2009 Fiscal Year Final Research Report
Local state analysis of interfaces and defect regions by spherical aberration corrected STEM-EELS
| Project/Area Number |
19310071
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| Research Category |
Grant-in-Aid for Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Nanomaterials/Nanobioscience
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| Research Institution | Kyoto University |
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Principal Investigator |
KURATA Hiroki Kyoto University, 化学研究所, 准教授 (50186491)
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| Co-Investigator(Kenkyū-buntansha) |
ISODA Seiji 京都大学, 化学研究所, 教授 (00168288)
OGAWA Tetsuya 京都大学, 化学研究所, 助教 (40224109)
NEMOTO Takashi 京都大学, 化学研究所, 助教 (20293946)
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| Project Period (FY) |
2007 – 2009
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| Keywords | 電子顕微鏡 / 球面収差補正 / 電子エネルギー損失スペクトル / 界面 / 欠陥 |
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| Research Abstract |
New spatial-resolved spectroscopy analyzing local state of crystal materials has been developed by combining electron energy-loss spectroscopy with spherical aberration corrected scanning transmission electron microscopy. Using this method, we successfully detected the change of electronic structure arising from structural deformation in local area of transition metal oxides. The local changes of electronic structure and chemical composition of epitaxial thin films grown on single crystal substrates as well as the structures in the vicinity of interfaces have been analyzed.
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