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Research and development of complimentary high electron mobility transistor for next-generation information and communication technology

Research Project

Project/Area Number 26870910
Research Category

Grant-in-Aid for Young Scientists (B)

Allocation TypeMulti-year Fund
Research Field Electronic materials/Electric materials
Electron device/Electronic equipment
Research InstitutionNational Institute of Information and Communications Technology

Principal Investigator

Hara Shinsuke  国立研究開発法人情報通信研究機構, 未来ICT研究所フロンティア創造総合研究室, 主任研究員 (30434038)

Project Period (FY) 2014-04-01 – 2017-03-31
Project Status Completed (Fiscal Year 2016)
Budget Amount *help
¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Fiscal Year 2016: ¥650,000 (Direct Cost: ¥500,000、Indirect Cost: ¥150,000)
Fiscal Year 2015: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
Fiscal Year 2014: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Keywords電子デバイス / ヘテロ構造 / 結晶成長 / エピタキシャル成長
Outline of Final Research Achievements

Research of complimentary high electron mobility transistor (c-HEMT) composed of III-V compound semiconductors with the lattice parameter of 6.1 angstrom has been performed for next-generation information and communication technology. The significant reduction of the stacking faults that made the device characteristics worsen was achieved. The device structure of c-HEMT was designed by technology CAD. The crystal structure with the quantum wells was grown successfully with no lattice relaxation and less stacking faults, and each electrical characteristics of electron and hole were measured by etching the top epitaxy layers selectively. The metal materials of the ohmic electrode was investigated using the TLM methods, and the static characteristic of the HEMTs were evaluated.

Report

(4 results)
  • 2016 Annual Research Report   Final Research Report ( PDF )
  • 2015 Research-status Report
  • 2014 Research-status Report
  • Research Products

    (1 results)

All 2015

All Presentation (1 results)

  • [Presentation] InGaSbヘテロエピタキシャル薄膜の膜質評価2015

    • Author(s)
      原紳介,渡邊一世,竹鶴達哉,辻大介,藤川紗千恵,藤代博記,赤羽浩一,笠松章史
    • Organizer
      第76回秋季応用物理学会学術講演会
    • Place of Presentation
      名古屋国際会議場(愛知県・名古屋市)
    • Year and Date
      2015-09-13
    • Related Report
      2015 Research-status Report

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Published: 2014-04-04   Modified: 2018-03-22  

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