2011 Fiscal Year Final Research Report
Development of a Chemically Sensitive AFM : XANAM
| Project/Area Number |
20686004
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| Research Category |
Grant-in-Aid for Young Scientists (A)
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| Allocation Type | Single-year Grants |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | Nagoya University (2009-2011)
Hokkaido University (2008) |
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Principal Investigator |
SUZUKI Shushi 名古屋大学, 工学研究科, 准教授 (30322853)
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| Project Period (FY) |
2008 – 2011
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| Keywords | 走査プローブ顕微鏡(SPM) / 非接触原子間力顕微鏡(NC-AFM) / 量子ビーム / 放射光X線 / 表面元素分析 / 表面化学分析 / XANAM |
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| Research Abstract |
X-ray Aided Noncontact Atomic force microscopy(XANAM) is one of the challenging issue for development of chemically sensitive atomic force microscopy(AFM) in combination with synchrotron X-ray. X-ray can excite inner core shell electrons of an atom on a sample with tuning its energy into specific absorption energy to the atom. Hence, if the electrons can perturb AFM tip-sample interaction, one can know what atom species exists beneath the probe. The instrument for XANAM has been improved and was adapted to new experiments such as force curve analysis with X-ray irradiation. Finally, the challenging could be done by finding a proof to identify atom species directly from the X-ray absorption energy.
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[Presentation] Bias Effect on the XANAM Measurement2008
Author(s)
S. Suzuki, Y. Nakagawa, K. Kinoshita, K. Fujikawa, W.-J. Chun, M. Nomura, and K. Asakura
Organizer
16th International Colloquium on Scanning Probe Microscopy(ICSPM16)
Place of Presentation
Atagawa, Japan
Year and Date
20081211-13
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[Presentation] XANAM[II]. X-ray Induced Force Change Image-2008
Author(s)
S. Suzuki, Y. Koike, K. Kinoshita, Y. Nakagawa, K. Fujikawa, W.-J. Chun, M. Nomura, and K. Asakura
Organizer
11th International Conference on Noncontact Atomic Force Microscopy(NC-AFM2008)
Place of Presentation
Madrid, Spain
Year and Date
20080916-19
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