Studies on Reliability Enhancement of Circuits Programmed on FPGAs
Project/Area Number |
26330067
|
Research Category |
Grant-in-Aid for Scientific Research (C)
|
Allocation Type | Multi-year Fund |
Section | 一般 |
Research Field |
Computer system
|
Research Institution | Oita University |
Principal Investigator |
|
Research Collaborator |
SATO Shuichi
MORIYASU Takanori
HONDA Taro
ONO Renji
KANO Sho
SAWAKI Kosuke
UEDA Hiroki
SHIMAZU Daichi
MINAMIZONO Hayato
WATANABE Kyonosuke
|
Project Period (FY) |
2014-04-01 – 2018-03-31
|
Project Status |
Completed (Fiscal Year 2017)
|
Budget Amount *help |
¥4,810,000 (Direct Cost: ¥3,700,000、Indirect Cost: ¥1,110,000)
Fiscal Year 2016: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2015: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2014: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
|
Keywords | FPGA / フィールドテスト / 特定用途依存テスト / 遅延故障 / 故障診断 / BIST / 対故障設計 / 劣化検知 / 耐故障設計 / FPGA / BIST / 劣化検 |
Outline of Final Research Achievements |
Recently, production cost of small quantity production of integrated circuits tends to increase. For reduction of production cost, instead of producing a small amount of application specific integrated circuits, field programmable gate arrays (FPGAs) are expected to be used even for critical application fields. We conducted studies on reliability enhancement of FPGAs and proposed several techniques to test integrated circuits programmed on the FPGAs in-field.
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Report
(5 results)
Research Products
(14 results)