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2011 Fiscal Year Final Research Report

The interface electronic structure between organic semiconductor and ferromagnetic metal surfaces : Towards organic spin-devices

Research Project

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Project/Area Number 20550015
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field Physical chemistry
Research InstitutionKyoto University

Principal Investigator

YOHIDA Hiroyuki  京都大学, 化学研究所, 助教 (00283664)

Project Period (FY) 2008 – 2011
Keywords有機半導体 / 有機・金属界面 / 電子構造 / 角度分解X線光電子分光法 / 多変量解析 / 表面電気二重層 / 分子性固体 / 分極エネルギー
Research Abstract

Interface electronic structures between organic semiconductor and metal surface have been studied using photoemission spectroscopy. In the course of the study, we have developed a novel analytical method that can examine the core energy levels of material as a function of depth. Using this new method, electronic structures of buried metal-organic interfaces are examined. Further, the method allow for the first time to quantitatively determine the energy level difference between the bulk and surface of organic solids to be about 0. 3 eV. The origins of the difference are also discussed.

  • Research Products

    (14 results)

All 2012 2011 2010 Other

All Journal Article (5 results) (of which Peer Reviewed: 4 results) Presentation (8 results) Remarks (1 results)

  • [Journal Article] Core level energy differences between the surface and bulk of organic semiconductor films : The effect of electrostatic polarization energy2012

    • Author(s)
      Hiroyuki Yoshida, Eisuke Ito, Masahiko Hara, Naoki Sato
    • Journal Title

      Synth. Met

      Volume: 161 Pages: 2549-2553

    • DOI

      DOI:10.1021/jp107857n

    • Peer Reviewed
  • [Journal Article] Electronic structure of the buried interface between an organic semiconductor, N, N'-Bis(3-methylphenyl)-N, N'-diphenylbenzidine(TPD), and metal surfaces2012

    • Author(s)
      Hiroyuki Yoshida, Eisuke Ito, Masahiko Hara, Naoki Sato
    • Journal Title

      J. Nanosci. Nanotech

      Volume: 12 Pages: 494-498

    • DOI

      DOI:10.1166/jnn.2012.5401

  • [Journal Article] A Precise Analysis of the Core Level Energy Difference between the Surface and Bulk Region of Organic Semiconductor Thin Films2012

    • Author(s)
      Hiroyuki Yoshida, Naoki Sato
    • Journal Title

      J. Phys. Chem. C

      Volume: 116 Pages: 10033-10038

    • DOI

      DOI:10.1021/jp3009404

    • Peer Reviewed
  • [Journal Article] The depth profile of core energy levels : Electronic structure of buried organic/metal interfaces examined by X-ray photoemission and target factor analysis2011

    • Author(s)
      Hiroyuki Yoshida, Naoki Sato
    • Journal Title

      Chem. Phys. Lett.

      Volume: 511 Pages: 146-150

    • DOI

      DOI:10.1016/j.cplett.2012.04.058

    • Peer Reviewed
  • [Journal Article] Decay mechanism of spontaneously built-up surface potential in a thin film of a zwitterionic molecule having noncentrosymmetric crystal structure2011

    • Author(s)
      Jun' ya Tsutsumi, Hiroyuki Yoshida, Richard Murdey, Naoki Sato
    • Journal Title

      J. Phys. Chem. C

      Volume: 115 Pages: 2356

    • DOI

      DOI:10.1021/jp107857n

    • Peer Reviewed
  • [Presentation] Core-energy level energy difference between the surface and bulk regions of organic semiconductor films2012

    • Author(s)
      Hiroyuki Yoshida, Eisuke Ito, Masahiko Hara, Naoki Sato, Thomas Ules, Michel G. Ramsey
    • Organizer
      76th Annual Meeting of the Deutche Physicalishe Gesellshaft(DPG) and DPG Spring Meeting(ドイツ物理学会)
    • Place of Presentation
      Berlin, Germany
    • Year and Date
      20120325-30
  • [Presentation] Depth profiling the energy levels near the surface of organic semiconductor films studied by depth resolved X-ray photoemission spectroscopy2011

    • Author(s)
      Hiroyuki Yoshida, Eisuke Ito, Masahiko Hara, Naoki Sato
    • Organizer
      21st international photovoltaic sicence an engineering conference(PVSEC-21)
    • Place of Presentation
      Fukuoka, Japan
    • Year and Date
      20111128-1202
  • [Presentation] Core-energy level difference in the surface and bulk regions of organic semiconductor films studied by X-ray photoemission spectroscopy with depth resolution2011

    • Author(s)
      Hiroyuki Hiroyuki Yoshida, Eisuke Ito, Masahiko Hara, Naoki Sato
    • Organizer
      The 6th Japan-Sweden Workshop on Advanced Spectroscopy of Organic Materials for Electronic Applications(ASOMEA6)
    • Place of Presentation
      Ishikawa, Japan
    • Year and Date
      20111123-26
  • [Presentation] X線光電子分光法で調べる有機半導体薄膜の内部の電子構造2011

    • Author(s)
      吉田弘幸、伊藤英輔、原正彦、Whee WonChin、Jin WookHan、永野修作、Michel Ramsey、佐藤直樹
    • Organizer
      第60回高分子討論会(依頼講演)
    • Place of Presentation
      岡山
    • Year and Date
      20110928-30
  • [Presentation] A New Experimental Method for Depth Profiling Core Energy Levels : Application to the Electronic Structure of Buried Organic/Metal Interfaces2011

    • Author(s)
      Hiroyuki Yoshida, Eisuke Ito, Masahiko Hara, Naoki Sato
    • Organizer
      International Conference on Materials for Advanced Technology(ICMAT2011)
    • Place of Presentation
      Singapore
    • Year and Date
      20110626-0701
  • [Presentation] Core-energy level difference in the surface and bulk regions of organic semiconductor films studied by X-ray photoemission spectroscopy with depth resolution2011

    • Author(s)
      Hiroyuki Yoshida, Eisuke Ito, Masahiko Hara, Naoki Sato
    • Organizer
      2011 European Material Research Society(E-MRS) Sping Meeting
    • Place of Presentation
      Nice, France
    • Year and Date
      20110509-13
  • [Presentation] New Experimental Technique to Examine Electronic Structure at Buried Interfaces of Metal/Organic Contacts2010

    • Author(s)
      Hiroyuki Yoshida, Eisuke Ito, Masahiko Hara, Naoki Sato
    • Organizer
      The 27 th European Conference of Surface Science(ECOSS 27)
    • Place of Presentation
      Groningen, Netherland
    • Year and Date
      20100829-0903
  • [Presentation] New Experimental Technique to Examine Electronic Structure at Buried Interfaces of Metal/Organic Contacts2010

    • Author(s)
      Hiroyuki Yoshida, Eisuke Ito, Masahiko Hara, Naoki Sato
    • Organizer
      International Conference of Synthetic Metals(ICSM) 7
    • Place of Presentation
      Kyoto, Japan
    • Year and Date
      20100705-09
  • [Remarks]

    • URL

      http://www.scl.kyoto-u.ac.jp/~yoshida/hiroyuki_yoshida/main.html

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Published: 2013-07-31  

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