Research Project
Grant-in-Aid for Challenging Exploratory Research
The scan design method makes it possible to increase testability. Scan-based Attacks with scan design decrease security for confidential information on LSIs. Conventional methods provide assurance of security with complicated scan designs. If information about complicated scan designs, attackers could obtain confidential information on LSIs by using scan-based attacks. Complicated scan designs is a novel confidential information.We proposed a design method with both testability and security without depending on complicated scan designs. The proposed method is a design method which ensures testability on behavior level testability without scan design. Several designs were applied to the proposed methods. We measured quantitatively the security for the designs applied to the proposed method. The measure for security evaluation is mutual information.
All 2015 2014 2013
All Journal Article (2 results) (of which Peer Reviewed: 2 results) Presentation (7 results)
IEICE Transactions on Information and Systems
Volume: E96.D Issue: 9 Pages: 1994-2002
10.1587/transinf.E96.D.1994
130003370988
IPSJ Transactions on System LSI Design Methodology
Volume: 6 Issue: 0 Pages: 127-134
10.2197/ipsjtsldm.6.127
130003369396
