• Search Research Projects
  • Search Researchers
  • How to Use
  1. Back to project page

1999 Fiscal Year Final Research Report Summary

Development of Particle-free CVD Reactor Using Ionization of source Gas

Research Project

Project/Area Number 09555240
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section展開研究
Research Field 反応・分離工学
Research InstitutionOsaka Prefecture University

Principal Investigator

ADACHI Motoaki  Osaka Prefecture University, Research Institute for Advanced Science and Technology, Assistant Professor, 先端科学研究所, 講師 (40100177)

Co-Investigator(Kenkyū-buntansha) FUJII Toshiaki  Ebara Research Co., Ltd., UV/Photoelectron Division Manager, UV/光電子利用技術開発室, 室長
OKUYAMA Kikuo  Hiroshima University, Dept.of Chemical Engineering, Professor, 工学部, 教授 (00101197)
Project Period (FY) 1997 – 1999
KeywordsLow pressure CVD / Thin film / Ion cluster / UV excitation / Photoelectron emission / Ionization / TEOS / Particle generation
Research Abstract

The low pressure chemical vapor deposition reactor using ionization of source gas was developed to control particle generation in gas phase. UV/photoelectron method, in which photoelectron was released from the emitter by UV irradiation, was used as the ion source to produce ions at low pressure. From many materials such as metal, metal oxide, semiconductor, and alloy, Au thin film deposited by the spattering was selected as the photoelectron emitter because of the stability of photoelectron emission at low pressure. The highest concentration of photoelectron was released from Au film in the range of UV wave length shorter than 200 um. The low pressure differential mobility analyzer/Faraday cup electrometer system was also developed to measure the particle generation in LPCVD reactor. The film formation and particle generation from TEOS and OィイD23ィエD2 in the developed CVD reactor was estimated experimentally. Film growth rate and particle generation increased 20-50% and decreased 20-80%, respectively, by the UV irradiation. The shape of film deposited on the trenched wafer showed a conformal growth in both cases of UV irradiation and non-irradiation, but did not a flow like shape which was formed by the ionization of TEOS in TEOS/OィイD23ィエD2-APCVD.

  • Research Products

    (17 results)

All Other

All Publications (17 results)

  • [Publications] M. Adachi, T. Fujimoto, Y. Itoh and K. Okuyam: "Numerical Simulation of Films Formed by Cluster/particle Dposition in Aimospheric Pressure Chemical Vapor Deposition Process Using Organic Slilcon Vapors and Ozone Gas"Jpn. J. Appl. Phys.. 39(印刷中). (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 足立元明、藤本敏行、中曽浩一、金泰吾、奥山喜久夫: "ソースガスのイオン化によるCVD成膜装置内における粒子発生の抑制"化学工業論文集. 25. 878-883 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] M, Adachi, T. Fujimoto, K. Nakaso, K. Okuyama, F. G. shi, H. Sato et al.: "Film Foramton by Motion Control of lonization Precursores in Electric Field"Appl. Phys. Letters. 75. 1973-1975 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Fujimoto, K. Okuyama, S. Yamada and M. Adachi: "Effect of Cluster/Particle Deposition on Atmospheric Pressure Chemical Vapor Deposition of SiO_2 from Four Gaseous Organic Si-containing Precursors and Ozone"J. Appl. Phys.. 85. 4196-4206 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] M. Shimada, K. Okuyama, Y. Inoue, M. Adachi and T. Fujii: "Removal of Airborne Particles by a Device Using UV/Photoelectron Method under Reduced Pressure Conditions"J. Aerosol Sci.. 30. 341-353 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 足立元明、須藤収、高橋武士: "減圧場におけるナノサイズ粒子の帯電量測定"エアロゾル研究. 13. 94-102 (1998)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 足立元明、奥山喜久夫: "新版 シリコンウェーハ表面の超クリーン化技術"服部毅編 リアライズ社. 520 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Adachi, M. and K. Okuyama: "Ultraclean Surface processing of Silicon Wafers"T. Hattori Ed. Springer. 616 (1998)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] M.Adachi, T.Fujimoto, Y.Itoh and K.Okuyama: "Numerical Simulation of Films Formed by Cluster/Particle Deposition in Atmospheric Pressure Chemical Vapor Deposition Process Using Organic Silicon Vapors and Ozone Gas."Jpn. J. Appl. Phys.. 39-6 (in press). (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Adachi, T.Fujimoto, K.Nakaso, T.Kim and K.Okuyama: "Control of Particle Generation in CVD Reactor by Ionization of Source Vapor."Kagaku Kogku Ronbunshu. 25-6(in Japanese). 878-883 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Adachi, T.Fujimoto, N.Nakaso, K.Okuyama, F.G.Shi, H.Sato el al.: "Film Formation by Motion Control of Ionization Precursors In Electric Field."Appl Phys. Letters. 75-13. 1973-1975 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T.Fujimoto, K.Okuyama, S.Yamada and M.Adachi: "Effects of Cluster/Particle Deposition on Atmospheric Pressure Chemical Vapor Deposition of SiOィイD22ィエD2 from Four Gaseous Organic Si-containing Precursors and Ozone."J. Appl. Phys.. 85-8. 4196-4206 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Shimada, K.Okuyama, Y.Inoue, M.Adachi and T.Fujii: "Removal of Airborne Particles by a Device Using UV/Photoelectron Method under Reduced Pressure Conditions."J. Aerosol Sci.. 30-3. 341-353 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Adachi, O.Sudo, T.Takahashi: "Charge Measurement of Nanometer-Sized Particles at Low Pressure."J of Aerosol Research, Jpn.. 13-2(in Japanese). 94-102 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Shimada, S.J.Cho, K.Okuyama, T.Tamura, M.Adachi and T.Fujii: "Removal of Airborne Particles by a Tubular Particle-Removal Device Using UV/Photoelectron Method."J.of Aerosol Sci.. 28-4. 649-661 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Adachi and K.Okuyama: "Ultraclean Technology of Silicon Wafers"T.Hattori Ed. REALIZE Inc. (in press) (in Japanese). (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Adachi and K.Okuyama: "Ultraclean Surface Processing of Silicon Wafers"T.Hattori Ed. Springer. (1998)

    • Description
      「研究成果報告書概要(欧文)」より

URL: 

Published: 2001-10-23  

Information User Guide FAQ News Terms of Use Attribution of KAKENHI

Powered by NII kakenhi