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2012 Fiscal Year Final Research Report

Integrated Circuit Design for Robust Operation under Low Supply Voltage

Research Project

  • PDF
Project/Area Number 22300016
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Computer system/Network
Research InstitutionKyoto University

Principal Investigator

ONODERA Hidetoshi  京都大学, 情報学研究科, 教授 (80160927)

Co-Investigator(Kenkyū-buntansha) TSUCHIYA Akira  京都大学, 大学院・情報学研究科, 助教 (20432411)
Co-Investigator(Renkei-kenkyūsha) KOBAYASHI Kazutoshi  京都工芸繊維大学, 大学院・工芸科学研究科, 教授 (70252476)
Project Period (FY) 2010 – 2012
Keywords低消費電力化 / 低電圧動作 / 耐ばらつき設計 / ディペンダブル VLSI
Research Abstract

We have investigated on a design method that achieves robust circuit operation under low supply voltage of around 0.7 V. In particular, we have worked onthree topics:
(1) built-in self monitor and compensation of die-to-die variation
(2) sequential logic gates tolerating for within-die variation
(3) evaluation of dynamic performance variation under low supply voltage.
We have successfully developed variation-tolerant D-FFs, all-digital monitors and body-bias generator circuits for performance compensation, and accurate evaluation of delay fluctuation due to Random Telegraph Noise.

  • Research Products

    (4 results)

All 2013 2012

All Journal Article (2 results) (of which Peer Reviewed: 2 results) Presentation (2 results)

  • [Journal Article] Impact of Body-Biasing Technique on Random Telegraph Noise Induced Delay Fluctuation2013

    • Author(s)
      Takashi Matsumoto, Kazutoshi Kobayashi, Hidetoshi Onodera
    • Journal Title

      Japanese Journal of Applied Physics (JJAP)

      Volume: vol 52, no 4 Pages: 1-3

    • DOI

      DOI:10.7567/JJAP.52.04CE05

    • Peer Reviewed
  • [Journal Article] Variation-sensitive Monitor Circuits for Estimation of Global Process Parameter Variation2012

    • Author(s)
      Islam A.K.M. Mahfuzul, Akira Tsuchiya, Kazutoshi Kobayashi, Hidetoshi Onodera
    • Journal Title

      IEEE Trans. Semiconductor Manufacturing

      Volume: vol 25, no 4 Pages: 571-580

    • DOI

      DOI:10.1109/TSM.2012.2198677

    • Peer Reviewed
  • [Presentation] A Body Bias Generator Compatible with Cell-based Design Flow for Within-die Variability Compensation2012

    • Author(s)
      Norihiro Kamae, Akira Tsuchiya, Hidetoshi Onodera
    • Organizer
      IEEE Asian Solid-State Circuits Conference
    • Place of Presentation
      神戸
    • Year and Date
      2012-11-14
  • [Presentation] A Built-in Self-adjustment Scheme with Adaptive Body Bias using P/N-sensitive Digital Monitor Circuits2012

    • Author(s)
      Islam A.K.M Mahfuzul, Norihiro Kamae, Tohru Ishihara, and Hidetoshi Onodera
    • Organizer
      IEEE Asian Solid-State Circuits Conference
    • Place of Presentation
      神戸
    • Year and Date
      2012-11-13

URL: 

Published: 2014-08-29  

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