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2007 Fiscal Year Final Research Report Summary

High-Efficiency Nitride-based Power Devices in the Next Generation

Research Project

Project/Area Number 18206036
Research Category

Grant-in-Aid for Scientific Research (A)

Allocation TypeSingle-year Grants
Section一般
Research Field Electronic materials/Electric materials
Research InstitutionMeijo University

Principal Investigator

AMANO Hiroshi  Meijo University, Department of Materials Science and Engineering, Professor (60202694)

Co-Investigator(Kenkyū-buntansha) IWAYA Motoaki  Meijo University, Department of Materials Science and Engineering, Associate Professor (40367735)
Project Period (FY) 2006 – 2007
Keywordsp-GaN gate / Normally off FET / group III nitride / High power switching / High breakdown voltage / Junction hetero FET
Research Abstract

Objective of this program is to prove that the group III nitride is one of the most suitable materials for the fabrication of high power FET in the next generation. In FY2006, 1. Reduction of on resistance and improvement of the mutual conductance by surface passivation, 2. Small sub-threshold swing and low power loss in inverter circuit, 3. Controllability of the threshold voltage by changing barrier composition and thickness, and 4. Difference of the mobility underneath the gate-source and the gate were clarified. In order to realize high power devices, AN substrate is very promising because of the small lattice mismatch and the extremely high resistance. Therefore, in this program, 5. Growth of AIN substrate by sublimation on the 6H-SiC substrate, and 6. Growth of high quality AIN template on a sapphire substrate by high temperature MOVPE was conducted. Several papers were published for this issue.
In FY2007, relationship between thickness of SiN passivation film and the maximum drain current was found. By optimizing the SIN thickness to be 5 nm, the following performance can be successfully observed in the normally off JHFET; Maximum drain current density: 1.58×10^<-1> [A/mm], leakage current: 1.45×10^<-8> [A/mm], on/off ratio: higher than 7 orders of magnitude, sub-threshold swing: 90 [mV/dec.], on resistance: 3.4 [mΩcm^2]. In addition, breakdown voltage was as high as 325 V, which is sufficient for inverter circuits for small size air conditioner.

  • Research Products

    (32 results)

All 2008 2007 2006

All Journal Article (18 results) (of which Peer Reviewed: 5 results) Presentation (10 results) Book (2 results) Patent(Industrial Property Rights) (2 results)

  • [Journal Article] Impact of high-temperature growth by metal-organic vapor phase epitaxy on microstructure of A1N on 6H-SiC substrates2008

    • Author(s)
      M.Imura, H.Sugimura, N.Okada, M.Iwaya, S.Kamiyama, H.Amano, I.Akasaki, A.Bandoh
    • Journal Title

      Journal of Crystal Growth 310

      Pages: 2308-2313

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] Impact of high-temperature growth by metal-organic vapor phase epitaxy on microstructure of AlN on 6H-SiC substrates2008

    • Author(s)
      M. Imura, H. Sugimura, N. Okada, M. Iwaya, S. Kamiyama, H. Amano, I. Akasaki, A. Bandoh
    • Journal Title

      Journal of Crystal Growth 310

      Pages: 2308-2313

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Control of threshold voltage of enhancement-mode Al_xGa_<1-x>N/GaN junction heterostructure field-effect transistors using p-GaN gate contact2007

    • Author(s)
      T.Fujii, N.Tsuyukuchi, Y.Hirose, M.Iwaya, S.Kamiyama, H.Amano and I.Akasaki
    • Journal Title

      Japanese Journal of Applied Physics 46

      Pages: 115-118

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Fabrication of enhancement-mode Al_xGa_<1-x>N/GaN junction heterostructure field-effect transistors with p-type GaN gate contact2007

    • Author(s)
      T.Fujii, N.Tsuyukuchi, Y.Hirose, M.Iwaya, S.Kamiyama, H.Amano, and I.Akasaki
    • Journal Title

      phys.stat.sol. (c)4

      Pages: 2708-2711

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] Annihilation mechanism of threading dislocations in AIN grown by growth form modification method using V/III ratio2007

