2012 Fiscal Year Final Research Report
Design of high reliability digital circuits having tolerance abilityfor noise and process variation
Project/Area Number |
21500059
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Research Category |
Grant-in-Aid for Scientific Research (C)
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Allocation Type | Single-year Grants |
Section | 一般 |
Research Field |
Computer system/Network
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Research Institution | Tokyo Metropolitan University |
Principal Investigator |
MIURA Yukiya 首都大学東京, システムデザイン研究科, 准教授 (00254152)
|
Project Period (FY) |
2009 – 2012
|
Keywords | ディペンダブルコンピューティング |
Research Abstract |
According to reduction of a supply voltage, speed-up of an operation speed and scale-down of devise dimensions of VLSIs, malfunction of VLSIscaused by noise is becoming a serious problem. In this study, we developed flip-flopswhich have tolerance for noise induced on a data signal line. As the proposed flip-flops do not require any additional signal and are compatible circuit structureswith existing circuits, it is possible to mix with circuits of conventional design. Furthermore, it was shown that the developed circuit function can be extended to detection of increase and decrease in the delay time of a data signal, and it can apply to correction of signal delay.
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