2012 Fiscal Year Final Research Report
A study on high quality field test for VLSIs
| Project/Area Number |
21300015
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| Research Category |
Grant-in-Aid for Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Computer system/Network
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| Research Institution | Kyushu Institute of Technology |
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Principal Investigator |
KAJIHARA Seiji 九州工業大学, 情報工学研究院, 教授 (80252592)
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| Co-Investigator(Kenkyū-buntansha) |
WEN Xiaoqing 九州工業大学, 情報工学研究院, 教授 (20250897)
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| Co-Investigator(Renkei-kenkyūsha) |
MIYASE Kohei 九州工業大学, 情報工学研究院, 助教 (30452824)
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| Project Period (FY) |
2009 – 2012
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| Keywords | ディペンダブル・コンピューティング / VLSI の設計とテスト / システムオンチップ / 論理回路 / 高信頼設計 / 計算機システム |
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| Research Abstract |
The purpose of this work is to establish a high quality field test method using system-idle time for logic circuits. Especially the method has an ability of detection for aging-induced faults. In general, field test requires short test application time and small memory space while test opportunity is more than once. In this work, a test partitioning and rotating test method is developed in which a given test pattern set is partitioned and a whole test is achieved through multiple test opportunity.
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