    • Author(s)
      M.Imura, N.Fujimoto, N.Okada, K.Balakrishnan, M.Iwaya, S.Kamiyama, H.Amano, I.Akasaki, T.Noro, T.Takagi, A.Bandoh
    • Journal Title

      Journal of Crystal Growth 300

      Pages: 136-140

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] Epitaxial lateral overgrowth of AIN on trench-patterned AIN layers2007

    • Author(s)
      M.Imura, K.Nakano, G.Narita, N.Fujimoto, N.Okada, K.Balakrishnan, M.Iwaya, S.Kamiyama, H.Amano, I.Akasaki, T.Noro, T.Takagi, A.Bandoh
    • Journal Title

      Journal of Crystal Growth 298

      Pages: 257-260

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] Control of threshold voltage of enhancement-mode Al_XGa_(1-X) N/GaN junction heterostructure field-effect transistors using p-GaN gate contact2007

    • Author(s)
      T. Fujii, N. Tsuyukuchi, Y. Hirose, M. Iwaya, S. Kamiyama, H. Amano, I. Akasaki
    • Journal Title

      Japanese Journal of Applied Physics 46

      Pages: 115-118

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Fabrication of enhancement-mode Al_XGa_(1-X) N/GaN junction heterostructure field-effect transistors with p-type GaN gate contact2007

    • Author(s)
      T. Fujii, N. Tsuyukuchi, Y. Hirose, M. Iwaya, S. Kamiyama, H. Amano, I. Akasaki
    • Journal Title

      phys. stat. sol. (c)4

      Pages: 2708-2711

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Annihilation mechanism of threading dislocations in AlN grown by growth form modification method using V/III ratio2007

    • Author(s)
      M. Imura, N. Fujimoto, N. Okada, K. Balakrishnan, M. Iwaya, S. Kamiyama, H. Amano, I. Akasaki, T. Noro, T. Takagi, A. Bandoh
    • Journal Title

      Journal of Crystal Growth 300

      Pages: 136-140

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Epitaxial lateral overgrowth of A1N on trench-patterned AlN layers2007

    • Author(s)
      M. Imura, K. Nakano, G. Narita, N. Fujimoto, N. Okada,. K. Balakrishnan, M. Iwaya, S. Kamiyama, H. Amano, I. Akasaki, T. Noro T. Takagi, A. Bandoh
    • Journal Title

      Journal of Crystal Growth 298

      Pages: 257-260

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Low-leakage-current enhancement-mode AIGaN/GaN heterostructure field-effect transistor using p-type gate contact2006

    • Author(s)
      N.Tsuyukuchi, K.Nagamatsu, Y.Hirose, M.Iwaya, S.Kamiyama, H.Amano and I.Akasaki
    • Journal Title

      Japanese Journal of Applied Physics 45

      Pages: L319-L321

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Influence of Ohmic Contact Resistance on Transconductance in AlGaN/GaN HEMT2006

    • Author(s)
      Y.Hirose, A.Honshio, T.Kawashima, M.Iwaya, S.Kamiyama, M.Tsuda, H.Amano and I.Akasaki
    • Journal Title

      IEICE Trans.Electron. E89-C

      Pages: 1064-1067

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] High On/Off Ratio in Enhancement-Mode Al_xGa_<1-x>N/GaN Junction Heterostructure Field-Effect Transistors with P-type GaN Gate Contact2006

    • Author(s)
      T.Fujii, N.Tsuyukuchi, M.Iwaya, S.Kamiyama, H.Amano and I.Akasaki
    • Journal Title

      Japanese Journal of Applied Physics 45

      Pages: L1048-L1050

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] High-Temperature Metal-Organic Vapor Phase Epitaxial Growth of AIN on Sapphire by Multi Transition Growth Mode Method Varying V/III Ratio2006

    • Author(s)
      M.Imura, K.Nakano, N.Fujimoto, N.Okada, K.Balakrishnan, M.Iwaya, S.Kamiyama, H.Amano, I.Akasaki, T.Noro, T.Takagi, A.Bandoh
    • Journal Title

      Japanese Journal of Applied Physics 45

      Pages: 8639-8643

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] Low-leakage-current enhancement-mode AlGaN/GaN heterostructure field-effect transistor using p-type gate contact2006

