Research on breakdown process across micrometer-scale gap for improving withstand voltage of power apparatus

2016 Fiscal Year Final Research Report

• Project/Area Number: 15H06222
• Research Category: Grant-in-Aid for Research Activity Start-up
• Allocation Type: Single-year Grants
• Research Field: Power engineering/Power conversion/Electric machinery
• Research Institution: Yokohama National University
• Principal Investigator: Iwabuchi Hiroyuki 横浜国立大学, 大学院工学研究院, 助教 (50757341)
• Project Period (FY): 2015-08-28 – 2017-03-31
• Keywords: マイクロギャップ / 沿面放電 / シミュレーション / 二次電子放出係数

Outline of Final Research Achievements

With the miniaturization of MEMS (micro electromechanical systems) devices,　the insulation width and the separation between electrodes in such devices have been accordingly reduced. Consequently, electrical breakdown phenomenon across micrometer-scale gap is of great practical interest for insulation designing of miniaturized devices. In this paper, breakdown process across micrometer-scale surface gap demonstrating actual electronic devices was investigated considering the breakdown characteristics under impulse voltage application and the particle simulation.
The result shows that under negative voltage application, breakdown voltage as independent of electrode materials and gap width. It provides good agreement th simulated one, considering positive feedback of the field emission from the cathode. Under positive voltage application, field emission from insulator surface play an important role on breakdown across micron gaps.

Free Research Field

電力機器工学