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2010 Fiscal Year Final Research Report

Development of laser-assisted wide angle three-dimensional atom probe and its application to atomic level characterization of true electronic devices

Research Project

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Project/Area Number 18GS0204
Research Category

Grant-in-Aid for Creative Scientific Research

Allocation TypeSingle-year Grants
Research InstitutionThe University of Tokyo

Principal Investigator

OWARI Masanori  The University of Tokyo, 環境安全研究センター, 教授 (70160950)

Co-Investigator(Kenkyū-buntansha) TANIGUCHI Masahiro  金沢工業大学, バイオ・化学部応用化学科, 教授 (30250418)
NOJIMA Masashi  東京理科大学, 総合研究機構, 講師 (50366449)
Co-Investigator(Renkei-kenkyūsha) MAYAMA Norihito  東京工業大学, 資源化学研究所, 産学官連携研究員 (40508131)
IWATA Tatsuo  三重大学, 極限ナノエレクトロニクスセンター, 特定事業研究員 (20119647)
Project Period (FY) 2006 – 2010
Keywordsナノ構造化学 / 表面・界面ナノ構造
Research Abstract

We developed three-dimensional atom probe(3DAP)that could visualize three-dimensionally the elemental identity and position of atoms in hundreds of cube nanometer in a material. Metals and carbonaceous materials were analyzed by using this method, and a new knowledge about laser ionization was obtained. Basic techniques for the three-dimensional analysis of real electronic devices were also established.

  • Research Products

    (10 results)

All 2010 2009 2008 2007

All Journal Article (4 results) (of which Peer Reviewed: 4 results) Presentation (2 results) Book (2 results) Patent(Industrial Property Rights) (2 results)

  • [Journal Article]2010

    • Author(s)
      N.Mayama, T.Iwata, M.Nojima, M.Taniguchi, M.Owari, 他10名
    • Journal Title

      Surf.Interface Anal. 42

      Pages: 1616-1621

    • Peer Reviewed
  • [Journal Article]2010

    • Author(s)
      N.Mayama, H.Yoshida, T.Iwata, K.Sasakawa, A.Suzuki, Y.Hanaoka, Y.Morita, A.Kuroda, M.Owari
    • Journal Title

      Diam.Relat.Mater. 19

      Pages: 946-949

    • Peer Reviewed
  • [Journal Article]2010

    • Author(s)
      M.Taniguchi, O.Nishikawa
    • Journal Title

      e-JSSNT 8

      Pages: 69-73

    • Peer Reviewed
  • [Journal Article]2009

    • Author(s)
      N.Mayama, Y.Kajiwara, S.Mikami, S.Ito, T.Kaneko, T.Iwata, M.Owari
    • Journal Title

      e-JSSNT 7

      Pages: 35-38

    • Peer Reviewed
  • [Presentation]2009

    • Author(s)
      M.Owari
    • Organizer
      7th International Symposium on Atomic Level Characterizations for New Materials and Devices(招待講演)
    • Place of Presentation
      Hawaii, USA.
    • Year and Date
      2009-12-09
  • [Presentation]2008

    • Author(s)
      M.Owari
    • Organizer
      The 10^<th> International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University (SISS-10)(招待講演)
    • Place of Presentation
      Tokyo, Japan.
    • Year and Date
      20080700
  • [Book] イオンを用いた新たなナノ計測への展開(「アトムプローブの新たな展開」電子情報通信学会「知識ベース」、S2郡(ナノ・量子・バイオ)-4編(ナノ加工・計測技術)-3章(ナノ計測技術-ナノプローブ以外)-3.4)2009

    • Author(s)
      間山憲仁、尾張真則
    • Publisher
      オーム社(Web公開)
  • [Book] 第5版実験化学講座24(表面・界面)(第3章11節FEM, FIM,アトムプローブ)2007

    • Author(s)
      谷口昌宏
    • Total Pages
      150
    • Publisher
      日本化学会編(株)丸善
  • [Patent(Industrial Property Rights)] アトムプローブ用針状試料の加工方法及び集束イオンビーム装置2007

    • Inventor(s)
      尾張真則, 皆藤孝, 野島雅
    • Industrial Property Rights Holder
      尾張真則, 皆藤孝, 野島雅
    • Industrial Property Number
      特許(発明),特願2007-279319
    • Filing Date
      2007-10-26
  • [Patent(Industrial Property Rights)] 試料及び電極ホルダユニット、位置調整台、並びに試料及び電極の装置への組付方法2007

    • Inventor(s)
      尾張真則, 野島雅,谷口昌宏, 間山憲仁, 足立達哉
    • Industrial Property Rights Holder
      尾張真則, 野島雅,谷口昌宏, 間山憲仁, 足立達哉
    • Industrial Property Number
      特許(発明),特願2007-279318
    • Filing Date
      2007-10-26

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Published: 2012-01-26   Modified: 2015-07-02  

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