Study of surface physical properties using newly-built REM-AFM holder with strain force applying system
| Project/Area Number |
25600017
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Multi-year Fund |
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| Research Field |
Nanostructural physics
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| Research Institution | Osaka University |
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Principal Investigator |
NATIOH Yoshitaka 大阪大学, 工学(系)研究科(研究院), 助教 (90362665)
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| Project Period (FY) |
2013-04-01 – 2015-03-31
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| Project Status |
Completed (Fiscal Year 2014)
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| Budget Amount *help |
¥3,900,000 (Direct Cost: ¥3,000,000、Indirect Cost: ¥900,000)
Fiscal Year 2014: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2013: ¥2,730,000 (Direct Cost: ¥2,100,000、Indirect Cost: ¥630,000)
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| Keywords | 表面界面物性 / 走査プローブ顕微鏡 / 電子顕微鏡 |
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| Outline of Final Research Achievements |
In order to investigate the correlated changes of the atomic bonding state and electronic state of a surface when applying the macroscopic strain field on it, I specially designed and produced the atomic force microscopy holder working in an electron microscope, which equipped with the strain force applying system. I successfully imaged the gap between an AFM tip and a Si(111) surface by reflection electron microscopy. In addition, I developed useful techniques for probing the individual atomic bonding state of the surface spatially and acquiring surface electron charge state with high sensitivity.
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Report
(3 results)
Research Products
(13 results)
