Study of surface physical properties using newly-built REM-AFM holder with strain force applying system

• Project/Area Number: 25600017
• Research Category: Grant-in-Aid for Challenging Exploratory Research
• Allocation Type: Multi-year Fund
• Research Field: Nanostructural physics
• Research Institution: Osaka University
• Principal Investigator: NATIOH Yoshitaka 大阪大学, 工学(系)研究科(研究院), 助教 (90362665)
• Project Period (FY): 2013-04-01 – 2015-03-31
• Project Status: Completed (Fiscal Year 2014)
• Budget Amount: ¥3,900,000 (Direct Cost: ¥3,000,000、Indirect Cost: ¥900,000); Fiscal Year 2014: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000); Fiscal Year 2013: ¥2,730,000 (Direct Cost: ¥2,100,000、Indirect Cost: ¥630,000)
• Keywords: 表面界面物性 / 走査プローブ顕微鏡 / 電子顕微鏡

Outline of Final Research Achievements

In order to investigate the correlated changes of the atomic bonding state and electronic state of a surface when applying the macroscopic strain field on it, I specially designed and produced the atomic force microscopy holder working in an electron microscope, which equipped with the strain force applying system. I successfully imaged the gap between an AFM tip and a Si(111) surface by reflection electron microscopy. In addition, I developed useful techniques for probing the individual atomic bonding state of the surface spatially and acquiring surface electron charge state with high sensitivity.

Research Products

• [Journal Article] Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback (2015)
  • Author(s): L. Kou, Z. M. Ma, Y. J. Li, Y. Naitoh, M. Komiyama, and Y. Sugawara
  • Journal Title: Nanotechnology Volume: 26 Issue: 19 Pages: 195701-195701
  • DOI: 10.1088/0957-4484/26/19/195701
  • Peer Reviewed / Open Access / Acknowledgement Compliant
• [Journal Article] The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modes (2013)
  • Author(s): Z. Ma, L. Kou, Y. Naitoh, Y. J. Li and Y. Sugawara
  • Journal Title: Nanotechnol Volume: 24 Issue: 22 Pages: 225701-225701
  • DOI: 10.1088/0957-4484/24/22/225701
  • Peer Reviewed
• [Presentation] 多周波数原子間力顕微鏡法による探針試料間相互作用のベクトル場解析 (2015)
  • Author(s): 内藤 賀公，李 艶君，菅原 康弘
  • Organizer: 物理学会第70回年次大会
  • Place of Presentation: 早稲田大学（東京都新宿区）
  • Year and Date: 2015-03-21 – 2015-03-24
• [Presentation] Investigation of charge density of state and contact potential difference of Au clusters on TiO2 surface by STM/KPFM without feedback (2015)
  • Author(s): H. F. Wen，M. Suesada， R. Kanbayashi,Y. J. Li， Y. Sugawara
  • Organizer: 2015年春季第62回応用物理学関係連合講演会
  • Place of Presentation: 東海大学（神奈川県平塚市）
  • Year and Date: 2015-03-11 – 2015-03-14
• [Presentation] Investigation of local contact potential difference of Au nanoclusters on TiO2(110) surface by KPFM/STM (2014)
  • Author(s): H. F. Wen，M. Suesada， R. Kanbayashi,Y. J. Li， Y. Sugawara
  • Organizer: ICSPM-22
  • Place of Presentation: 熱川ハイツ（静岡県東伊豆町）
  • Year and Date: 2014-12-11 – 2014-12-13
• [Presentation] ケルビンプローブ力顕微鏡によるルチル型TiO2(110)上の 局所接触電位差の解明 (2014)
  • Author(s): 神林 良佑，温 煥飛，末貞 昌英, 内藤 賀公，李 艶君，菅原 康弘
  • Organizer: 2014年秋季第７5回応用物理学会学術講演会
  • Place of Presentation: 北海道大学（北海道札幌市）
  • Year and Date: 2014-09-17 – 2014-09-20
• [Presentation] Spatial bonding state of Ge(001) dimer atoms studied by multi-frequency FM-AFM (2014)
  • Author(s): Y.Naitoh, Y.J.Li, Y.Sugawara
  • Organizer: NC-AFM 2014
  • Place of Presentation: つくば国際会議場（茨城県つくば市）
  • Year and Date: 2014-08-04 – 2014-08-08
• [Presentation] Two-dimentional Measurement of Charge Polarization Induced by Tip-samlple Chemical Interaction Using Heterodyne Potential Microscopy (2014)
  • Author(s): L.Kou, R.Kambayashi, Y.Naitoh, Y.J.Li, Y.Sugawara
  • Organizer: NC-AFM 2014
  • Place of Presentation: つくば国際会議場（茨城県つくば市）
  • Year and Date: 2014-08-04 – 2014-08-08
• [Presentation] 原子間力顕微鏡法を用いた固体表面の原子スケール弾性状態の測定 (2014)
  • Author(s): 内藤 賀公
  • Organizer: 応用物理学会関西支部第一回講演会
  • Place of Presentation: 京都大学（京都府京都市）
  • Year and Date: 2014-06-26
  • Invited
• [Presentation] 原子間力顕微鏡法によるGe(001)-c(4x2)表面上の原子スケール弾性状態の測定 (2014)
  • Author(s): 内藤 賀公，李 艶君，菅原 康弘
  • Organizer: 物理学会第６9回年次大会
  • Place of Presentation: 東海大学 厚木
• [Presentation] 原子間力顕微鏡法によるGe(001)-c(4x2)表面上の原子スケール弾性状態の測定 (2013)
  • Author(s): 内藤 賀公，上城 武司，李 艶君，菅原 康弘
  • Organizer: 日本顕微鏡学会第６９回学術講演会
  • Place of Presentation: 大阪府吹田
• [Presentation] Surface Potential Clarification by Non-Feedback Kelvin Probe Force Microscopy (2013)
  • Author(s): L. Kou, R. Kanbayashi, Z. Ma, Y. Naitoh, Y. J. Li Y. Sugawara
  • Organizer: NC-AFM 201３
  • Place of Presentation: Maryland, USA
• [Presentation] Atomic Resolution Imaging of the Local Contact Potential Difference by Kelvin Probe Force Microscopy without the dc Bias Voltage (2013)
  • Author(s): R. Kanbayashi, L. Kou, Y. Naitoh, Y.J. Li and Y. Sugawara
  • Organizer: ACSIN-12/ICSPM-21
  • Place of Presentation: 筑波