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2012 Fiscal Year Final Research Report

High-Temperature Creep Testing Method using Small Sample Specimens

Research Project

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Project/Area Number 22560072
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field Materials/Mechanics of materials
Research InstitutionChiba University

Principal Investigator

KOBAYASHI Kenichi  千葉大学, 大学院・工学研究科, 准教授 (50114278)

Co-Investigator(Renkei-kenkyūsha) NONAKA Isamu  東北大学, 大学院・工学研究科, 教授 (40522066)
TABUCHI Masaaki  (独)物質・材料研究機構, 材料信頼センター, グループリーダー (60354239)
Project Period (FY) 2010 – 2012
Keywords微小クリープ / 余寿命診断 / 試験法 / スモール・パンチ
Research Abstract

Small Punch Creep (SPC) test is one of the semi-destructive tests employing miniature specimens. Some factors of the SPC test affecting test results were experimentally studied.It was found that rupture lives conducted in air were quite different from those in vacuumwhen the rupture life was shorter than 1000 hours. This result depended on the influenceof the oxide film and the coefficient of friction. However, there was a good relation betweenthe stress in the conventional uni-axial creep test and the load in the SPC test when therupture rife was the same. This relationship helps to evaluate remaining creep life oflong-term serviced components under elevated temperatures.

  • Research Products

    (10 results)

All 2013 2012 2011 2010

All Journal Article (2 results) Presentation (8 results)

  • [Journal Article] The Influence of Both Testing Environment andFillet Radius of Die Holder on the Rupture Life ofSmall Punch Creep Tests2012

    • Author(s)
      Ken-ichi Kobayashi, Masahiro Kaneko, Hideo Koyama, Gavin C. Stratford and Masaaki Tabuchi
    • Journal Title

      Journal of Solid Mechanics and Materials Engineering

      Volume: Vol.6,No.8 Pages: 925-934

  • [Journal Article] スモールパンチクリープ試験における変形,破壊とその影響因子(試験雰囲気と下部ダイの肩半径について)2011

    • Author(s)
      小林謙一,金子将大,小山秀夫,Gavin C.Stratford,田淵正明
    • Journal Title

      日本機械学会論文集(A編)

      Volume: 第77巻第784号 Pages: 2046-2053

  • [Presentation] Influenceof Testing Environment on SP Creep RuptureLives2013

    • Author(s)
      Ken-ichi Kobayashi and Sho Takei
    • Organizer
      Proc. of ASME Pressure Vessels and Piping Conference
    • Place of Presentation
      Paris, France
    • Year and Date
      20130700
  • [Presentation] SPクリープ試験の長時間破断寿命特性に及ぼす試験雰囲気の影響2013

    • Author(s)
      武井翔、永峰陽介、小林謙一、小山秀夫
    • Organizer
      日本機械学会・関東支部第19期総会講演会
    • Place of Presentation
      八王子市
    • Year and Date
      20130300
  • [Presentation] 真空及びArガス中でのSPクリープ長時間寿命特性2012

    • Author(s)
      武井翔、小林謙一
    • Organizer
      第56回日本学術会議材料工学連合講演会
    • Place of Presentation
      京都市
    • Year and Date
      20121000
  • [Presentation] Standardiza-tion of Test Method for Small Punch CreepTesting in Japan2012

    • Author(s)
      Isamu Nonaka, Akihiro Kanaya, Shin-ichiKomazaki and Ken-ichi Kobayashi
    • Organizer
      Proc. of 12^<th> Int'l Conf.on Creep and Fracture of Engineering Materialsand Structures
    • Place of Presentation
      Kyoto, Japan
    • Year and Date
      20120500
  • [Presentation] SPクリープ試験における試験雰囲気/試験条件と長時間破断寿命2012

    • Author(s)
      小林謙一、金子将大、武井翔
    • Organizer
      日本材料学会第61期学術講演会
    • Place of Presentation
      岡山市
    • Year and Date
      20120500
  • [Presentation] Influence of Testing Environment and Radius of Die Shoulder on SP Creep RuptureLife2011

    • Author(s)
      Ken-ichi Kobayashi, Masahiro Kaneko,Hideo Koyama, Gavin C. Stratford and Masaaki Tabuchi
    • Organizer
      Proc. of ASME Pressure Vesselsand Piping Conf
    • Place of Presentation
      Baltimore, USA
    • Year and Date
      20110700
  • [Presentation] SPクリープ試験における変形,破壊とその影響因子2011

    • Author(s)
      小林謙一
    • Organizer
      日本材料学会第59期第4回高温強度部門委員会講演会
    • Place of Presentation
      京都市
    • Year and Date
      20110100
  • [Presentation] クリープ破断寿命に及ぼすスモールパンチ・クリープ試験片の酸化被膜の影響2010

    • Author(s)
      金子将大、小林謙一、小山秀夫
    • Organizer
      日本機械学会M&M2010材料力学カンファレンス
    • Place of Presentation
      長岡市
    • Year and Date
      20101000

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Published: 2014-08-29  

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