDT出現時間検出回路による断線故障の検出のための必要条件

    • Author(s)
      末永 翔平他
    • Organizer
      電気関係学会四国支部連合大会
    • Place of Presentation
      四国電力総合研修所(香川県)
    • Related Report
      2012 Research-status Report

URL: 

Published: 2013-05-31   Modified: 2019-07-29  

Information User Guide FAQ News Terms of Use Attribution of KAKENHI

Powered by NII kakenhi