2011 Fiscal Year Final Research Report
Study on robust circuit design techniques based on physical parameters of semiconductor devices and its Applications
| Project/Area Number |
21680004
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| Research Category |
Grant-in-Aid for Young Scientists (A)
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| Allocation Type | Single-year Grants |
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| Research Field |
Computer system/Network
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| Research Institution | Kobe University |
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Principal Investigator |
HIROSE Tetsuya 神戸大学, 大学院・工学研究科, 准教授 (70396315)
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| Project Period (FY) |
2009 – 2011
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| Keywords | VLSI設計技術 |
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| Research Abstract |
In this study, we developed analog and digital circuit design techniques that are tolerant to process and temperature variations. By developing ultra-low power current reference circuit, we can monitor the condition of threshold voltage of MOSFET in each LSI chip. We also proposed compensation architecture of digital circuits by using on-chip variation monitoring circuit. Moreover, we developed robust operational amplifier and comparator circuit that are fundamental analog circuit building blocks. For analog and digital signal processing systems, clock reference circuit and analog-digital converter were investigated. We demonstrated that these circuits operate robustly against process and temperature variations.
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