Experimental verification of minimum energy limit of computation and its application to reversible computing
Project/Area Number |
25630141
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Research Category |
Grant-in-Aid for Challenging Exploratory Research
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Allocation Type | Multi-year Fund |
Research Field |
Electron device/Electronic equipment
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Research Institution | Yokohama National University |
Principal Investigator |
YOSHIKAWA NOBUYUKI 横浜国立大学, 工学(系)研究科(研究院), 教授 (70202398)
|
Project Period (FY) |
2013-04-01 – 2015-03-31
|
Project Status |
Completed (Fiscal Year 2014)
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Budget Amount *help |
¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Fiscal Year 2014: ¥1,820,000 (Direct Cost: ¥1,400,000、Indirect Cost: ¥420,000)
Fiscal Year 2013: ¥2,210,000 (Direct Cost: ¥1,700,000、Indirect Cost: ¥510,000)
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Keywords | 超伝導材料・素子 / 先端機能デバイス / 低消費電力 / 超高速情報処理 / デバイス設計・製造プロセス / 超伝導回路 / ジョセフソン素子 / 集積回路 / デバイス設計/製造プロセス / ジョセフソン |
Outline of Final Research Achievements |
In this project, we aimed to verify the minimum energy consumption in computation, known as the Landauer limit, by using adiabatic quantum flux parametron (QFP) circuits. In order to investigate the Landauer limit, the energy consumption of the adiabatic QFP gate was measured by using a superconducting resonator coupled with an adiabatic QFP gate. In addition, we proposed a new reversible QFP logic gate, whose entropy is not changed during the computation. The results showed that the bit energy of the adiabatic QFP logic gate is estimated to be 10 zJ in experiment. It was also verified that logically and physically reversible logic gate can be realized by using adiabatic QFP circuits.
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Report
(3 results)
Research Products
(142 results)
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[Journal Article] Large-Scale Integrated Circuit Design Based on a Nb Nine-Layer Structure for Reconfigurable Data-Path Processors2014
Author(s)
A. Fujimaki, M. Tanaka, R. Kasagi, K. Takagi, M. Okada, Y. Hayakawa, K. Takata, H. Akaike, N. Yoshikawa, S. Nagasawa, K. Takagi, N. Takagi
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Journal Title
IEICE Transactions on Electronics
Volume: E97.C
Issue: 3
Pages: 157-165
DOI
NAID
ISSN
0916-8524, 1745-1353
Related Report
Peer Reviewed
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