2020 Fiscal Year Final Research Report
Fault-based Built-In Self Test schemes for AMS System LSI
| Project/Area Number |
18K11222
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Multi-year Fund |
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| Section | 一般 |
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| Review Section |
Basic Section 60040:Computer system-related
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| Research Institution | Kochi University of Technology |
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Principal Investigator |
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| Project Period (FY) |
2018-04-01 – 2021-03-31
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| Keywords | Built-In Self Test / Analog-Mixed Signal / カタストロフィック故障 / パラメータ故障 / デペンダブルコンピューティング |
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| Outline of Final Research Achievements |
We propose fault-based BIST(Built-In Self Test) schemes for Analog part of AMS (Analog Mixed-Signal) system LSI. The BIST systems can be used throughout life time of LSIs, from fabrication process to the system's operation.
Motif circuits of analog system to design BIST systems are Voltage/Current reference generator and delta-sigma modulator. The BIST systems are based on transient response of circuits and fault coverage of Catastrophic faults, such like open/short fault of circuit elements, are about 85% to 96% with reasonable area overhead. We also find the BIST systems based on Chaotic oscillation can cover Parametric faults.
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| Free Research Field |
システムLSI設計、LSI設計支援系
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| Academic Significance and Societal Importance of the Research Achievements |
アナログ回路の故障検出のためのテスト方式の研究は古くから行われているが、これらの研究は特別なテストモードと大規模な即手系を使用してテストを行い、故障原因と故障箇所の特定に重点を置いた出荷時のテストを前提としたものが多い。
本研究による故障検出方式では、故障箇所、原因の特定にはこだわらず、システムの動作中に故障検出を行うことが出来るので、システム動作時のシステムの信頼性向上を図ることが出来る。
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