2011 Fiscal Year Final Research Report
Development of a fast and accurate VLSI diagnostic method with a VLSI fault localization system
| Project/Area Number |
21560353
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Electron device/Electronic equipment
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| Research Institution | Osaka University |
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Principal Investigator |
MIURA Katsuyoshi 大阪大学, 大学院・情報科学研究科, 准教授 (30263221)
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| Co-Investigator(Kenkyū-buntansha) |
MIDOH Yoshihiro 大阪大学, 情報科学研究科, 助教 (00448094)
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| Project Period (FY) |
2009 – 2011
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| Keywords | 大規模集積回路 / 故障診断 / 故障解析 / シミュレーション / 走査レーザSQUID顕微鏡法 / L-SQ法 / レーザテラヘルツ波顕微鏡法 / LTEM法 |
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| Research Abstract |
We speeded up the scanning laser SQUID microscope(L-SQ) image simulator and the laser terahertz emission microscope(LTEM) image simulator and developed VLSI diagnostic methods utilizing these simulators. The L-SQ image simulator became more the 100 times faster and the LTEM image simulator became about 10 times faster. The developed diagnostic method based on the L-SQ image simulator successfully localized a fault at the first rank. The LTEM image simulator based diagnostic method localized a fault into 8% area from the whole circuit.
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