2009 Fiscal Year Final Research Report
Research on High Dependable Test for Crosstalk Faults in High Speed VLSIs
| Project/Area Number |
19500045
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Computer system/Network
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| Research Institution | Ehime University |
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Principal Investigator |
HIGAMI Yoshinobu Ehime University, 大学院・理工学研究科, 准教授 (40304654)
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| Co-Investigator(Kenkyū-buntansha) |
TAKAHASHI Hiroshi 愛媛大学, 大学院・理工学研究科, 准教授 (80226878)
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| Project Period (FY) |
2007 – 2009
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| Keywords | VLSI(大規模集積回路) / テスト / 故障診断 / クロストーク故障 |
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| Research Abstract |
In this research, a testing method for crosstalk faults in VLSI (Very Large Scaled Integrated Circuit) circuits has been proposed. A crosstalk fault is induced by coupling interaction between neighbor two lines, and it is hard to detect by the testing method for conventional fault models. We analyzed the fault behavior of crosstalk faults to define a fault model, and proposed a test generation method. Moreover we enhanced the method for transistor shorts to improve fault diagnosis and test pattern generation.
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Research Products
(4 results)
