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2002 Fiscal Year Final Research Report Summary

DEVELOPMENT OF GRAZING-EXIT MICRO X-RAY FLUORESCENCE INSTRUMENT AND SINGLE PARTICLE ANALYSIS SUCH AS AEROSOLS

Research Project

Project/Area Number 12554030
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section展開研究
Research Field 分離・精製・検出法
Research InstitutionOSAKA CITY UNIVERSITY (2002)
Tohoku University (2000-2001)

Principal Investigator

TSUJI Kouichi  OSAKA CITY UNIVERSITY, GRADUATE SCHOOL OF ENGINEERING, ASSOCIATE PROFESSOR, 大学院・工学研究科, 助教授 (30241566)

Co-Investigator(Kenkyū-buntansha) WAGATSUMA Kazuaki  TOHOKU UNIVERSITY, INSTITUTE FOR MATERIALS RESEARCH, PROFESSOR, 金属材料研究所, 教授 (30158597)
KOMETANI Noritsugu  OSAKA CITY UNIVERSITY, GRADUATE SCHOOL OF ENGINEERING, LECTURER, 大学院・工学研究科, 講師 (80295683)
YONEZAWA Yoshirou  OSAKA CITY UNIVERSITY, GRADUATE SCHOOL OF ENGINEERING, PROFESSOR, 大学院・工学研究科, 教授 (10026346)
TAKAHASHI Hideyuki  JEOL, RESEARCHER, 電子光学機器技術本部・応用研究センター, 主任研究員(研究職)
ASAMI Kazuhiko  TOHOKU UNIVERSITY, INSTITUTE FOR MATERIALS RESEARCH, ASSOCIATE PROFESSOR, 金属材料研究所, 助教授 (20005929)
Project Period (FY) 2000 – 2002
KeywordsGRAZING EXIT X-RAY MEASUREMENT / ELECTRON PROBE MICRO ANALYSIS / MICRO ANALYSIS / SURFACE ANALYSIS / PARTICLE ANALYSIS / AEROSOLS
Research Abstract

We have studied EPMA under grazing-exit conditions, which is called GE-EPMA. We developed a GE-EPMA apparatus based on a commericial EPMA. We evaluated the analytical characterization of GE-EPMA. It was foue analysis and single-particle analysis are possible by GE-EPMA with extremely low background. By analyzing exit-angle dependence of EPMA intensity, we can evaluate thickness and density of him films. The advantage of GE-EPMA is the use of an electron beam with a small diameter at an incident angle of 90 degrees, which makes it possible to perform localized analysis. Element mapping is possible by scanning the electron beam or the sample stage. In addition, depth analysis is possible by varying the exit angle, which could finally result in 3-dimensional EPMA

  • Research Products

    (13 results)

All Other

All Publications (13 results)

  • [Publications] Z.Spolnik, K.Tsuji, etc.: "Quantitative analysis of metallic ultra-thin films by grazing-exit electron probe x-ray microanalysis"X-Ray Spectrometry. 31. 178-183 (2002)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Z.Spolnik, K.Tsuji, etc.: "Grazing-exit electron probe x-ray microanalysis of ultra-thin films and single particles"Anal. Chim. Acta. 455. 245-252 (2002)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Tsuji, K.Satio, etc.: "Localized Thin-Film Analysis by Grazing-Exit EPMA (GE-EPMA)"Spectrochim. Acta. B. 57. 897-906 (2002)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Tsuji, F.Delalieux: "Micro x-ray fluorescence using a pinhole aperture in quasi-contact mode"J. Anal. At. Spectrom.. 17. 1405-1407 (2002)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] J.Injuk, K.Tsuji, etc.: "Airborne particles in the Miyagi Museum of Art in Sendai, Japan, Studied by Electron Probe X-Ray Microanalysis"Anal. Sci.. 18. 561-566 (2002)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Tsuji, K.Wagatsuma: "Enhancement of TXRF Intensity by Using a Reflector"X-Ray Spectrom. 31. 358-362 (2002)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 辻 幸一(分担執筆): "新訂版・表面科学の基礎と応用"日本表面科学会編(印刷中).

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Z. Solnik, K. Tsuji, etc: "Quantitative analysis of metallic ultra-thin films by grazing-exit electron probe x-ray microanalysis"X-Ray Spectrometry. 31. 178-183 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Z. Spolnik, K. Tsuji, etc: "Grazing-exit electron probe x-ray microanalysis of ultra-thin films and single particles"Anal. Chim. Acta. 455. 245-252 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K. Tsuji, K. Saito, etc: "Localized Thin-Film Analysis by Grazing-Exit EPMA (GE-EPMA)"Spectrochim. Acta. B. 57. 897-906 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K. Tsuji, and F. Delalieux: "Micro x-ray fluorescence using a pinhole aperture in quasi-contact mode"J. Anal. At. Spectrom. 17. 1405-1407 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] J. Injuk, K. Tsuji, etc: "Airborne particles in the Miyagi Museum of Art in Sendai, Japan, Studied by Electron Probe X-Ray Microanalysis"Anal. Sci. 18. 561-566 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K. Tsuji, K. Wagatsuma: "Enhancement of TXRF Intensity by Using a Reflector"X-Ray Spectrom. 31. 358-362 (2002)

    • Description
      「研究成果報告書概要(欧文)」より

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Published: 2004-04-14  

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