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2001 Fiscal Year Final Research Report Summary

Functional Thin Film Formation with High Efficiency Microwave Plasma CVD

Research Project

Project/Area Number 12558047
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section展開研究
Research Field プラズマ理工学
Research InstitutionDAIDO INSTITUTE OF TECHNOLOGY

Principal Investigator

FUJITA Junji  Daido Institute of Technology, Department of Electronics and Computer Engineering, Professor, 工学部, 教授 (50023700)

Co-Investigator(Kenkyū-buntansha) IWAMA Saburo  Daido Institute of Technology, Department of Electronics and Computer Engineering, Professor, 工学部, 教授 (00075904)
NAKANE Hiroyuki  Hokkai Can, Co. Ltd., 技術本部開発部員
KONDO Yoshitoka  Daido Institute of Technology, Department of Electronics and Computer Engineering, Professor, 工学部, 教授 (20043185)
SAKA Takashi  Daido Institute of Technology, Department of Electronics and Computer Engineering, Professor, 工学部, 教授 (20115570)
HIOKI Yoshiaki  Daido Institute of Technology, Department of Electronics and Computer Engineering, Professor, 工学部, 教授 (10075913)
Project Period (FY) 2000 – 2001
KeywordsPlasma Chemical Vapor Deposition / Thin Film formation / Functional Thin Film / Microwave Discharge / Surface Wave Plasma / Plasma Spectroscopy / Plasma Production / Plasma Chemistry
Research Abstract

1) The purpose of this research is to develop a device for functional thin film formation such as penetration resistive film onto the inner surface of PET bottle, on the basis of research and development on microwave discharge at our laboratory.
2) A high density plasma has been produced with surface wave propagation utilizing electric field enhancement with a ridge inside the waveguide.
3) With this device, Ar plasma with CH_4 is used for carbon coating of PET bottle set at the end of the discharge tube.
4) A new device has been designed and constructed, which can produce a flat plasma suited for studying the characteristics of the film in order to obtain the optimum plasma conditions for thin film formation. The microwave power is fed to the plasma through a slot antenna at the bottom of a cavity resonator and along the surface of a quartz plate. This technique is proved to produce stable plasma in a wide range of discharge conditions.
5) Another technique has been developed to form a metal film which is difficult to produce with plasma chemical vapor deposition method, based on electromagnetic acceleration of metal plasma produced with vaporization of thin wire with a high electric current.
6) A laser scattering method is established to study the behavior of nano-particles in a plasma, by the use of argon ion laser, related with thin film formation from nano-particles, and with detection of nano-particles in a plasma. The relative sensitivity factors and the sputtering yield data have been obtained which are important to analyze the chemical processes in the plasma.
7) The completion of this thin film formation device and the establishment of related diagnostic technique allow us to obtain desirable conditions for various kinds of functional thin film formation with plasma CVD.

  • Research Products

    (12 results)

All Other

All Publications (12 results)

  • [Publications] T.Saka, M.Inoue: "Correlation Between the Relative Sensitivity Factors and the Sputtering Yields in Glow Discharge Mass Spectrometry"Analytical Science. 16. 653-655 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 坂 貴, 山口美香, 伊藤清孝: "グロー放電質量分析法による元素分析"電気製鋼. 72. 215-222 (2001)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] T.Saka, M.Yamaguchi, K.Ito: "Concentration dependence of the relative sensitivity factors of aluminum in glow discharge mass spectroscopy"J.Trace and Microprobe Techniques. 19. 533-540 (2001)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Y.Hioki, et al.: "Laser-aided measurements of nano-particle density in an RF discharge"Proceedings of the 10th International Symposium on LASER-AIDED PLAMA DIAGNOSTICS. 496-499 (2001)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Tanaka, S.Iwama: "Crystal Structure and Particle Size of Ge-Nanoparticles Depending on the Flowing Gas Evaporation Conditions"Transactions of the Materials Research Society of Japan. 72(in print). (2002)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] T.Saka, M.Yamaguchi, K.Ito: "Concentration dependence of the relative sensitivity factors in glow discharge mass spectrometry"Analytical Science. (in print). (2002)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] T. Saka and M. Inoue: "Correlation Between the Relative Sensitivity Factors and the Sputtering Yields in Glow Discharge Mass Spectrometry"Analytical Science. 16. 653-655 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T. Saka, M. Yamaguchi and K. Ito: "Analysis of the Element with Glow Discharge Mass Spectrometry (in Japanese)"Denki Seikou. 72. 215-222 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T. Saka, M. Yamaguchi and K. Ito: "Concentration dependence of the relative sensitivity factors of aluminum in glow discharge mass spectroscopy"J. Trace and Microprobe Techniques. 19. 533-540 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Y. Hioki, T. Yamaguchi, H. Hama, H. Morioka, H. Katsuyama and J. Fujita: "Laser-aided measurements of nano-particle density in an RF discharee"Proceedings of the 10th International Symposium on Laser-Aided Plasma Diagnostics. 496 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K. Tanaka and S. Iwama: "Crystal Structure and Particle Size of Ge-Nanoparticles Depending on the Flowing Gas Evaporation Conditions"Transactions of the Materials Research Society of Japan. 72 (in print). (2002)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T. Saka, M. Yamaguchi and K. Ito: "Concentration dependence of the relative sensitivity factors in glow discharge mass spectrometry"Analytical Science. (in print). (2002)

    • Description
      「研究成果報告書概要(欧文)」より

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Published: 2003-09-17  

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