2011 Fiscal Year Final Research Report
Development of White X-ray system for detection of internal crack in material and strain mapping near it
| Project/Area Number |
21560074
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Materials/Mechanics of materials
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| Research Institution | Kitami Institute of Technology |
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Principal Investigator |
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| Co-Investigator(Renkei-kenkyūsha) |
SHOBU Takahisa 日本原子力研究開発機構, 研究副主幹 (90425562)
KAJIWARA Kentaro 高輝度光科学研究センター, 副主幹研究員 (40443551)
KIRIYAMA Koji 総合科学研究機構, 研究員 (00425563)
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| Project Period (FY) |
2009 – 2011
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| Keywords | 白色X線 / シンクロトロン放射光 / き裂 / ひずみ / X線CT / 非破壊評価 |
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| Research Abstract |
We examined the measurement system which makes it possible to perform a nondestructive detection of a crack in a material leading to destruction by CT and strain mapping near it in the same apparatus environment by using the high energy white X-ray obtained from synchrotron radiation. As a result, each measurement technique for the internal crack detection by CT and the strain mapping near it was developed. The possibility was able to be indicated although it did not result in construction of the integrated measurement system.
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