    • Author(s)
      N. Tsuyukuchi, K. Nagamatsu, Y. Hirose, M. Iwaya, S. Kamiyama, H. Amano, I. Akasaki
    • Journal Title

      Japanese Journal of Applied Physics 45

      Pages: L319-L321

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Influence of Ohmic Contact Resistance on Transconductance in AlGaN/GaN HEMT2006

    • Author(s)
      Yoshikazu Hirose, Akira Honshio, Takeshi Kawashima, Motoaki Iwaya, Satoshi Kamiyama, Michinobu Tsuda, Hiroshi Amano, Isamu Akasaki
    • Journal Title

      IEICE Trans. Electron. E89-C

      Pages: 1064-1067

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] High On/Off Ratio in Enhancement-Mode Al_XGa_(1-X) N/GaN Junction Heterostructure Field-Effect Transistors with P-type GaN Gate Contact2006

    • Author(s)
      T. Fujii. N. Tsuyukuchi, M. Iwava. S. Kamivama. H. Amano, I. Akasaki
    • Journal Title

      Japanese Journal of Applied Physics 45

      Pages: L1048-L1050

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] High-Temperature Metal-Organic Vapor Phase Epitaxial Growth of AlN on Sapphire by Multi Transition Growth Mode Method Varying V/III Ratio2006

    • Author(s)
      M. Imura, K. Nakano, N. Fujimoto, N. Okada, K. Balakrishnan, M. Iwaya, S. Kamiyama, H. Amano, I. Akasaki, T. Noro, T. Takagi, A. Bandoh
    • Journal Title

      Japanese Journal of Applied Physics 45

      Pages: 8639-8643

    • Description
      「研究成果報告書概要(欧文)」より
  • [Presentation] High drain current and low loss normally-off-mode AlGaN/GaN junction HFETs with p-type GaN gate contact2007

    • Author(s)
      T.Fujii, S.Nakamura, K.Mizuno, R.Nega, M.Iwaya, S.Kamiyama, H.Amano and I.Akasaki
    • Organizer
      The 7th International Conference on Nitride Semiconductors(ICNS-7)
    • Place of Presentation
      Las Vegas,U.S.A
    • Year and Date
      20070917-21
    • Description
      「研究成果報告書概要(和文)」より
  • [Presentation] p型GaNゲートを用いたnormally-off型AlGaN/GaN HFETsの構造最適化2007

    • Author(s)
      水野 克俊、藤井 隆弘、中村 彰吾、根賀 亮平、岩谷 素顕、上山 智、天野 浩、赤崎 勇
    • Organizer
      第68回応用物理学会学術講演会
    • Place of Presentation
      北海道工業大学
    • Year and Date
      2007-09-04
    • Description
      「研究成果報告書概要(和文)」より
  • [Presentation] Technical issues for the realization of new functional nitride-based optical and electron devices2007

    • Author(s)
      H. Amano
    • Organizer
      No. 68 Japan Society for Applied Physics Annual Meeting
    • Year and Date
      2007-09-04
    • Description
      「研究成果報告書概要(欧文)」より
  • [Presentation] 窒化物系半導体の最近の動向と課題2007

    • Author(s)
      天野 浩
    • Organizer
      日本学術振興会 結晶加工と評価技術第45委員会 110回研究会
    • Place of Presentation
      四ツ谷、東京
    • Year and Date
      2007-06-04
    • Description
      「研究成果報告書概要(和文)」より
  • [Presentation] <デバイスの立場から>窒化物半導体光・電子デバイス極限機能創出のための結晶成長の技術課題2007

    • Author(s)
      天野 浩
    • Organizer
      日本結晶成長学会特別講演会・日本学術振興会第161委員会第54回研究会
    • Place of Presentation
      千駄ケ谷、東京
    • Year and Date
      2007-04-13
    • Description
      「研究成果報告書概要(和文)」より
  • [Presentation] High drain current and low loss normally-off-mode AIGaN/GaN junction HFETs with p-type GaN gate contact2007

