2010 Fiscal Year Final Research Report
Three-dimensional mapping of electrical transport characteristics in organic semiconductors using independently-driven four-probe method
Project/Area Number |
21760024
|
Research Category |
Grant-in-Aid for Young Scientists (B)
|
Allocation Type | Single-year Grants |
Research Field |
Thin film/Surface and interfacial physical properties
|
Research Institution | The University of Tokyo |
Principal Investigator |
|
Project Period (FY) |
2009 – 2010
|
Keywords | 表面・界面物性 / 有機薄膜 / 有機半導体 / 電気伝導 / 探針 |
Research Abstract |
We have developed an independently driven four-probe method to investigate field-effect transistor (FET) characteristics in organic semiconductors. The independently driven four-probe method enables us to investigate local FET characteristics in organic semiconductors without damaging the samples. We demonstrated four-probe FET measurement on a pentacene thin film, and we have succeeded to obtain single grain mobility in the polycrystalline pentacene film.
|