| Project/Area Number |
24860054
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| Research Category |
Grant-in-Aid for Research Activity Start-up
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| Allocation Type | Single-year Grants |
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| Research Field |
Electron device/Electronic equipment
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| Research Institution | The University of Kitakyushu |
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Principal Investigator |
DONG QING 北九州市立大学, 国際環境工学部, 講師 (30638804)
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| Project Period (FY) |
2012-08-31 – 2014-03-31
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| Project Status |
Completed (Fiscal Year 2013)
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| Budget Amount *help |
¥2,990,000 (Direct Cost: ¥2,300,000、Indirect Cost: ¥690,000)
Fiscal Year 2013: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2012: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
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| Keywords | アナログLSI / 自己診断システム |
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| Research Abstract |
This research introduces a built-in self test(BIST) system , which is a method of Design for Testability for analog LSI test. We explored the analog signal processing and introduced a systematic test method for analog ICs. The developed BIST generates a set of preset analog signals, and input them into each analog device in chip in turn. When a device is activated for inputs, its output signal is also sampled. The sampled signal is then quantized by an ADC, and its amplitude/frequency/phase/delay characteristics are calculated by a digital signal processing unit. These characteristics then are compared with the expected outputs by the control logic unit. The control logic unit finally judges if a circuit failure is determined. The measurement results from the test chip confirmed the testability of the introduced BIST system.
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