    • Author(s)
      T. Fujii, S. Nakamura, K. Mizuno, R. Nega, M. Iwaya, S. Kamiyama, H. Amano and I. Akasaki
    • Organizer
      Group 45 Japan Society for Promotion of Science No. 110 Meeting
    • Year and Date
      2007-04-06
    • Description
      「研究成果報告書概要(欧文)」より
  • [Presentation] p型GaNゲートを用いた高出力低損失normally-off型AlGaN/GaNHFETs2007

    • Author(s)
      藤井 隆弘、露口 士夫、岩谷 素顕、上山 智、天野 浩、赤崎 勇
    • Organizer
      春季第54回応用物理学会関係連合講演会
    • Place of Presentation
      青山学院大学
    • Year and Date
      2007-03-28
    • Description
      「研究成果報告書概要(和文)」より
  • [Presentation] p型GaNゲートを用いた低オン抵抗ノーマリーオフ型AlGaN/GaN Junction HFETs2007

    • Author(s)
      根賀 亮平、藤井 隆弘、中村 彰吾、露口 士夫、川島 毅士、岩谷 素顕、上山 智、天野 浩、赤崎 勇
    • Organizer
      春季第54回応用物理学会関係連合講演会
    • Place of Presentation
      青山学院大学
    • Year and Date
      2007-03-28
    • Description
      「研究成果報告書概要(和文)」より
  • [Presentation] S. Nakamura, R. Nega, M. Iwaya, S. Kamiyama, H. Arnano, I. Akasaki, Optimization of normally off type AIGaN/GaN JHFETs having p-GaN gate2007

    • Author(s)
      K. Mizuno, T. Fujii
    • Organizer
      THE 56th JAPAN NATIONAL CONGRESS ON THEORETICAL AND APPLIED MECHANICS
    • Place of Presentation
      Tokyo, Japan
    • Year and Date
      2007-03-09
    • Description
      「研究成果報告書概要(欧文)」より
  • [Presentation] Recent development of nitride semiconductors2006

    • Author(s)
      H. Amano
    • Organizer
      THE 55th JAPAN NATIONAL CONGRESS ON THEORETICAL AND APPLIED MECHANICS
    • Place of Presentation
      Las Vegas, USA
    • Year and Date
      2006-01-24
    • Description
      「研究成果報告書概要(欧文)」より
  • [Book] Wide Bandgap Semiconductors 2.3.1 Doping Technology, pp.77-79, 3.5.3 Advances in UV Laser Diodes, pp.206-207, Total 460 pages, Editors Kiyoshi Takahashi, Akihiko Yoshikawa, Adarsh Sandhu2007

    • Author(s)
      Hiroshi Amano
    • Total Pages
      460
    • Publisher
      Springer
    • Description
      「研究成果報告書概要(和文)」より
  • [Book] 高周波半導体材料・デバイスの新展開、監修:佐野芳明、奥村次徳、第2章 III族窒化物半導体のMOVPE技術、pp.80-862006

    • Author(s)
      天野 浩
    • Total Pages
      全266
    • Publisher
      シーエムシー出版
    • Description
      「研究成果報告書概要(和文)」より
  • [Patent(Industrial Property Rights)] 窒化物系半導体の気相成長方法、及び、エピタキシャル基板とそれを用いた半導体装置2006

    • Inventor(s)
      津田 道信, 岩谷 素顕, 上山 智, 天野 浩, 赤崎 勇
    • Industrial Property Rights Holder
      京セラ株式会社、学校法人名城大学
    • Industrial Property Number
      特許公開2007-243006
    • Filing Date
      2006-03-10
    • Description
      「研究成果報告書概要(和文)」より
  • [Patent(Industrial Property Rights)] 窒化物系半導体の気相成長方法とそれを用いた窒化物系半導体エピタキシャル基板並びに自立基板、及び半導体装置2006

    • Inventor(s)
      津田 道信, 岩谷 素顕, 上山 智, 天野 浩, 赤崎 勇
    • Industrial Property Rights Holder
      京セラ株式会社、学校法人名城大学
    • Industrial Property Number
      特許公開2007-227803
    • Filing Date
      2006-02-24
    • Description
      「研究成果報告書概要(和文)」より

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Published: 2010-02-04  

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