Studies of CdTe semiconductor detectors for hard X-ray imaging spectroscopy with arc-second spatial resolution

2019 Fiscal Year Final Research Report

• Project/Area Number: 16H03966
• Research Category: Grant-in-Aid for Scientific Research (B)
• Allocation Type: Single-year Grants
• Section: 一般
• Research Field: Astronomy
• Research Institution: Japan Aerospace EXploration Agency
• Principal Investigator: Watanabe Shin 国立研究開発法人宇宙航空研究開発機構, 宇宙科学研究所, 助教 (60446599)
• Project Period (FY): 2016-04-01 – 2020-03-31
• Keywords: 宇宙物理 / X線天文学 / CdTe半導体検出器 / X線撮像分光検出器

Outline of Final Research Achievements

We have been developing and researching a CdTe semiconductor double-sided strip detector that has a large area and a position resolution of 100 microns in order to realize hard X-ray imaging observation with a spatial resolution of arc-second. By applying a new method, we performed the trial manufacture and the verification test, and aimed to solve issues. Through this research, we were able to obtain the design guideline for the strip electrode of the CdTe device and for the mounting. Compared with the conventional method, we were able to obtain the prospect that good performance in terms of energy resolution could be achieved with high yield.

Free Research Field

宇宙物理学

Academic Significance and Societal Importance of the Research Achievements

高感度硬X線観測を目指した次期衛星計画が検討されており、そのミッション実現にむけて、観測機器の技術成熟度を高めることができた。搭載用観測機器の設計を進めるために不可欠な試作機の製作と実証試験を進めることができた。加えて、天文学以外の医学分野、環境放射線計測分野、非破壊測定分野でも、このような硬X線撮像検出器が望まれている。本研究成果は、他の研究分野への適用に際して重要となる検出器の実用性向上につながった。