Establishment and application of spatial difference Imaging method on interfaces

• Project/Area Number: 26600046
• Research Category: Grant-in-Aid for Challenging Exploratory Research
• Allocation Type: Multi-year Fund
• Research Field: Nanomaterials engineering
• Research Institution: Kyushu University
• Principal Investigator: Kaneko Kenji 九州大学, 工学(系)研究科(研究院), 教授 (30336002)
• Project Period (FY): 2014-04-01 – 2016-03-31
• Project Status: Completed (Fiscal Year 2015)
• Budget Amount: ¥3,770,000 (Direct Cost: ¥2,900,000、Indirect Cost: ¥870,000); Fiscal Year 2015: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000); Fiscal Year 2014: ¥2,730,000 (Direct Cost: ¥2,100,000、Indirect Cost: ¥630,000)
• Keywords: 界面 / 原子分解能 / 透過型電子顕微鏡 / 画像処理 / 粒界・界面 / ひずみ / 電子顕微鏡

Outline of Final Research Achievements

In the case of polycrystalline materials, interfaces and grain boundaries play very important roles on the properties of them. So far, there have not been any experiments to examine the interface two-dimensionally. Instead numbers of line-profile characterization methods has been applied to understand the composition of them. During this research period, interfaces were examined in two dimensions and proposed an experimental methods to characterize the interfaces in two dimension.

Research Products

• [Int'l Joint Research] ケンブリッジ大学(英国)
• [Journal Article] Hardness and microstructural variation of Al-Mg-Mn-Sc-Zr alloy (2016)
  • Author(s): Ikeshita, S., Strodahs, A., Saghi, Z., Yamada, K., Burdet, P., Hata, S., Ikeda, K.-I., Midgley, P.A., Kaneko, K
  • Journal Title: Micron Volume: 82 Pages: 1-8
  • DOI: 10.1016/j.micron.2015.12.002
  • Peer Reviewed / Int'l Joint Research
• [Presentation] FIB-SEMによる鉄鋼材料の3次元解析 (2015)
  • Author(s): 金子賢治
  • Organizer: 平成27年度日本顕微鏡学会マルチスケール電子線トモグラフィ研究部会
  • Place of Presentation: 工学院大学
  • Year and Date: 2015-12-05
  • Invited
• [Presentation] Three-dimensional characterization of various crystalline materials by electron microscopy (2015)
  • Author(s): Kenji KANEKO
  • Organizer: NIMS Conference 2015
  • Place of Presentation: 物質・材料研究機構
  • Year and Date: 2015-07-14
  • Int'l Joint Research / Invited
• [Presentation] Atomic scale characterization of REBa2Cu3O7-d; films with BaHfO3 artificial pinning centers by high resolution scanning transmission electron microscopy (2014)
  • Author(s): K. Yamada, K. Kaneko, T. Nishiyama, N. Mikami, Y. Sato, R. Teranishi, T. Kato, T. Hirayama, M. Yoshizumi, T. Izumi, Y. Shiohara
  • Organizer: 27th International Symposium on Superconductivity
  • Place of Presentation: 東京
  • Year and Date: 2014-11-27
• [Presentation] Three-dimensional nanostructural analysis of artificial pinning in coated conductors by electron tomography (2014)
  • Author(s): K. Kaneko
  • Organizer: The IUMRS International Conference in Asia 2014
  • Place of Presentation: 福岡市
  • Year and Date: 2014-08-26
  • Invited
• [Presentation] Three-dimensional analysis of BaHfO3 precipitates in GdBa2Cu3O7-y by electron tomography (2014)
  • Author(s): T. Nishiyama, K. Kaneko, K. Yamada, R. Teranishi, T. Kato, T. Hirayama, H. Tobita, T. Izumi, Y. Shiohara
  • Organizer: The IUMRS International Conference in Asia 2014
  • Place of Presentation: 福岡市
  • Year and Date: 2014-08-26
• [Remarks] Kaneko Research Group
  • URL: http://zaiko13.zaiko.kyushu-u.ac.jp/index-e.html